title: Nanoscale probing of transient carrier dynamics modulated in a GaAs-PIN junction by laser-combined scanning tunneling microscopy.
abstract: The modulation of carrier dynamics in a GaAs-PIN junction after photoexcitation by an ultrashort-pulse laser was probed by shaken-pulse-pair-excited scanning tunneling microscopy (SPPX-STM), which enables nanoscale mapping of time-resolved STM images. The effect of the built-in potential on the carrier dynamics, diffusion and drift, which cannot be probed by the optical pump-probe technique, was successfully visualized in real space.
authors.affiliation: Institute of Applied Physics, University of Tsukuba, Tsukuba, 305-8573, Japan.
authors.forename: Shoji
authors.initials: S
authors.lastname: Yoshida
authors.forename: Yasuhiko
authors.initials: Y
authors.lastname: Terada
authors.forename: Ryuji
authors.initials: R
authors.lastname: Oshima
authors.forename: Osamu
authors.initials: O
authors.lastname: Takeuchi
authors.forename: Hidemi
authors.initials: H
authors.lastname: Shigekawa