title: Sensitive voltage interrogation method using electro-optically tunable SPR sensors.
abstract: A novel voltage interrogation method using electro-optically tunable waveguide-coupled surface plasmon resonance sensors is demonstrated. Before measurements, we use a bicell photodetector to detect the reflectance from the sensor and take the differential signal from the photodetector as the resonance condition. For different analytes, by scanning the DC voltage on the waveguide layer of the sensor chip, the resonance condition can be maintained the same. Under this condition, we record the values of this voltage, namely the resonant voltage. Theoretical calculations and experimental results show the resonant voltage has a highly linear and sensitive response to analyte's refractive index. This method is simple in configuration, and complicated signal processing algorithms can be avoided.
authors.affiliation: National Center for NanoScience and Technology, Zhongguancun, Beijing, China.
authors.forename: Zhiyou
authors.initials: Z
authors.lastname: Wang
authors.forename: Zheng
authors.initials: Z
authors.lastname: Zheng
authors.forename: Kun
authors.initials: K
authors.lastname: Wang
authors.forename: Yalin
authors.initials: Y
authors.lastname: Su
authors.forename: Lei
authors.initials: L
authors.lastname: Liu
authors.forename: Lusheng
authors.initials: L
authors.lastname: Song
authors.forename: Yusheng
authors.initials: Y
authors.lastname: Bian
authors.forename: Rui
authors.initials: R
authors.lastname: Hou
authors.forename: Shaopeng
authors.initials: S
authors.lastname: Li
authors.forename: Jinsong
authors.initials: J
authors.lastname: Zhu
mesh_terms: D003198:Computer Simulation; D017076:Computer-Aided Design; D004581:Electronics / Q000295:instrumentation*; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008027:Light; D008962:Models, Theoretical; D055096:Optical Devices; D012542:Scattering, Radiation; D020349:Surface Plasmon Resonance / Q000295:instrumentation*; D014159:Transducers