title: Three-dimensional characterization of pigment dispersion in dried paint films using focused ion beam-scanning electron microscopy.
abstract: The combination of integrated focused ion beam-scanning electron microscope (FIB-SEM) serial sectioning and imaging techniques with image analysis provided quantitative characterization of three-dimensional (3D) pigment dispersion in dried paint films. The focused ion beam in a FIB-SEM dual beam system enables great control in slicing paints, and the sectioning process can be synchronized with SEM imaging providing high quality serial cross-section images for 3D reconstruction. Application of Euclidean distance map and ultimate eroded points image analysis methods can provide quantitative characterization of 3D particle distribution. It is concluded that 3D measurement of binder distribution in paints is effective to characterize the order of pigment dispersion in dried paint films.
authors.affiliation: The Dow Chemical Company, Analytical Sciences, Midland, MI 48667, USA. JLin@dow.com
authors.forename: Jui-Ching
authors.initials: JC
authors.lastname: Lin
authors.forename: William
authors.initials: W
authors.lastname: Heeschen
authors.forename: John
authors.initials: J
authors.lastname: Reffner
authors.forename: John
authors.initials: J
authors.lastname: Hook