title: Surface plasmon leakage radiation microscopy at the diffraction limit.
abstract: This paper describes the image formation process in optical leakage radiation microscopy of surface plasmon-polaritons with diffraction limited spatial resolution. The comparison of experimentally recorded images with simulations of point-like surface plasmon-polariton emitters allows for an assignment of the observed fringe patterns. A simple formula for the prediction of the fringe periodicity is presented and practically relevant effects of abberations in the imaging system are discussed.
authors.affiliation: Institute of Physics, Karl-Franzens University Graz, Universitatsplatz 5,8010 Graz, Austria. andreas.hohenau@uni-graz.at
authors.forename: A
authors.initials: A
authors.lastname: Hohenau
authors.forename: J R
authors.initials: JR
authors.lastname: Krenn
authors.forename: A
authors.initials: A
authors.lastname: Drezet
authors.forename: O
authors.initials: O
authors.lastname: Mollet
authors.forename: S
authors.initials: S
authors.lastname: Huant
authors.forename: C
authors.initials: C
authors.lastname: Genet
authors.forename: B
authors.initials: B
authors.lastname: Stein
authors.forename: T W
authors.initials: TW
authors.lastname: Ebbesen
mesh_terms: D003198:Computer Simulation; D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000295:instrumentation*; D008027:Light; D008853:Microscopy / Q000295:instrumentation*; D008962:Models, Theoretical; D011829:Radiation Dosage; D012031:Refractometry / Q000295:instrumentation*; D012542:Scattering, Radiation; D020349:Surface Plasmon Resonance / Q000295:instrumentation*