title: Regularized multiframe phase-shifting algorithm for three-dimensional profilometry.
abstract: In many industrial inspection systems, it is required to have a high-precision three-dimensional measurement of an object under test. A popular technique is phase-measuring profilometry. In this paper, we develop some phase-shifting algorithms (PSAs). We propose a novel smoothness constraint in a regularization framework; we call this the R-PSA method and show how to obtain the desired phase measure with an iterative procedure. Both the simulation and experimental results verify the efficacy of our algorithm compared with current multiframe PSAs for interferometric measurements.
authors.affiliation: Imaging Systems Laboratory, Department of Electrical and Electronic Engineering, University of Hong Kong, Pokfulam Road, Hong Kong 999077, China.
authors.forename: Fuqin
authors.initials: F
authors.lastname: Deng
authors.forename: Wui Fung
authors.initials: WF
authors.lastname: Sze
authors.forename: Jiangwen
authors.initials: J
authors.lastname: Deng
authors.forename: Kenneth S M
authors.initials: KS
authors.lastname: Fung
authors.forename: W H
authors.initials: WH
authors.lastname: Leung
authors.forename: Edmund Y
authors.initials: EY
authors.lastname: Lam