title: Weakly modulated silicon-dioxide-cladding gratings for silicon waveguide Fabry-Pérot cavities.
abstract: We show by theory and experiment that silicon-dioxide-cladding gratings for Fabry-Pérot cavities on silicon-on-insulator channel ("wire") waveguides provide a low-refractive-index perturbation, which is required for several important integrated photonics components. The underlying refractive index perturbation of these gratings is significantly weaker than that of analogous silicon gratings, leading to finer control of the coupling coefficient κ. Our Fabry-Pérot cavities are designed using the transfer-matrix method (TMM) in conjunction with the finite element method (FEM) for calculating the effective index of each waveguide section. Device parameters such as coupling coefficient, κ, Bragg mirror stop band, Bragg mirror reflectivity, and quality factor Q are examined via TMM modeling. Devices are fabricated with representative values of distributed Bragg reflector lengths, cavity lengths, and propagation losses. The measured transmission spectra show excellent agreement with the FEM/TMM calculations.
authors.affiliation: Microelectronics Sciences Laboratories, Columbia University, New York, NY 10027, USA. rrg2130@columbia.edu
authors.forename: Richard R
authors.initials: RR
authors.lastname: Grote
authors.forename: Jeffrey B
authors.initials: JB
authors.lastname: Driscoll
authors.forename: Claudiu G
authors.initials: CG
authors.lastname: Biris
authors.forename: Nicolae C
authors.initials: NC
authors.lastname: Panoiu
authors.forename: Richard M
authors.initials: RM
authors.lastname: Osgood
mesh_terms: D003198:Computer Simulation; D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007368:Interferometry / Q000295:instrumentation*; D008027:Light; D008962:Models, Theoretical; D012031:Refractometry / Q000295:instrumentation*; D012542:Scattering, Radiation; D012822:Silicon Dioxide / Q000737:chemistry*; D020349:Surface Plasmon Resonance / Q000295:instrumentation*
chemical_list: D012822:Silicon Dioxide