title: Simultaneous measurement of static and kinetic friction of ZnO nanowires in situ with a scanning electron microscope.
abstract: A novel method for in situ measurement of the static and kinetic friction is developed and demonstrated for zinc oxide nanowires (NWs) on oxidised silicon wafers. The experiments are performed inside a scanning electron microscope (SEM) equipped with a nanomanipulator with an atomic force microscope tip as a probe. NWs are pushed by the tip from one end until complete displacement is achieved, while NW bending is monitored by the SEM. The elastic bending profile of a NW during the manipulation process is used to calculate the static and kinetic friction forces.
authors.affiliation: Institute of Physics, University of Tartu, Riia st. 142, 51014 Tartu, Estonia. boriss.polakovs@ut.ee
authors.forename: Boris
authors.initials: B
authors.lastname: Polyakov
authors.forename: Leonid M
authors.initials: LM
authors.lastname: Dorogin
authors.forename: Sergei
authors.initials: S
authors.lastname: Vlassov
authors.forename: Ilmar
authors.initials: I
authors.lastname: Kink
authors.forename: Alexey E
authors.initials: AE
authors.lastname: Romanov
authors.forename: Rynno
authors.initials: R
authors.lastname: Lohmus