title: 3D elemental sensitive imaging using transmission X-ray microscopy.
abstract: Determination of the heterogeneous distribution of metals in alloy/battery/catalyst and biological materials is critical to fully characterize and/or evaluate the functionality of the materials. Using synchrotron-based transmission x-ray microscopy (TXM), it is now feasible to perform nanoscale-resolution imaging over a wide X-ray energy range covering the absorption edges of many elements; combining elemental sensitive imaging with determination of sample morphology. We present an efficient and reliable methodology to perform 3D elemental sensitive imaging with excellent sample penetration (tens of microns) using hard X-ray TXM. A sample of an Al-Si piston alloy is used to demonstrate the capability of the proposed method.
authors.affiliation: Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.
authors.forename: Yijin
authors.initials: Y
authors.lastname: Liu
authors.forename: Florian
authors.initials: F
authors.lastname: Meirer
authors.forename: Junyue
authors.initials: J
authors.lastname: Wang
authors.forename: Guillermo
authors.initials: G
authors.lastname: Requena
authors.forename: Phillip
authors.initials: P
authors.lastname: Williams
authors.forename: Johanna
authors.initials: J
authors.lastname: Nelson
authors.forename: Apurva
authors.initials: A
authors.lastname: Mehta
authors.forename: Joy C
authors.initials: JC
authors.lastname: Andrews
authors.forename: Piero
authors.initials: P
authors.lastname: Pianetta
mesh_terms: D000465:Algorithms; D000497:Alloys / Q000737:chemistry*; D000535:Aluminum / Q000032:analysis*; D004867:Equipment Design; D021621:Imaging, Three-Dimensional / Q000379:methods*; D008853:Microscopy / Q000295:instrumentation / Q000379:methods*; D012825:Silicon / Q000032:analysis*; D017356:Synchrotrons; D014965:X-Rays
chemical_list: D000497:Alloys; D000535:Aluminum; D012825:Silicon