title: Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency.
abstract: The charge-coupled devices used in electron microscopy are coated with a scintillating crystal that gives rise to a severe modulation transfer function (MTF). Exact knowledge of the MTF is imperative for a good correspondence between image simulation and experiment. We present a practical method to measure the MTF above the Nyquist frequency from the beam blocker's shadow image. The image processing has been fully automated and the program is made public. The method is successfully tested on three cameras with various beam blocker shapes.
authors.affiliation: Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium. wouter.vandenbroek@ua.ac.be
authors.forename: Wouter Van den
authors.initials: WV
authors.lastname: Broek
authors.forename: Sandra Van
authors.initials: SV
authors.lastname: Aert
authors.forename: Dirk Van
authors.initials: DV
authors.lastname: Dyck