title: Characterization of a photonic strain sensor in silicon-on-insulator                 technology.
abstract: Recently there has been growing interest in sensing by means of optical                 microring resonators in photonic integrated circuits that are fabricated in                 silicon-on-insulator (SOI) technology. Taillaert et al. [Proc. SPIE 6619, 661914                 (2007)] proposed the use of a silicon-waveguide-based ring resonator as a strain                 gauge. However, the strong lateral confinement of the light in SOI waveguides and                 its corresponding modal dispersion where not taken into account. We present a                 theoretical understanding, as well as experimental results, of strain applied on                 waveguide-based microresonators, and find that the following effects play important                 roles: elongation of the racetrack length, modal dispersion of the waveguide, and                 the strain-induced change in effective refractive index.
authors.affiliation: Faculty of Applied Sciences, Delft University of Technology, Delft, The Netherlands. w.j.westerveld@tudelft.nl
authors.forename: Wouter J
authors.initials: WJ
authors.lastname: Westerveld
authors.forename: Jose
authors.initials: J
authors.lastname: Pozo
authors.forename: Peter J
authors.initials: PJ
authors.lastname: Harmsma
authors.forename: Ruud
authors.initials: R
authors.lastname: Schmits
authors.forename: Erik
authors.initials: E
authors.lastname: Tabak
authors.forename: Teun C
authors.initials: TC
authors.lastname: van den Dool
authors.forename: Suzanne M
authors.initials: SM
authors.lastname: Leinders
authors.forename: Koen W A
authors.initials: KW
authors.lastname: van Dongen
authors.forename: H Paul
authors.initials: HP
authors.lastname: Urbach
authors.forename: Mirvais
authors.initials: M
authors.lastname: Yousefi