abstract: A comprehensive study concerning the reproducibility and stability of organic n-type field effect transistors is presented. C(60) based OFETs were chosen to investigate the fabrication reproducibility and the long term stability because C(60) is a high mobility n-type material. We fabricated 48 transistors and each transistor was measured for 24 h inside the glove box. To test for life time stability - long term measurements up to three months have been undertaken. We report about the fluctuations in the device parameters of all investigated transistors by comparing the transfer characteristics, and on/off ratio for short time and long time measurements. C(60) based OFETs showed good reproducibility and stability for short time measurements and a decay for long time measurements.
authors.affiliation: Institute of Semiconductor & Solid State Physics, Johannes Kepler Universität, Linz, Austria.
authors.forename: Rizwan
authors.initials: R
authors.lastname: Ahmed
authors.forename: Michael
authors.initials: M
authors.lastname: Sams
authors.forename: Clemens
authors.initials: C
authors.lastname: Simbrunner
authors.forename: Mujeeb
authors.initials: M
authors.lastname: Ullah
authors.forename: Kamila
authors.initials: K
authors.lastname: Rehman
authors.forename: Günther
authors.initials: G
authors.lastname: Schwabegger
authors.forename: H
authors.initials: H
authors.lastname: Sitter
authors.forename: Timm
authors.initials: T
authors.lastname: Ostermann