title: Development of a hybrid atomic force microscopic measurement system combined with white light scanning interferometry.
abstract: A hybrid atomic force microscopic (AFM) measurement system combined with white light scanning interferometry for micro/nanometer dimensional measurement is developed. The system is based on a high precision large-range positioning platform with nanometer accuracy on which a white light scanning interferometric module and an AFM head are built. A compact AFM head is developed using a self-sensing tuning fork probe. The head need no external optical sensors to detect the deflection of the cantilever, which saves room on the head, and it can be directly fixed under an optical microscopic interferometric system. To enhance the system's dynamic response, the frequency modulation (FM) mode is adopted for the AFM head. The measuring data can be traceable through three laser interferometers in the system. The lateral scanning range can reach 25 mm × 25 mm by using a large-range positioning platform. A hybrid method combining AFM and white light scanning interferometry is proposed to improve the AFM measurement efficiency. In this method, the sample is measured firstly by white light scanning interferometry to get an overall coarse morphology, and then, further measured with higher resolution by AFM. Several measuring experiments on standard samples demonstrate the system's good measurement performance and feasibility of the hybrid measurement method.
authors.affiliation: State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Weijin Road, No.92, Tianjin 300072, China.
authors.forename: Tong
authors.initials: T
authors.lastname: Guo
authors.affiliation: State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Weijin Road, No.92, Tianjin 300072, China.
authors.forename: Siming
authors.initials: S
authors.lastname: Wang
authors.affiliation: State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Weijin Road, No.92, Tianjin 300072, China.
authors.forename: Dante J
authors.initials: DJ
authors.lastname: Dorantes-Gonzalez
authors.affiliation: State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Weijin Road, No.92, Tianjin 300072, China.
authors.forename: Jinping
authors.initials: J
authors.lastname: Chen
authors.affiliation: State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Weijin Road, No.92, Tianjin 300072, China.
authors.forename: Xing
authors.initials: X
authors.lastname: Fu
authors.affiliation: State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Weijin Road, No.92, Tianjin 300072, China.
authors.forename: Xiaotang
authors.initials: X
authors.lastname: Hu
mesh_terms: D002138:Calibration; D007368:Interferometry / Q000379:methods*; D008027:Light; D018625:Microscopy, Atomic Force / Q000295:instrumentation / Q000379:methods*; D010781:Photography