title: Influence of atomic force microscopy acquisition parameters on thin film roughness analysis.
abstract: A reliable procedure for measuring parameters connected to surface roughness is needed to compare the gas sensing properties of various thin films or the effect of different fabrication procedures on the surface roughness and the sensing properties. In this article, we propose to investigate how the acquisition parameters specific to atomic force microscopy investigations such as pixel size, scan area and scan speed influence the roughness parameters, namely root mean square and surface area ratio, commonly used for characterizing the gas sensing properties of porphyrins and other materials.
authors.affiliation: Center for Microscopy-Microanalysis and Information Processing, University Politehnica of Bucharest, 060042 Bucharest, Romania.
authors.forename: Radu
authors.initials: R
authors.lastname: Hristu
authors.forename: Stefan G
authors.initials: SG
authors.lastname: Stanciu
authors.forename: George A
authors.initials: GA
authors.lastname: Stanciu
authors.forename: İnci
authors.initials: İ
authors.lastname: Çapan
authors.forename: Burcu
authors.initials: B
authors.lastname: Güner
authors.forename: Matem
authors.initials: M
authors.lastname: Erdoğan