title: The electron spectro-microscopy beamline at National Synchrotron Light Source II: a wide photon energy range, micro-focusing beamline for photoelectron spectro-microscopies.
abstract: A comprehensive optical design for a high-resolution, high-flux, wide-energy range, micro-focused beamline working in the vacuum ultraviolet and soft x-ray photon energy range is proposed. The beamline is to provide monochromatic radiation to three photoelectron microscopes: a full-field x-ray photoelectron emission microscope and two scanning instruments, one dedicated to angle resolved photoemission spectroscopy (μ-ARPES) and one for ambient pressure x-ray photoelectron spectroscopy and scanning photoelectron microscopy (AP-XPS/SPEM). Microfocusing is achieved with state of the art elliptical cylinders, obtaining a spot size of 1 μm for ARPES and 0.5 μm for AP-XPS/SPEM. A detailed ray tracing analysis quantitatively evaluates the overall beamline performances.
authors.affiliation: Photon Sciences Directorate, Brookhaven National Laboratory, Upton, New York 11973, USA.
authors.forename: R
authors.initials: R
authors.lastname: Reininger
authors.forename: S L
authors.initials: SL
authors.lastname: Hulbert
authors.forename: P D
authors.initials: PD
authors.lastname: Johnson
authors.forename: J T
authors.initials: JT
authors.lastname: Sadowski
authors.forename: D E
authors.initials: DE
authors.lastname: Starr
authors.forename: O
authors.initials: O
authors.lastname: Chubar
authors.forename: T
authors.initials: T
authors.lastname: Valla
authors.forename: E
authors.initials: E
authors.lastname: Vescovo