title: Image reconstruction using interval simulated annealing in electrical impedance tomography.
abstract: Electrical impedance tomography (EIT) is an imaging technique that attempts to reconstruct the impedance distribution inside an object from the impedance between electrodes placed on the object surface. The EIT reconstruction problem can be approached as a nonlinear nonconvex optimization problem in which one tries to maximize the matching between a simulated impedance problem and the observed data. This nonlinear optimization problem is often ill-posed, and not very suited to methods that evaluate derivatives of the objective function. It may be approached by simulated annealing (SA), but at a large computational cost due to the expensive evaluation process of the objective function, which involves a full simulation of the impedance problem at each iteration. A variation of SA is proposed in which the objective function is evaluated only partially, while ensuring boundaries on the behavior of the modified algorithm.
authors.affiliation: Department of Mechatronics and Mechanical Systems Engineering, Escola Politécnica University of São Paulo, São Paulo 05508-030, Brazil. thiago@usp.br
authors.forename: Thiago de Castro
authors.initials: Tde C
authors.lastname: Martins
authors.forename: Erick Dario León Bueno
authors.initials: ED
authors.lastname: de Camargo
authors.forename: Raul Gonzalez
authors.initials: RG
authors.lastname: Lima
authors.forename: Marcelo Britto Passos
authors.initials: MB
authors.lastname: Amato
authors.forename: Marcos de Sales Guerra
authors.initials: Mde S
authors.lastname: Tsuzuki
mesh_terms: D000465:Algorithms; D003198:Computer Simulation; D018553:Cucumis sativus; D017097:Electric Impedance; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D008954:Models, Biological; D019047:Phantoms, Imaging; D014054:Tomography / Q000379:methods*