title: Reliability test of an electron cyclotron resonance ion source for accelerator driven sub-critical system.
abstract: The reliability test of an electron cyclotron resonance ion source developed for accelerator driven sub-critical system is carried out in China Institute of Atomic Energy. A unique technique to improve the reliability is adopted. The source is operated for more than 200 h at 75 keV, 100 mA extracted hydrogen current, while 2 beam trips are recorded in the period, and uninterrupted operation time is about 150 h. The experimental result is described.
authors.affiliation: China Institute of Atomic Energy, P. O. Box 275(27), Beijing 102413, China. cui@ciae.ac.cn
authors.forename: B
authors.initials: B
authors.lastname: Cui
authors.forename: B
authors.initials: B
authors.lastname: Tang
authors.forename: R
authors.initials: R
authors.lastname: Ma
authors.forename: Q
authors.initials: Q
authors.lastname: Huang
authors.forename: Y
authors.initials: Y
authors.lastname: Ma
authors.forename: L
authors.initials: L
authors.lastname: Chen
authors.forename: W
authors.initials: W
authors.lastname: Jiang