title: Characterization and correction of cupping effect artefacts in cone beam CT.
abstract: OBJECTIVE
  The purpose of this study was to demonstrate and correct the cupping effect artefact that occurs owing to the presence of beam hardening and scatter radiation during image acquisition in cone beam CT (CBCT).
  
  
  METHODS
  A uniform aluminium cylinder (6061) was used to demonstrate the cupping effect artefact on the Planmeca Promax 3D CBCT unit (Planmeca OY, Helsinki, Finland). The cupping effect was studied using a line profile plot of the grey level values using ImageJ software (National Institutes of Health, Bethesda, MD). A hardware-based correction method using copper pre-filtration was used to address this artefact caused by beam hardening and a software-based subtraction algorithm was used to address scatter contamination.
  
  
  RESULTS
  The hardware-based correction used to address the effects of beam hardening suppressed the cupping effect artefact but did not eliminate it. The software-based correction used to address the effects of scatter resulted in elimination of the cupping effect artefact.
  
  
  CONCLUSIONS
  Compensating for the presence of beam hardening and scatter radiation improves grey level uniformity in CBCT.
authors.affiliation: Department of Oral Health and Diagnostic Sciences, Georgia Health Sciences University, College of Dental Medicine, Georgia 30912-1241, USA. ahunter@georgiahealth.edu
authors.forename: A K
authors.initials: AK
authors.lastname: Hunter
authors.forename: W D
authors.initials: WD
authors.lastname: McDavid
mesh_terms: D000465:Algorithms; D000497:Alloys; D000535:Aluminum; D016477:Artifacts; D003201:Computers; D054893:Cone-Beam Computed Tomography / Q000295:instrumentation / Q000379:methods*; D003300:Copper; D004867:Equipment Design; D005374:Filtration / Q000295:instrumentation; D006801:Humans; D007091:Image Processing, Computer-Assisted / Q000379:methods; D021621:Imaging, Three-Dimensional / Q000379:methods; D008274:Magnesium; D011856:Radiographic Image Enhancement / Q000379:methods; D012542:Scattering, Radiation; D012825:Silicon; D012984:Software
chemical_list: D000497:Alloys; D003300:Copper; D000535:Aluminum; D008274:Magnesium; D012825:Silicon