title: Superresolution four-wave mixing microscopy.
abstract: We report on the development of a superresolution four-wave mixing microscope with spatial resolution approaching 130 nm which represents better than twice the diffraction limit at 800 nm while retaining the ability to acquire materials- and chemical- specific contrast. The resolution enhancement is achieved by narrowing the microscope's excitation volume in the focal plane through the combined use of a Toraldo-style pupil phase filter with the multiplicative nature of four-wave mixing.
authors.affiliation: National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
authors.forename: Hyunmin
authors.initials: H
authors.lastname: Kim
authors.forename: Garnett W
authors.initials: GW
authors.lastname: Bryant
authors.forename: Stephan J
authors.initials: SJ
authors.lastname: Stranick
mesh_terms: D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000295:instrumentation*; D007909:Lenses; D008853:Microscopy / Q000295:instrumentation*