title: Graphene at high bias: cracking, layer by layer sublimation, and fusing.
abstract: Graphene and few-layer graphene at high bias expose a wealth of phenomena due to the high temperatures reached. With in situ transmission electron microscopy, we observe directly how the current modifies the structure, and vice versa. In some samples, cracks propagate from the edges of the flakes, leading to the formation of narrow constrictions or to nanometer spaced gaps after breakdown. In other samples, we find layer-by-layer evaporation of few-layer graphene, which could be exploited for the controlled production of single layer graphene from multilayered samples. Surprisingly, we even find that two pieces of graphene that overlap can heal out at high bias and form one continuous sheet. These findings open up new avenues to structure graphene for specific device applications.
authors.affiliation: Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands. ab3690@columbia.edu
authors.forename: A
authors.initials: A
authors.lastname: Barreiro
authors.forename: F
authors.initials: F
authors.lastname: Börrnert
authors.forename: M H
authors.initials: MH
authors.lastname: Rümmeli
authors.forename: B
authors.initials: B
authors.lastname: Büchner
authors.forename: L M K
authors.initials: LM
authors.lastname: Vandersypen