title: Wavelength conversion and unicast of 10-Gb/s data spanning up to 700 nm using a silicon nanowaveguide.
abstract: We report extremely large probe-idler separation wavelength conversion (545 nm) and unicast (700 nm) of 10-Gb/s data signals using a dispersion-engineered silicon nanowaveguide. Dispersion-engineered phase matching in the device provides a continuous four-wave-mixing efficiency 3-dB bandwidth exceeding 800 nm. We report the first data validation of wavelength conversion (data modulated probe) and unicast (data modulated pump) of 10-Gb/s data with probe-idler separations spanning 60 nm up to 700 nm accompanied with sensitivity gain in a single device. These demonstrations further validate the silicon platform as a highly broadband flexible platform for nonlinear all-optical data manipulation.
authors.affiliation: Department of Electrical Engineering, Columbia University, New York, New York 10027, USA. ophir@ee.columbia.edu
authors.forename: Noam
authors.initials: N
authors.lastname: Ophir
authors.forename: Ryan K W
authors.initials: RK
authors.lastname: Lau
authors.forename: Michael
authors.initials: M
authors.lastname: Menard
authors.forename: Xiaoliang
authors.initials: X
authors.lastname: Zhu
authors.forename: Kishore
authors.initials: K
authors.lastname: Padmaraju
authors.forename: Yoshitomo
authors.initials: Y
authors.lastname: Okawachi
authors.forename: Reza
authors.initials: R
authors.lastname: Salem
authors.forename: Michal
authors.initials: M
authors.lastname: Lipson
authors.forename: Alexander L
authors.initials: AL
authors.lastname: Gaeta
authors.forename: Keren
authors.initials: K
authors.lastname: Bergman
mesh_terms: D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D053758:Nanoparticles / Q000737:chemistry* / Q000648:ultrastructure; D036103:Nanotechnology / Q000295:instrumentation*; D012031:Refractometry / Q000295:instrumentation*; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation*; D012825:Silicon / Q000737:chemistry*; D020349:Surface Plasmon Resonance / Q000295:instrumentation*; D013685:Telecommunications / Q000295:instrumentation*
chemical_list: D012825:Silicon