title: Three-dimensional measuring technique for surface topography using a light-sectioning microscope.
abstract: Three-dimensional (3D) surface topographic analysis, measurement, and assessment techniques have raised great interest not only among researchers but also among industrial users. Many industrial processes and applications are directly influenced by the small-scale roughness of surface finishes. This paper describes the development and implementation of a noncontact, three-dimensional, microtopography measuring system. The instrument is formed by combining a modified light-sectioning microscope subsystem with a computer subsystem. In particular, optical system characteristics of the light-sectioning microscope are investigated, and a textured steel sheet is measured to demonstrate good practical outcomes. Details of measuring processes and image processing algorithms are provided, such as procedures for measurement, image edge extraction, and 3D topography reconstruction. After the 3D topography of the measured surface has been reconstructed, the topography field description parameters are calculated. A standard roughness block was used for calibration of the surface microtopography measuring system. Results obtained showed the measurement method output has good agreement with the actual asperity (unevenness or roughness) of the surface. The computer subsystem is used to process and control asperity measurements and image generation, and for image acquisition and presentation.
authors.affiliation: Wuhan National Laboratory for Optoelectronics, School of Optoelectronic Science and Engineering, Huazhong University of Science and Technology, Wuhan, China.
authors.forename: Linglin
authors.initials: L
authors.lastname: Xia
authors.forename: Peifeng
authors.initials: P
authors.lastname: Chen
authors.forename: Ying
authors.initials: Y
authors.lastname: Wang
authors.forename: Le
authors.initials: L
authors.lastname: Zhou
authors.forename: Xi
authors.initials: X
authors.lastname: Luo