title: Measurement device for noise factor of microchannel plate.
abstract: A new method for noise power factor determination of microchannel plates (MCPs) is described in this paper. The new measuring condition and specific measuring instrument are reported. The system consists of a vacuum chamber, an electron gun, a high-voltage supply, an imaging luminance meter, control units, a signal processing circuit, an A/D converter, a D/A converter, a communication unit, an industrial computer, and measurement software. This measuring method fills a void in measuring technology for the noise factor of MCPs, and it can make a scientific assessment of MCP noise characteristics and provide theoretical direction and technology support for the research and development of high-performance low light level (LLL) devices.
authors.affiliation: Institute of Electronic Engineering and Photoelectric Technology, Nanjing University of Science and Technology, Nanjing 210094, China. liulei442@yahoo.com.cn
authors.forename: Liu
authors.initials: L
authors.lastname: Lei
authors.forename: Huang
authors.initials: H
authors.lastname: Zhijian
authors.forename: Pan
authors.initials: P
authors.lastname: Tao
authors.forename: Qian
authors.initials: Q
authors.lastname: Yunsheng