title: Atomic structure of highly strained BiFeO3 thin films.
abstract: We determine the atomic structure of the pseudotetragonal T phase and the pseudorhombohedral R phase in highly strained multiferroic BiFeO(3) thin films by using a combination of atomic-resolution scanning transmission electron microscopy and electron energy-loss spectroscopy. The coordination of the Fe atoms and their displacement relative to the O and Bi positions are assessed by direct imaging. These observations allow us to interpret the electronic structure data derived from electron energy-loss spectroscopy and provide evidence for the giant spontaneous polarization in strained BiFeO(3) thin films.
authors.affiliation: Electron Microscopy Center, Empa, Swiss Federal Laboratories for Materials Science and Technology, CH-8600 Dübendorf, Switzerland. marta.rossell@empa.ch
authors.forename: M D
authors.initials: MD
authors.lastname: Rossell
authors.forename: R
authors.initials: R
authors.lastname: Erni
authors.forename: M P
authors.initials: MP
authors.lastname: Prange
authors.forename: J-C
authors.initials: JC
authors.lastname: Idrobo
authors.forename: W
authors.initials: W
authors.lastname: Luo
authors.forename: R J
authors.initials: RJ
authors.lastname: Zeches
authors.forename: S T
authors.initials: ST
authors.lastname: Pantelides
authors.forename: R
authors.initials: R
authors.lastname: Ramesh