title: Characterizing the geometry of InAs nanowires using mirror electron microscopy.
abstract: Mirror electron microscopy (MEM) imaging of InAs nanowires is a non-destructive electron microscopy technique where the electrons are reflected via an applied electric field before they reach the specimen surface. However strong caustic features are observed that can be non-intuitive and difficult to relate to nanowire geometry and composition. Utilizing caustic imaging theory we can understand and interpret MEM image contrast, relating caustic image features to the properties and parameters of the nanowire. This is applied to obtain quantitative information, including the nanowire width via a through-focus series of MEM images.
authors.affiliation: School of Physics, Monash University, Victoria 3800, Australia.
authors.forename: S M
authors.initials: SM
authors.lastname: Kennedy
authors.forename: M
authors.initials: M
authors.lastname: Hjort
authors.forename: B
authors.initials: B
authors.lastname: Mandl
authors.forename: E
authors.initials: E
authors.lastname: Marsell
authors.forename: A A
authors.initials: AA
authors.lastname: Zakharov
authors.forename: A
authors.initials: A
authors.lastname: Mikkelsen
authors.forename: D M
authors.initials: DM
authors.lastname: Paganin
authors.forename: D E
authors.initials: DE
authors.lastname: Jesson