title: Compression of nanowires using a flat indenter: diametrical elasticity measurement.
abstract: A new experimental approach for the characterization of the diametrical elastic modulus of individual nanowires is proposed by implementing a micro/nanoscale diametrical compression test geometry, using a flat punch indenter. A 250 nm diameter single crystal silicon nanowire is compressed inside of a scanning electron microscope. Since silicon is highly anisotropic, the wire crystal orientation in the compression axis is determined by electron backscatter diffraction. In order to analyze the load-displacement compression data, a two-dimensional analytical closed-form solution based on a classical contact model is proposed. The results of the analytical model are compared with those of finite element simulations and to the experimental diametrical compression results and show good agreement.
authors.affiliation: Frontier Institute of Science and Technology, Xi'an Jiaotong University, 710054, Xi'an, China. wzzhao@yahoo.fr
authors.forename: Zhao
authors.initials: Z
authors.lastname: Wang
authors.forename: William M
authors.initials: WM
authors.lastname: Mook
authors.forename: Christoph
authors.initials: C
authors.lastname: Niederberger
authors.forename: Rudy
authors.initials: R
authors.lastname: Ghisleni
authors.forename: Laetitia
authors.initials: L
authors.lastname: Philippe
authors.forename: Johann
authors.initials: J
authors.lastname: Michler