title: Effect of loading time on the survival rate of anodic oxidized implants: prospective multicenter study.
abstract: OBJECTIVE
  The purpose of this prospective study was to evaluate the effect of early loading on survival rate or clinical parameter of anodic oxidized implants during the 12-month postloading period.
  
  
  METHODS
  Total 69 implants were placed in 42 patients. Anodic oxidized implants (GS II, Osstem Cor., Busan, Korea) placed on the posterior mandibles were divided into two groups, according to their prosthetic loading times: test group (2 to 6 weeks), and control group (3 to 4 months). The implant survival rates were determined during one-year postloading period and analyzed by Kaplan-Meier method. The radiographic peri-implant bone loss and periodontal parameters were also evaluated and statistically analyzed by unpaired t-test.
  
  
  RESULTS
  Total 69 implants were placed in 42 patients. The cumulative postloading implant survival rates were 88.89% in test group, compared to 100% in control group (P<.05). Periimplant marginal bone loss (T: 0.27±0.54 mm, C: 0.40±0.55 mm) and periodontal parameters showed no significant difference between the groups (P>.05).
  
  
  CONCLUSIONS
  Within the limitation of the present study, implant survival was affected by early loading on the anodic oxidized implants placed on posterior mandibles during one-year follow-up. Early implant loading did not influence peri-implant marginal bone loss, and periodontal parameters.
authors.affiliation: Department of Prosthodontics, Samsung Medical Center, College of Medicine, Sungkyunkwan University, Seoul, Korea.
authors.forename: Seok-Gyu
authors.initials: SG
authors.lastname: Kim
authors.forename: Pil-Young
authors.initials: PY
authors.lastname: Yun
authors.forename: Hyun-Sik
authors.initials: HS
authors.lastname: Park
authors.forename: June-Sung
authors.initials: JS
authors.lastname: Shim
authors.forename: Jung-Won
authors.initials: JW
authors.lastname: Hwang
authors.forename: Young-Kyun
authors.initials: YK
authors.lastname: Kim