title: Current mode atomic force microscopy (C-AFM) study for local electrical characterization of conjugated polymer blends.
abstract: A blend of regioregular poly(3-hexylthiophene) (P3HT) and poly{[N,N'-bis(2-octyldodecyl)-naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl]-alt-5,5'-(2,2'-bithiophene)} (P(NDI2OD-T2), which has the potential for polymer solar cells application, was prepared for current mode atomic force microscopy (C-AFM) measurements in this study. Phase-separated domains and the local electrical characteristics of P3HT/P(NDI2OD-T2) blends were investigated by the C-AFM.
authors.affiliation: Department of Material Science and Engineering, Feng Chia University, Taiwan. ltlee@fcu.edu.tw
authors.forename: Li-Ting
authors.initials: LT
authors.lastname: Lee
authors.forename: Shinzaburo
authors.initials: S
authors.lastname: Ito
authors.forename: Hiroaki
authors.initials: H
authors.lastname: Benten
authors.forename: Hideo
authors.initials: H
authors.lastname: Ohkita
authors.forename: Daisuke
authors.initials: D
authors.lastname: Mori
mesh_terms: D018625:Microscopy, Atomic Force; D011108:Polymers / Q000737:chemistry*; D012993:Solar Energy; D013876:Thiophenes / Q000737:chemistry
chemical_list: D011108:Polymers; D013876:Thiophenes; C507295:poly(3-hexylthiophene)