title: Diffraction phase microscopy with white light.
abstract: We present white light diffraction phase microscopy (wDPM) as a quantitative phase imaging method that combines the single shot measurement benefit associated with off-axis methods, high temporal phase stability associated with common path geometries, and high spatial phase sensitivity due to the white light illumination. We propose a spatiotemporal filtering method that pushes the limit of the pathlength sensitivity to the subangstrom level at practical spatial and temporal bandwidths. We illustrate the utility of wDPM with measurements on red blood cell morphology and HeLa cell growth over 18 hours.
authors.affiliation: Department of Electrical and Computer Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA.
authors.forename: Basanta
authors.initials: B
authors.lastname: Bhaduri
authors.forename: Hoa
authors.initials: H
authors.lastname: Pham
authors.forename: Mustafa
authors.initials: M
authors.lastname: Mir
authors.forename: Gabriel
authors.initials: G
authors.lastname: Popescu