title: Assessment of misorientation in metallic and semiconducting nanowires using precession electron diffraction.
abstract: Precession electron diffraction (PED) allows for diffraction pattern collection under quasi-kinematical conditions. The combination of PED with fast electron diffraction acquisition and pattern matching software techniques is used for the high magnification ultra-fast mapping of variable crystal orientations and phases, similarly to what is achieved with the Electron Backscattered Diffraction technique in Scanning Electron Microscopes at lower magnifications and longer acquisition times. Here we report, for the first time, the application of this PED-based orientation mapping technique to both metallic and semiconducting nanowires.
authors.affiliation: LENS, MIND-IN2UB, Departament d'Electrònica, Universitat de Barcelona, Martí i Franquès 1, 08028 Barcelona, Spain. sestrade@ub.edu
authors.forename: Sonia
authors.initials: S
authors.lastname: Estradé
authors.forename: Joaquim
authors.initials: J
authors.lastname: Portillo
authors.forename: Joan
authors.initials: J
authors.lastname: Mendoza
authors.forename: Ivette
authors.initials: I
authors.lastname: Kosta
authors.forename: Maria
authors.initials: M
authors.lastname: Serret
authors.forename: Carlos
authors.initials: C
authors.lastname: Müller
authors.forename: Francesca
authors.initials: F
authors.lastname: Peiró