title: Nanoscale investigation of the electrical properties in semiconductor polymer-carbon nanotube hybrid materials.
abstract: The morphology and electrical properties of hybrids of a semiconducting polymer (namely poly(3-hexylthiophene) P3HT) and carbon nanotubes are investigated at the nanoscale with a combination of Scanning Probe Microscopy techniques, i.e., Conductive Atomic Force Microscopy (C-AFM) and time-resolved Current Sensing Force Spectroscopy Atomic Force Microscopy (CSFS-AFM, or PeakForce TUNA™). This allows us to probe the electrical properties of the 15 nm wide P3HT nanofibers as well as the interface between the polymer and single carbon nanotubes. This is achieved by applying controlled, low forces on the tip during imaging, which allows a direct comparison between the morphology and the electrical properties at the nanometre scale.
authors.affiliation: Laboratory for Chemistry for Novel Materials, Center of Innovation and Research in Materials and Polymers, University of Mons, UMONS/Materia Nova, Place du Parc 20, 7000 Mons, Belgium.
authors.forename: Simon
authors.initials: S
authors.lastname: Desbief
authors.forename: Noémie
authors.initials: N
authors.lastname: Hergué
authors.forename: Olivier
authors.initials: O
authors.lastname: Douhéret
authors.forename: Mathieu
authors.initials: M
authors.lastname: Surin
authors.forename: Philippe
authors.initials: P
authors.lastname: Dubois
authors.forename: Yves
authors.initials: Y
authors.lastname: Geerts
authors.forename: Roberto
authors.initials: R
authors.lastname: Lazzaroni
authors.forename: Philippe
authors.initials: P
authors.lastname: Leclère