title: Digital holographic microscopy characterization of superdirective beam by metamaterial.
abstract: Digital holographic microscopy (DHM) has been successfully applied for the first time to characterize the radiative out-of-plane emission properties of a superdirective device. Complementarily to near-field microscopy, DHM allows us to reconstruct the beam in the far-field region. The angular dispersion of the light beam radiated from a grating composed of air and anti-air metamaterial has been determined, and the proposed technique has highlighted a collimation degree higher than 0.04°, as already evaluated in a previous work. Further considerations on the retrieved phase map of the beam in the acquisition plane are presented.
authors.affiliation: Institute for Microelectronics and Microsystems (IMM) of the National Council of Research (CNR) Unità di Napoli, Napoli, Italy. giuseppe.dicaprio@na.imm.cnr.it
authors.forename: Giuseppe
authors.initials: G
authors.lastname: Di Caprio
authors.forename: Principia
authors.initials: P
authors.lastname: Dardano
authors.forename: Giuseppe
authors.initials: G
authors.lastname: Coppola
authors.forename: Stefano
authors.initials: S
authors.lastname: Cabrini
authors.forename: Vito
authors.initials: V
authors.lastname: Mocella