title: Combining Fourier transform-ion cyclotron resonance/mass spectrometry analysis and Kendrick plots for silicon speciation and molecular characterization in petroleum products at trace levels.
abstract: A new method combining FT-ICR/MS analysis and Kendrick plots for the characterization of silicon species at trace levels in light petroleum products is presented. The method provides efficient instrumental detection limits ranging from 80 ng/kg to 5 μg/kg and reliable mass accuracy lower than 0.50 ppm for model silicon molecules in spiked gasoline. More than 3000 peaks could be detected in the m/z 50-500 range depending on the nature of the gasoline sample analyzed. An in-house software program was used to calculate Kendrick plots. Then, an algorithm searched, selected, and represented silicon species classes (O(2)Si, O(3)Si, and O(4)Si classes) in Kendrick plots by incorporating model molecules' information (i.e., exact mass and intensity). This procedure allowed the complete characterization of more than 50 new silicon species with different degrees of unsaturation in petroleum products.
authors.affiliation: Physics and Analysis Division, IFP Energies nouvelles-Lyon, F-69360 Solaize, France.
authors.forename: Fabien
authors.initials: F
authors.lastname: Chainet
authors.forename: Jérémie
authors.initials: J
authors.lastname: Ponthus
authors.forename: Charles-Philippe
authors.initials: CP
authors.lastname: Lienemann
authors.forename: Marion
authors.initials: M
authors.lastname: Courtiade
authors.forename: Olivier François Xavier
authors.initials: OF
authors.lastname: Donard