title: Lifetime measurements in an electrostatic ion beam trap using image charge monitoring.
abstract: A technique for mass-selective lifetime measurements of keV ions in a linear electrostatic ion beam trap is presented. The technique is based on bunching the ions using a weak RF potential and non-destructive ion detection by a pick-up electrode. This method has no mass-limitation, possesses the advantage of inherent mass-selectivity, and offers a possibility of measuring simultaneously the lifetimes of different ion species with no need for prior mass-selection.
authors.affiliation: Department of Particle Physics and Astrophysics, Weizmann Institute of Science, 76100 Rehovot, Israel. igorra@openu.ac.il
authors.forename: Igor
authors.initials: I
authors.lastname: Rahinov
authors.forename: Yoni
authors.initials: Y
authors.lastname: Toker
authors.forename: Oded
authors.initials: O
authors.lastname: Heber
authors.forename: Daniel
authors.initials: D
authors.lastname: Strasser
authors.forename: Michael
authors.initials: M
authors.lastname: Rappaport
authors.forename: Dirk
authors.initials: D
authors.lastname: Schwalm
authors.forename: Daniel
authors.initials: D
authors.lastname: Zajfman