title: Integrated in-band optical signal-to-noise ratio monitor implemented on SOI platform.
abstract: Based on different coherence properties of signal and noise, we measured the in-band optical signal-to-noise ratio using an integrated thermally tunable Mach-Zehnder optical delay interferometer on SOI platform. The experimental results exhibit errors smaller than 1 dB for signals with bit rate <40 Gbps over an OSNR range of 9~30 dB. The effects of the extinction ratio, noise equivalent bandwidth and arm length difference on the implementation of measurement are analyzed.
authors.affiliation: Institute of Microelectronics, A STAR (Agency of Science and Technology Research), 11 Science Park Road, Science Park II, 117685 Singapore. jialx@ime.a-star.edu.sg
authors.forename: Lianxi
authors.initials: L
authors.lastname: Jia
authors.forename: Junfeng
authors.initials: J
authors.lastname: Song
authors.forename: Tsung-Yang
authors.initials: TY
authors.lastname: Liow
authors.forename: Qing
authors.initials: Q
authors.lastname: Fang
authors.forename: Mingbin
authors.initials: M
authors.lastname: Yu
authors.forename: G Q
authors.initials: GQ
authors.lastname: Lo
authors.forename: Dim-Lee
authors.initials: DL
authors.lastname: Kwong