title: Monitoring the layer-by-layer self-assembly of graphene and graphene oxide by spectroscopic ellipsometry.
abstract: Thin films of graphene oxide, graphene and copper (II) phthalocyanine dye have been successfully fabricated by electrostatic layer-by-layer (LbL) assembly approach. We present the first variable angle spectroscopic ellipsometry (VASE) investigation on these graphene-dye hybrid thin films. The thickness evaluation suggested that our LbL assembly process produces highly uniform and reproducible thin films. We demonstrate that the refractive indices of the graphene-dye thin films undergo dramatic variation in the range close to the absorption of the dyes. This investigation provides new insight to the optical properties of graphene containing thin films and shall help to establish an appropriate optical model for graphene-based hybrid materials.
authors.affiliation: State Key Laboratory of Applied Organic Chemistry, College of Chemistry and Chemical Engineering, Lanzhou University, Lanzhou 730000, China.
authors.forename: Kai-Ge
authors.initials: KG
authors.lastname: Zhou
authors.forename: Meng-Jie
authors.initials: MJ
authors.lastname: Chang
authors.forename: Hang-Xing
authors.initials: HX
authors.lastname: Wang
authors.forename: Yu-Long
authors.initials: YL
authors.lastname: Xie
authors.forename: Hao-Li
authors.initials: HL
authors.lastname: Zhang
mesh_terms: D003460:Crystallization / Q000379:methods*; D006108:Graphite / Q000737:chemistry*; D008422:Materials Testing / Q000379:methods; D008968:Molecular Conformation; D049329:Nanostructures / Q000737:chemistry* / Q000648:ultrastructure*; D010087:Oxides / Q000737:chemistry*; D010316:Particle Size; D013057:Spectrum Analysis / Q000379:methods*; D013499:Surface Properties
chemical_list: D010087:Oxides; D006108:Graphite