title: The SAM, not the electrodes, dominates charge transport in metal-monolayer//Ga2O3/gallium-indium eutectic junctions.
abstract: The liquid-metal eutectic of gallium and indium (EGaIn) is a useful electrode for making soft electrical contacts to self-assembled monolayers (SAMs). This electrode has, however, one feature whose effect on charge transport has been incompletely understood: a thin (approximately 0.7 nm) film-consisting primarily of Ga(2)O(3)-that covers its surface when in contact with air. SAMs that rectify current have been measured using this electrode in Ag(TS)-SAM//Ga(2)O(3)/EGaIn (where Ag(TS) = template-stripped Ag surface) junctions. This paper organizes evidence, both published and unpublished, showing that the molecular structure of the SAM (specifically, the presence of an accessible molecular orbital asymmetrically located within the SAM), not the difference between the electrodes or the characteristics of the Ga(2)O(3) film, causes the observed rectification. By examining and ruling out potential mechanisms of rectification that rely either on the Ga(2)O(3) film or on the asymmetry of the electrodes, this paper demonstrates that the structure of the SAM dominates charge transport through Ag(TS)-SAM//Ga(2)O(3)/EGaIn junctions, and that the electrical characteristics of the Ga(2)O(3) film have a negligible effect on these measurements.
authors.affiliation: Department of Chemistry and Chemical Biology, Harvard University, 12 Oxford Street, Cambridge, Massachusetts 02138, USA.
authors.forename: William F
authors.initials: WF
authors.lastname: Reus
authors.forename: Martin M
authors.initials: MM
authors.lastname: Thuo
authors.forename: Nathan D
authors.initials: ND
authors.lastname: Shapiro
authors.forename: Christian A
authors.initials: CA
authors.lastname: Nijhuis
authors.forename: George M
authors.initials: GM
authors.lastname: Whitesides
mesh_terms: D004553:Electric Conductivity; D004579:Electron Transport; D004867:Equipment Design; D019544:Equipment Failure Analysis; D005708:Gallium / Q000737:chemistry*; D006244:Hardness; D007204:Indium / Q000737:chemistry*; D008422:Materials Testing; D008567:Membranes, Artificial; D008839:Microelectrodes; D008968:Molecular Conformation; D012996:Solutions; D013499:Surface Properties
chemical_list: D008567:Membranes, Artificial; D012996:Solutions; D007204:Indium; D005708:Gallium