title: Evaluation of defects generation in crystalline silicon ingot grown by cast technique with seed crystal for solar cells.
abstract: Although crystalline silicon is widely used as substrate material for solar cell, many defects occur during crystal growth. In this study, the generation of crystalline defects in silicon substrates was evaluated. The distributions of small-angle grain boundaries were observed in substrates sliced parallel to the growth direction. Many precipitates consisting of light elemental impurities and small-angle grain boundaries were confirmed to propagate. The precipitates mainly consisted of Si, C, and N atoms. The small-angle grain boundaries were distributed after the precipitation density increased. Then, precipitates appeared at the small-angle grain boundaries. We consider that the origin of the small-angle grain boundaries was lattice mismatch and/or strain caused by the high-density precipitation.
authors.forename: Tomihisa
authors.initials: T
authors.lastname: Tachibana
authors.forename: Takashi
authors.initials: T
authors.lastname: Sameshima
authors.forename: Takuto
authors.initials: T
authors.lastname: Kojima
authors.forename: Koji
authors.initials: K
authors.lastname: Arafune
authors.forename: Koichi
authors.initials: K
authors.lastname: Kakimoto
authors.forename: Yoshiji
authors.initials: Y
authors.lastname: Miyamura
authors.forename: Hirofumi
authors.initials: H
authors.lastname: Harada
authors.forename: Takashi
authors.initials: T
authors.lastname: Sekiguchi
authors.forename: Yoshio
authors.initials: Y
authors.lastname: Ohshita
authors.forename: Atsushi
authors.initials: A
authors.lastname: Ogura