title: Laser detection of electrical service safety in a single ZnO nanowire.
abstract: The electrically induced quenching of the photoluminescence (PL) intensity and fracture in a single ZnO nanowire were investigated. As the applied voltage increases, the quenching of PL intensity and the red-shift of ultraviolet (UV) emission peak were clearly observed, which are explained by the current-induced Joule heating in the ZnO nanowire. By using this mechanism, the UV laser was successfully used to monitor the safe current density and identify the current-induced fracture in a single ZnO nanowire.
authors.affiliation: State Key Laboratory for Advanced Metals and Materials, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083, China.
authors.forename: Ya
authors.initials: Y
authors.lastname: Yang
authors.forename: Wen
authors.initials: W
authors.lastname: Guo
authors.forename: Junjie
authors.initials: J
authors.lastname: Qi
authors.forename: Jing
authors.initials: J
authors.lastname: Zhao
authors.forename: Yue
authors.initials: Y
authors.lastname: Zhang
mesh_terms: D004559:Electric Wiring; D004867:Equipment Design; D019544:Equipment Failure Analysis / Q000379:methods*; D004869:Equipment Safety; D007834:Lasers; D049329:Nanostructures / Q000737:chemistry* / Q000648:ultrastructure; D010316:Particle Size; D015034:Zinc Oxide / Q000737:chemistry*
chemical_list: D015034:Zinc Oxide