title: Oblique incidence ellipsometric characterization and the substrate dependence of visible frequency fishnet metamaterials.
abstract: We use spectroscopic ellipsometry to investigate the angular-dependent optical modes of fishnet metamaterials fabricated by nanoimprint lithography. Spectroscopic ellipsometry is demonstrated as a fast and efficient method for metamaterial characterization and the measured polarization ratios significantly simplify the calibration procedures compared to reflectance and transmittance measurements. We show that the modes can be well identified by a combination of comparing different substrates and considering the angular dependence of the Wood's anomalies. The lack of angular dispersion of the anti-symmetric gap-modes does not agree with the model and requires further theoretical investigation.
authors.affiliation: Leibniz-Institut für Analytische Wissenschaften-ISAS-eV, Berlin, Germany. tom.oates@isas.de
authors.forename: Thomas W H
authors.initials: TW
authors.lastname: Oates
authors.forename: Babak
authors.initials: B
authors.lastname: Dastmalchi
authors.forename: Goran
authors.initials: G
authors.lastname: Isic
authors.forename: Sajjad
authors.initials: S
authors.lastname: Tollabimazraehno
authors.forename: Christian
authors.initials: C
authors.lastname: Helgert
authors.forename: Thomas
authors.initials: T
authors.lastname: Pertsch
authors.forename: Ernst-Bernhard
authors.initials: EB
authors.lastname: Kley
authors.forename: Marc A
authors.initials: MA
authors.lastname: Verschuuren
authors.forename: Iris
authors.initials: I
authors.lastname: Bergmair
authors.forename: Kurt
authors.initials: K
authors.lastname: Hingerl
authors.forename: Karsten
authors.initials: K
authors.lastname: Hinrichs
mesh_terms: D000465:Algorithms; D002138:Calibration; D004867:Equipment Design; D008422:Materials Testing; D008855:Microscopy, Electron, Scanning / Q000379:methods; D015233:Models, Statistical; D008962:Models, Theoretical; D049329:Nanostructures / Q000737:chemistry*; D036103:Nanotechnology / Q000379:methods*; D055095:Optics and Photonics; D013053:Spectrophotometry / Q000379:methods