title: Abnormal pixel detection using sum-of-projections symmetry in cone beam computed tomography.
abstract: A novel abnormal pixels (APs) detection approach is proposed to remove artefacts from reconstructed images in cone beam computed tomography (CBCT). This approach is based on the symmetry detection of sum-of-projections (SOP). Because some factors affect the SOP symmetry, we combine dyadic wavelet transform-based singularity detection to extract the APs. Next, the Laplacian solution (LS) method is employed to restore the APs in each projection image. Experimental results demonstrate the efficiency of our approach for different imaging tasks.
authors.affiliation: Britton Chance Center for Biomedical Photonics, Wuhan National Laboratory for Optoelectronics-Huazhong University of Science and Technology, Wuhan, China.
authors.forename: Xiaoquan
authors.initials: X
authors.lastname: Yang
authors.forename: Yuanzheng
authors.initials: Y
authors.lastname: Meng
authors.forename: Hui
authors.initials: H
authors.lastname: Gong
authors.forename: Yong
authors.initials: Y
authors.lastname: Deng
authors.forename: Qingming
authors.initials: Q
authors.lastname: Luo
mesh_terms: D000465:Algorithms; D016477:Artifacts; D002138:Calibration; D054893:Cone-Beam Computed Tomography / Q000295:instrumentation* / Q000379:methods*; D004867:Equipment Design; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D015233:Models, Statistical; D055095:Optics and Photonics; D019047:Phantoms, Imaging; D010825:Physics / Q000379:methods; D014057:Tomography, X-Ray Computed / Q000379:methods