title: Quantitative Rietveld texture analysis of CaSiO(3)  perovskite deformed in a diamond anvil cell.
abstract: The Rietveld method is used to extract quantitative texture information from a single synchrotron diffraction image of a CaSiO(3)  perovskite sample deformed in axial compression in a diamond anvil cell. The image used for analysis was taken in radial geometry at 49 GPa and room temperature. We obtain a preferred orientation of {100} lattice planes oriented perpendicular to the compression direction and this is compatible with [Formula: see text] slip.
authors.affiliation: Department of Earth and Planetary Science, University of California, Berkeley, CA 94720, USA.
authors.forename: Lowell
authors.initials: L
authors.lastname: Miyagi
authors.forename: Sébastien
authors.initials: S
authors.lastname: Merkel
authors.forename: Takehiko
authors.initials: T
authors.lastname: Yagi
authors.forename: Nagayoshi
authors.initials: N
authors.lastname: Sata
authors.forename: Yasuo
authors.initials: Y
authors.lastname: Ohishi
authors.forename: Hans-Rudolf
authors.initials: HR
authors.lastname: Wenk