title: Modeling quantitative phase image formation under tilted illuminations.
abstract: A generalized product-of-convolution model for simulation of quantitative phase microscopy of thick heterogeneous specimen under tilted plane-wave illumination is presented. Actual simulations are checked against a much more time-consuming commercial finite-difference time-domain method. Then modeled data are compared with experimental measurements that were made with a quadriwave lateral shearing interferometer.
authors.affiliation: Aix-Marseille Université, CNRS UMR7249, Institut Fresnel, Campus de Saint-Jérôme, Marseille, France.
authors.forename: Pierre
authors.initials: P
authors.lastname: Bon
authors.forename: Benoit
authors.initials: B
authors.lastname: Wattellier
authors.forename: Serge
authors.initials: S
authors.lastname: Monneret