title: X-ray submicrometer phase contrast imaging with a Fresnel zone plate and a two dimensional grating interferometer.
abstract: The application of a two dimensional (2D) grating interferometer-Fresnel zone plate combination for quantitative submicron phase contrast imaging is reported. The combination of the two optical elements allows quick recovery of the phase shift introduced by a sample in a hard X-ray beam, avoiding artifacts observed when using the one dimensional (1D) interferometer for a sample with features oriented in the unsensitive direction of the interferometer. The setup provides submicron resolution due to the optics magnification ratio and a fine sensitivity in both transverse orientations due to the 2D analysis gratings. The method opens up possibilities for sub-micro phase contrast tomography of microscopic objects made of light and/or homogeneous materials with randomly oriented features.
authors.affiliation: Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxon, UK.
authors.forename: S
authors.initials: S
authors.lastname: Berujon
authors.forename: H
authors.initials: H
authors.lastname: Wang
authors.forename: I
authors.initials: I
authors.lastname: Pape
authors.forename: K
authors.initials: K
authors.lastname: Sawhney
authors.forename: S
authors.initials: S
authors.lastname: Rutishauser
authors.forename: C
authors.initials: C
authors.lastname: David