title: Optimized off-axis cylindrical mirror-focused line-scanning system for optical coherence tomography imaging applications.
abstract: The parameters of an off-axis cylindrical mirror-focused line-scanning system were studied to optimize the flatness of the 2 mm scan field. The scanning system parameters included the beam size, the distance between the scanning and the focusing mirror, the angle between the incident beam and the reflected beam, the optical scan angle, and the effective focal length of the cylindrical mirror. Because of the off-axis line-scanning system configuration, the scanning could be carried out either in the tangential (Y-scan) or in the sagittal (X-scan) plane. A 53 nm spectral bandwidth light source was used to evaluate the imaging performance of the scanning system. Since reflective optics is employed in this work for focusing, the scanning system could be used with a higher spectral bandwidth light source for optical coherence tomography applications. The effect of the angle between of the incident and reflected beams, the distance between the mirrors, the focal length of the cylindrical mirror and the scanning directions, on the flatness of the scan field were studied. It was proved that the sagittal scanning is least sensitive to variations in scanning system parameters and thus provides maximum flexibility in design.
authors.affiliation: Concordia University, Department of Mechanical Engineering, 1455 De Maisonneuve Boulevard West, Montreal, Quebec, H3G1M8 Canada.
authors.forename: Mohammad
authors.initials: M
authors.lastname: Kamal
authors.forename: Sivakumar
authors.initials: S
authors.lastname: Narayanswamy
authors.forename: Muthukumaran
authors.initials: M
authors.lastname: Packirisamy
mesh_terms: D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000295:instrumentation*; D007834:Lasers; D007909:Lenses; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D041623:Tomography, Optical Coherence / Q000295:instrumentation*