Phase resolved near-field mode imaging for the design of frequency-selective surfaces.
Frequency-selective surfaces (FSS) are a class of metasurfaces with engineered reflectance, absorbance, and transmittance behavior. We study an array of metallic crossed dipole FSS elements in the infrared using interferometric scattering-type scanning near-field optical microscopy (s-SNOM). We resolve the dependence of the near-field phase on the dimensions of the elements and compare with numerical models. The combined phase and amplitude information of the underlying near-field mode distribution compared to conventional far-field absorption spectroscopy greatly improves the targeted design of frequency-selective surfaces.
Department of Physics and Optical Sciences, University of North Carolina at Charlotte, 9201 University City Blvd, Charlotte, NC 28223, USA. gboreman@uncc.edu
Edward C
EC
Kinzel
James C
JC
Ginn
Robert L
RL
Olmon
David J
DJ
Shelton
Brian A
BA
Lail
Igal
I
Brener
Michael B
MB
Sinclair
Markus B
MB
Raschke
Glenn D
GD
Boreman
D004867:Equipment Design; D019544:Equipment Failure Analysis; D007368:Interferometry / Q000295:instrumentation*; D008853:Microscopy / Q000295:instrumentation*; D010783:Photometry / Q000295:instrumentation*