Correcting scanning instabilities from images of periodic structures.
A method for measuring and correcting the row displacement errors in lattice images acquired using scanning based methods is presented. This type of distortion is apparent in lattice-resolved images acquired using scanning-based techniques such as scanning transmission electron microscopy (STEM) and translates to vertical streaks convolving every feature in Fourier space. This paper presents a method to measure and correct the distortion based on the phase analysis of the streaks in Fourier space. The validity and the precision of the method is demonstrated using a model image and two experimental STEM images of Si <110> thin film and a 5 nm CoPt disordered nanocrystal. The algorithm is implemented in a freely available Digital Micrograph™ script.
Département de génie chimique et de génie biotechnologique, Université de Sherbrooke. 2500 Boul. de l'Université, Sherbrooke, Québec, Canada J1H 2R1. nadi.braidy@usherbrooke.ca
Nadi
N
Braidy
Yann
Y
Le Bouar
Sorin
S
Lazar
Christian
C
Ricolleau
D000465:Algorithms; D005583:Fourier Analysis; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D017348:Microscopy, Electron, Scanning Transmission / Q000379:methods*; D008962:Models, Theoretical; D053758:Nanoparticles / Q000737:chemistry; D015203:Reproducibility of Results