The dedicated high-resolution grazing-incidence X-ray scattering beamline 8-ID-E at the Advanced Photon Source.
As an increasingly important structural-characterization technique, grazing-incidence X-ray scattering (GIXS) has found wide applications for in situ and real-time studies of nanostructures and nanocomposites at surfaces and interfaces. A dedicated beamline has been designed, constructed and optimized at beamline 8-ID-E at the Advanced Photon Source for high-resolution and coherent GIXS experiments. The effectiveness and applicability of the beamline and the scattering techniques have been demonstrated by a host of experiments including reflectivity, grazing-incidence static and kinetic scattering, and coherent surface X-ray photon correlation spectroscopy. The applicable systems that can be studied at 8-ID-E include liquid surfaces and nanostructured thin films.
X-ray Science Division, Argonne National Laboratory, Argonne, IL 60439, USA.
Zhang
Z
Jiang
Xuefa
X
Li
Joseph
J
Strzalka
Michael
M
Sprung
Tao
T
Sun
Alec R
AR
Sandy
Suresh
S
Narayanan
Dong Ryeol
DR
Lee
Jin
J
Wang