title: Scanning transmission electron microscopy: Albert Crewe's vision and beyond.
abstract: Some four decades were needed to catch up with the vision that Albert Crewe and his group had for the scanning transmission electron microscope (STEM) in the nineteen sixties and seventies: attaining 0.5Å resolution, and identifying single atoms spectroscopically. With these goals now attained, STEM developments are turning toward new directions, such as rapid atomic resolution imaging and exploring atomic bonding and electronic properties of samples at atomic resolution. The accomplishments and the future challenges are reviewed and illustrated with practical examples.
authors: Nion Company, 1102 8th Street, Kirkland, WA 98033, USA. krivanek@nion.com
authors: Ondrej L
authors: OL
authors: Krivanek
authors: Matthew F
authors: MF
authors: Chisholm
authors: Matthew F
authors: MF
authors: Murfitt
authors: Niklas
authors: N
authors: Dellby
mesh_terms: D004583:Electrons; D017348:Microscopy, Electron, Scanning Transmission / Q000295:instrumentation* / Q000379:methods / Q000639:trends*