title: Note: tip enhanced Raman spectroscopy with objective scanner on opaque samples.
abstract: We report on 14 nm lateral resolution in tip-enhanced Raman spectroscopy mapping of carbon nanotubes with an experimental setup that has been designed for the analysis of opaque samples in confocal side-access through a novel piezo-driven objective scanner. The objective scanner allows for fast and stable laser-to-tip alignment and for the adjustment of the focus position with sub-wavelength precision to optimize the excitation of surface plasmons. It also offers the additional benefit of imaging the near-field generated Raman scattering at the gap between tip and sample as direct control of the tip enhancement.
authors: Laboratory of Ferroelectric Nanoelectronics, INRS-EMT, 1650 Boul. Lionel-Boulet, Varennes J3X1S2 Québec, Canada. nicklaus@emt.inrs.ca
authors: Mischa
authors: M
authors: Nicklaus
authors: Christian
authors: C
authors: Nauenheim
authors: Andrey
authors: A
authors: Krayev
authors: Vasili
authors: V
authors: Gavrilyuk
authors: Alexey
authors: A
authors: Belyaev
authors: Andreas
authors: A
authors: Ruediger