title: Chemical identification of single atoms in heterogeneous III-IV chains on Si(100) surface by means of nc-AFM and DFT calculations.
abstract: Chemical identification of individual atoms in mixed In-Sn chains grown on a Si(100)-(2 × 1) surface was investigated by means of room temperature dynamic noncontact AFM measurements and DFT calculations. We demonstrate that the chemical nature of each atom in the chain can be identified by means of measurements of the short-range forces acting between an AFM tip and the atom. On the basis of this method, we revealed incorporation of silicon atoms from the substrate into the metal chains. Analysis of the measured and calculated short-range forces indicates that even different chemical states of a single atom can be distinguished.
authors: Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnická 10, 162 00, Prague, Czech Republic. setvin@fzu.cz
authors: Martin
authors: M
authors: Setvín
authors: Pingo
authors: P
authors: Mutombo
authors: Martin
authors: M
authors: Ondráček
authors: Zsolt
authors: Z
authors: Majzik
authors: Martin
authors: M
authors: Švec
authors: Vladimír
authors: V
authors: Cháb
authors: Ivan
authors: I
authors: Ošt'ádal
authors: Pavel
authors: P
authors: Sobotík
authors: Pavel
authors: P
authors: Jelínek
mesh_terms: D003198:Computer Simulation; D007204:Indium / Q000737:chemistry*; D008422:Materials Testing / Q000379:methods*; D018625:Microscopy, Atomic Force / Q000379:methods*; D008956:Models, Chemical; D012825:Silicon / Q000737:chemistry*; D014001:Tin / Q000737:chemistry*
chemical_list: D007204:Indium; D014001:Tin; D012825:Silicon