title: Characterization of CdTe films deposited at various bath temperatures and concentrations using electrophoretic deposition.
abstract: CdTe film was deposited using the electrophoretic deposition technique onto an ITO glass at various bath temperatures. Four batch film compositions were used by mixing 1 to 4 wt% concentration of CdTe powder with 10 mL of a solution of methanol and toluene. X-ray Diffraction analysis showed that the films exhibited polycrystalline nature of zinc-blende structure with the (111) orientation as the most prominent peak. From the Atomic Force Microscopy, the thickness and surface roughness of the CdTe film increased with the increase of CdTe concentration. The optical energy band gap of film decreased with the increase of CdTe concentration, and with the increase of isothermal bath temperature. The film thickness increased with respect to the increase of CdTe concentration and bath temperature, and following, the numerical expression for the film thickness with respect to these two variables has been established.
authors: Department of Physics, Faculty of Science, Universiti Putra Malaysia, 43400 UPM Serdang, Selangor, Malaysia.
authors: Mohd Norizam Md
authors: MNM
authors: Daud
authors: Advanced Materials and Nanotechnology Laboratory, Institute of Advanced Technology, Universiti Putra Malaysia, 43400 UPM Serdang, Selangor, Malaysia.
authors: Azmi
authors: A
authors: Zakaria
authors: Advanced Materials and Nanotechnology Laboratory, Institute of Advanced Technology, Universiti Putra Malaysia, 43400 UPM Serdang, Selangor, Malaysia.
authors: Atefeh
authors: A
authors: Jafari
authors: Department of Physics, Faculty of Science, Universiti Putra Malaysia, 43400 UPM Serdang, Selangor, Malaysia.
authors: Mohd Sabri Mohd
authors: MSM
authors: Ghazali
authors: Advanced Materials and Nanotechnology Laboratory, Institute of Advanced Technology, Universiti Putra Malaysia, 43400 UPM Serdang, Selangor, Malaysia.
authors: Wan Rafizah Wan
authors: WRW
authors: Abdullah
authors: Department of Chemistry, Faculty of Science, Universiti Putra Malaysia, 43400 UPM Serdang, Selangor, Malaysia.
authors: Zulkarnain
authors: Z
authors: Zainal
mesh_terms: D019187:Cadmium Compounds / Q000737:chemistry*; D018625:Microscopy, Atomic Force; D013053:Spectrophotometry; D013499:Surface Properties; D013691:Tellurium / Q000737:chemistry*; D013696:Temperature; D014961:X-Ray Diffraction
chemical_list: D019187:Cadmium Compounds; D013691:Tellurium; C028337:cadmium telluride