title: Shrinkage of picosecond laser beam by plasma reflection in super-resolution near-field structure of SiN/Sb/SiN thin film.
abstract: The transmittive and reflective Z-scan technique is used with a 10 Hz, frequency doubled, Q-switched, and mode-locked Nd:YAG laser to verify that the reflectivity of the super-resolution near-field structure of an SiN/Sb/SiN thin film increases as incident intensity decreases. This intensity-dependent reflection, called nonlinear reflection, reflects a TEM(00) mode laser beam more strongly at its periphery than at its center and so shrinks the transmitted laser beam. The observed nonlinear reflection is attributed to laser-induced change of carrier densities in Sb, to justify quantitatively the experimental results.
authors: Department of Physics, National Chung Cheng University, Minhsiung, Chiayi 62102, Taiwan.
authors: Yi-Ci
authors: YC
authors: Li
authors: Huei-Ling
authors: HL
authors: Lin
authors: Po-Yuan
authors: PY
authors: Huang
authors: Li
authors: L
authors: Xin
authors: Sidney S
authors: SS
authors: Yang
authors: Jaw-Luen
authors: JL
authors: Tang
authors: Tai-Huei
authors: TH
authors: Wei