title: Residual stress evaluation near bone implant interface using synchrotron diffraction.
authors: UFR Odontologie, LACM-DTI, Reims, France. hcitterio@ufrReims.fr
authors: H
authors: H
authors: Citterio
authors: B
authors: B
authors: Mireux
authors: A
authors: A
authors: Benmarouanne
authors: T
authors: T
authors: Buslaps
authors: P
authors: P
authors: Millet
authors: A
authors: A
authors: Lodini
mesh_terms: D000539:Alveolar Process / Q000502:physiology*; D000818:Animals; D016723:Bone Remodeling / Q000502:physiology*; D015921:Dental Implants; D003799:Dental Stress Analysis; D006882:Hydroxyapatites; D016348:Osseointegration; D034561:Sheep, Domestic; D017356:Synchrotrons; D014961:X-Ray Diffraction
chemical_list: D015921:Dental Implants; D006882:Hydroxyapatites