Direct correlation between electric and structural properties during solidification of poly(3-hexylthiophene) drop-cast films.
Structural and electrical properties of semicrystalline P3HT cast films onto Si/SiO(2)  surface are studied during the solidification under applied electric field in lateral OFET geometry. During evaporation of the solvent, the formation of P3HT crystallites is monitored simultaneously by time-resolved X-ray diffraction and by source-drain current measurements. The electrical current is reaching its maximum in two pronounced regimes already before complete solidification of the polymer as detected by X-ray diffraction intensities. The monitored complex time dependence of current and X-ray intensities reveals a highest conducting level for the gel-like state.
Department Physik, Universität Siegen, Walter-Flex-Straße 3, Siegen, Germany. grodd@physik.uni-siegen.de
Linda
L
Grodd
Ullrich
U
Pietsch
Souren
S
Grigorian
D003460:Crystallization; D004553:Electric Conductivity; D049329:Nanostructures / Q000737:chemistry; D012822:Silicon Dioxide / Q000737:chemistry; D013876:Thiophenes / Q000737:chemistry*; D014961:X-Ray Diffraction
D013876:Thiophenes; C507295:poly(3-hexylthiophene); D012822:Silicon Dioxide