Imaging the surface stress and vibration modes of a microcantilever by laser beam deflection microscopy.
There is a need for noninvasive techniques for simultaneous imaging of the stress and vibration mode shapes of nanomechanical systems in the fields of scanning probe microscopy, nanomechanical biological and chemical sensors and the semiconductor industry. Here we show a novel technique that combines a scanning laser, the beam deflection method and digital multifrequency excitation and analysis for simultaneous imaging of the static out-of-plane displacement and the shape of five vibration modes of nanomechanical systems. The out-of-plane resolution is at least 100 pm Hz⁻¹/² and the lateral resolution, which is determined by the laser spot size, is 1-1.5 μm. The capability of the technique is demonstrated by imaging the residual surface stress of a microcantilever together with the shape of the first 22 vibration modes. The vibration behavior is compared with rigorous finite element simulations. The technique is suitable for major improvements in the imaging of liquids, such as higher bandwidth and enhanced spatial resolution.
Instituto de Microlectrónica de Madrid-IMM, CSIC, Isaac Newton 8-PTM, Tres Cantos, 28760 Madrid, Spain. jtamayo@imm.cnm.csic.es
Javier
J
Tamayo
Valerio
V
Pini
Prisicila
P
Kosaka
Nicolas F
NF
Martinez
Oscar
O
Ahumada
Montserrat
M
Calleja
D015374:Biosensing Techniques / Q000295:instrumentation / Q000379:methods; D004563:Electrochemistry / Q000295:instrumentation / Q000379:methods; D020342:Finite Element Analysis; D007834:Lasers; D018613:Microscopy, Confocal / Q000295:instrumentation* / Q000379:methods; D020527:Microscopy, Scanning Probe / Q000295:instrumentation* / Q000379:methods; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods; D012666:Semiconductors / Q000295:instrumentation; D013499:Surface Properties / Q000528:radiation effects; D014732:Vibration