title: Selected-area diffraction and spectroscopy in LEEM and PEEM.
abstract: This paper addresses the effects of spherical and chromatic aberration of the objective lens, as well as chromatic dispersion of magnetic prism arrays, on the ability to perform selected area Low Energy Electron Diffraction, as well as (Angle Resolved) Photo Electron Spectroscopy experiments in today's advanced cathode lens microscopy instruments.
authors: IBM Research Division, T.J. Watson Research Center, 1101 Kitchawan Road, P.O. Box 218, Yorktown Heights, NY 10598, USA. rtromp@us.ibm.com
authors: R M
authors: RM
authors: Tromp