title: Crystallization of Au-Si/glass thin film: a real-time synchrotron X-ray scattering study.
abstract: The crystallization of amorphous, Si-rich, Au28Si72/glass thin film was studied in real-time synchrotron X-ray scattering experiments. The amorphous film crystallizes first into Au and Si phases at a low temperature of 206 degrees C. At annealing temperatures above eutectic temperature (T(E) = 360 degrees C), the Au phase melts while the Si phase rapidly grows further. The crystallized Au28Si72 thin film has nanowire-type grains with 1000-nm-length and 10-nm-diameter. We confirm that the Au liquid phase contributes to the low-temperature crystallization of the Si solid phase for Si-nanowire growth.
authors: Department of Nano Materials Engineering, Kyungpook National University, Sangju 742-711, Republic of Korea.
authors: Tae-Sik
authors: TS
authors: Cho
authors: Jin-Woo
authors: JW
authors: Kim