title: Fatigue-free, electrically reliable copper electrode with nanohole array.
abstract: Design and fabrication of reliable electrodes is one of the most important challenges in flexible devices, which undergo repeated deformation. In conventional approaches, mechanical and electrical properties of continuous metal films degrade gradually because of the fatigue damage. The designed incorporation of nanoholes into Cu electrodes can enhance the reliability. In this study, the electrode shows extremely low electrical resistance change during bending fatigue because the nanoholes suppress crack initiation by preventing protrusion formation and damage propagation by crack tip blunting. This concept provides a key guideline for developing fatigue-free flexible electrodes.
authors: Department of Materials Science and Engineering, Seoul National University, Seoul, 151744, Republic of Korea.
authors: Byoung-Joon
authors: BJ
authors: Kim
authors: Yigil
authors: Y
authors: Cho
authors: Min-Suk
authors: MS
authors: Jung
authors: Hae-A-Seul
authors: HA
authors: Shin
authors: Myoung-Woon
authors: MW
authors: Moon
authors: Heung Nam
authors: HN
authors: Han
authors: Ki Tae
authors: KT
authors: Nam
authors: Young-Chang
authors: YC
authors: Joo
authors: In-Suk
authors: IS
authors: Choi