title: Simultaneous determination of thickness and refractive index based on time-of-flight measurements of terahertz pulse.
abstract: We present a simple technique for simultaneous determination of thickness and refractive index of plane-parallel samples in the terahertz radiation domain. The technique uses time-of-flight measurements of the terahertz pulse. It has been employed on nine different polymers and semiconductor materials, which are transparent for terahertz frequencies. Our results of thickness measurement are in good agreement with micrometer reading. The accuracy in the determination of refractive index is on the order of two decimal points.
authors.affiliation: National Institute of Lasers and Optronics, Nilore, Islamabad, Pakistan. babarhussain2002@hotmail.com
authors.forename: Babar
authors.initials: B
authors.lastname: Hussain
authors.forename: Mushtaq
authors.initials: M
authors.lastname: Ahmed
authors.forename: M
authors.initials: M
authors.lastname: Nawaz
authors.forename: M
authors.initials: M
authors.lastname: Saleem
authors.forename: M
authors.initials: M
authors.lastname: Razzaq
authors.forename: M
authors.initials: M
authors.lastname: Aslam Zia
authors.forename: M
authors.initials: M
authors.lastname: Iqbal