title: A multi-detector, digitizer based neutron depth profiling device for characterizing thin film materials.
abstract: Neutron depth profiling (NDP) is a mature, nondestructive technique used to characterize the concentration of certain light isotopes in a material as a function of depth by measuring the residual energy of charged particles in neutron induced reactions. Historically, NDP has been performed using a single detector, resulting in low intrinsic detection efficiency, and limiting the technique largely to high flux research reactors. In this work, we describe a new NDP instrument design with higher detection efficiency by way of spectrum summing across multiple detectors. Such a design is capable of acquiring a statistically significant charged particle spectrum at facilities limited in neutron flux and operation time.
authors.affiliation: Nuclear Engineering Program, Department of Mechanical and Aerospace Engineering, The Ohio State University, Columbus, Ohio 43210, USA.
authors.forename: P L
authors.initials: PL
authors.lastname: Mulligan
authors.forename: L R
authors.initials: LR
authors.lastname: Cao
authors.forename: D
authors.initials: D
authors.lastname: Turkoglu