title: A multi-crystal wavelength dispersive x-ray spectrometer.
abstract: A multi-crystal wavelength dispersive hard x-ray spectrometer with high-energy resolution and large solid angle collection is described. The instrument is specifically designed for time-resolved applications of x-ray emission spectroscopy (XES) and x-ray Raman scattering (XRS) at X-ray Free Electron Lasers (XFEL) and synchrotron radiation facilities. It also simplifies resonant inelastic x-ray scattering (RIXS) studies of the whole 2d RIXS plane. The spectrometer is based on the Von Hamos geometry. This dispersive setup enables an XES or XRS spectrum to be measured in a single-shot mode, overcoming the scanning needs of the Rowland circle spectrometers. In conjunction with the XFEL temporal profile and high-flux, it is a powerful tool for studying the dynamics of time-dependent systems. Photo-induced processes and fast catalytic reaction kinetics, ranging from femtoseconds to milliseconds, will be resolvable in a wide array of systems circumventing radiation damage.
authors.affiliation: LCLS, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA.
authors.forename: Roberto
authors.initials: R
authors.lastname: Alonso-Mori
authors.forename: Jan
authors.initials: J
authors.lastname: Kern
authors.forename: Dimosthenis
authors.initials: D
authors.lastname: Sokaras
authors.forename: Tsu-Chien
authors.initials: TC
authors.lastname: Weng
authors.forename: Dennis
authors.initials: D
authors.lastname: Nordlund
authors.forename: Rosalie
authors.initials: R
authors.lastname: Tran
authors.forename: Paul
authors.initials: P
authors.lastname: Montanez
authors.forename: James
authors.initials: J
authors.lastname: Delor
authors.forename: Vittal K
authors.initials: VK
authors.lastname: Yachandra
authors.forename: Junko
authors.initials: J
authors.lastname: Yano
authors.forename: Uwe
authors.initials: U
authors.lastname: Bergmann
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D056951:Photoelectron Spectroscopy / Q000295:instrumentation*; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation*; D013059:Spectrum Analysis, Raman / Q000295:instrumentation*; D014159:Transducers