title: Discrimination of field components in optical probe microscopy.
abstract: We demonstrate that the conventional optical signal in near-field scanning optical microscopy and the optical force induced topography contain complementary information about the complex three-dimensional field distribution. Crucially, the additional information about the field distribution can be retrieved without increasing the measurement complexity.
authors.affiliation: CREOL, College of Optics and Photonics, University of Central Florida, Orlando, Florida 32816, USA.
authors.forename: D C
authors.initials: DC
authors.lastname: Kohlgraf-Owens
authors.forename: S
authors.initials: S
authors.lastname: Sukhov
authors.forename: A
authors.initials: A
authors.lastname: Dogariu