title: A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results.
abstract: In Part I we described a new design for an aberration-corrected Low Energy Electron Microscope (LEEM) and Photo Electron Emission Microscope (PEEM) equipped with an in-line electron energy filter. The chromatic and spherical aberrations of the objective lens are corrected with an electrostatic electron mirror that provides independent control of the chromatic and spherical aberration coefficients Cc and C3, as well as the mirror focal length. In this Part II we discuss details of microscope operation, how the microscope is set up in a systematic fashion, and we present typical results.
authors.affiliation: IBM T.J. Watson Research Center, 1101 Kitchawan Road, P.O. Box 218, Yorktown Heights, NY 10598, USA. rtromp@us.ibm.com
authors.forename: R M
authors.initials: RM
authors.lastname: Tromp
authors.forename: J B
authors.initials: JB
authors.lastname: Hannon
authors.forename: W
authors.initials: W
authors.lastname: Wan
authors.forename: A
authors.initials: A
authors.lastname: Berghaus
authors.forename: O
authors.initials: O
authors.lastname: Schaff