title: Extended depth of focus for transmission x-ray microscope.
abstract: A fast discrete curvelet transform based focus-stacking algorithm for extending the depth of focus of a transmission x-ray microscope (TXM) is presented. By analyzing an image stack of a sample taken in a Z-scan, a fully in-focus image can be generated by the proposed scheme. With the extended depth of focus, it is possible to obtain 3D structural information over a large volume at nanometer resolution. The focus-stacking method has been demonstrated using a dataset taken with a laboratory x-ray source based TXM system. The possibility and limitations of generalizing this method to a synchrotron based TXM are also discussed. We expect the proposed method to be of important impact in 3D x-ray microscopy.
authors.affiliation: Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA. liuyijin@slac.stanford.edu
authors.forename: Yijin
authors.initials: Y
authors.lastname: Liu
authors.forename: Junyue
authors.initials: J
authors.lastname: Wang
authors.forename: Youli
authors.initials: Y
authors.lastname: Hong
authors.forename: Zhili
authors.initials: Z
authors.lastname: Wang
authors.forename: Kai
authors.initials: K
authors.lastname: Zhang
authors.forename: Phillip A
authors.initials: PA
authors.lastname: Williams
authors.forename: Peiping
authors.initials: P
authors.lastname: Zhu
authors.forename: Joy C
authors.initials: JC
authors.lastname: Andrews
authors.forename: Piero
authors.initials: P
authors.lastname: Pianetta
authors.forename: Ziyu
authors.initials: Z
authors.lastname: Wu
mesh_terms: D000465:Algorithms; D008853:Microscopy / Q000379:methods*; D055620:Optical Phenomena; D014965:X-Rays