title: Influence of the nitrogen content on the optical properties of CNx films.
abstract: Polycrystalline carbon nitride thin films were prepared by electrolysis of methanol-urea solution at different concentrations of urea to methanol and applied voltage 800 volts for 10h. Grazing incidence X-ray diffraction (GIXRD) revealed that the crystalline structure of carbon nitride films at moderate nitrogen content changed from amorphous phase to polycrystalline α-C(3)N(4), and β-C(3)N(4) phases. The optical transmission analysis of the films revealed that the band gap value for indirect allowed transitions increased with increasing nitrogen content, while the associated phonon energy value showed the opposite behavior. The refractive index and the extinction coefficient of the samples deposited with different concentrations were determined as a function of wavelength. The refractive index decreases with increasing both nitrogen content and crystallinity. The refractive index dispersion for the investigated samples is discussed in terms of the single oscillator model and oscillator parameters.
authors.affiliation: Faculty of Science, Physics Department, Cairo University, Giza, Egypt.
authors.forename: F H
authors.initials: FH
authors.lastname: Abd El-Kader
authors.forename: M A
authors.initials: MA
authors.lastname: Moharram
authors.forename: M G
authors.initials: MG
authors.lastname: Khafagia
authors.forename: Fathia
authors.initials: F
authors.lastname: Mamdouh
mesh_terms: D000042:Absorption; D004560:Electricity; D008956:Models, Chemical; D009570:Nitriles / Q000737:chemistry*; D009584:Nitrogen / Q000737:chemistry*; D055620:Optical Phenomena; D017785:Photons; D012031:Refractometry; D013056:Spectrophotometry, Ultraviolet; D019265:Spectroscopy, Near-Infrared; D014961:X-Ray Diffraction
chemical_list: D009570:Nitriles; C011206:cyanogen; D009584:Nitrogen