title: Dark field photoelectron emission microscopy of micron scale few layer graphene.
abstract: We demonstrate dark field imaging in photoelectron emission microscopy (PEEM) of heterogeneous few layer graphene (FLG) furnace grown on SiC(000-1). Energy-filtered, threshold PEEM is used to locate distinct zones of FLG graphene. In each region, selected by a field aperture, the k-space information is imaged using appropriate transfer optics. By selecting the photoelectron intensity at a given wave vector and using the inverse transfer optics, dark field PEEM gives a spatial distribution of the angular photoelectron emission. In the results presented here, the wave vector coordinates of the Dirac cones characteristic of commensurate rotations of FLG on SiC(000-1) are selected providing a map of the commensurate rotations across the surface. This special type of contrast is therefore a method to map the spatial distribution of the local band structure and offers a new laboratory tool for the characterisation of technically relevant, microscopically structured matter.
authors.affiliation: IRAMIS/SPCSI/LENSIS, F-91191 Gif-sur-Yvette, France. nick.barrett@cea.fr
authors.forename: N
authors.initials: N
authors.lastname: Barrett
authors.forename: E
authors.initials: E
authors.lastname: Conrad
authors.forename: K
authors.initials: K
authors.lastname: Winkler
authors.forename: B
authors.initials: B
authors.lastname: Krömker