title: Improving the signal-to-noise ratio of high-speed contact mode atomic force microscopy.
abstract: During high-speed contact mode atomic force microscopy, higher eigenmode flexural oscillations of the cantilever have been identified as the main source of noise in the resultant topography images. We show that by selectively filtering out the frequencies corresponding to these oscillations in the time domain prior to transforming the data into the spatial domain, significant improvements in image quality can be achieved.
authors.affiliation: University of Bristol, H. H. Wills Physics Laboratory, Tyndall Avenue, Bristol, BS8 1TL, United Kingdom. oliverdpayton@gmail.com
authors.forename: O D
authors.initials: OD
authors.lastname: Payton
authors.forename: L
authors.initials: L
authors.lastname: Picco
authors.forename: M J
authors.initials: MJ
authors.lastname: Miles
authors.forename: M E
authors.initials: ME
authors.lastname: Homer
authors.forename: A R
authors.initials: AR
authors.lastname: Champneys