title: Introduction to the IEEE International Symposium on Applications of Ferroelectrics and International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials.
abstract: The 20th IEEE International Symposium on Applications of Ferroelectrics (ISAF) was held on July 24-27, 2011, in Vancouver, British Columbia, Canada, jointly with the International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (PFM). Over a period of four days, approximately 400 scientists, engineers, and students from around the world presented their work and discussed the latest developments in the field of ferroelectrics, related materials, and their applications. It is particularly encouraging to see that a large number of students (115) were attracted to the joint conference and presented high-quality research works. This trend is not only important to this conference series, but more importantly, it is vital to the future of the ferroelectrics field.
authors.forename: Zuo-Guang
authors.initials: ZG
authors.lastname: Ye
authors.forename: Xiaoli
authors.initials: X
authors.lastname: Tan
authors.forename: Alexei A
authors.initials: AA
authors.lastname: Bokov
mesh_terms: D055590:Electromagnetic Phenomena; D004581:Electronics / Q000379:methods*; D018625:Microscopy, Atomic Force / Q000379:methods*; D036103:Nanotechnology / Q000379:methods*