title: Exposed versus buried wires for fixation of lateral humeral condyle fractures in children: a comparison of safety and efficacy.
abstract: BACKGROUND
  Displaced fractures of the lateral condyle of the humerus are usually treated with open reduction and fixation with smooth Kirschner wires. These may be passed through the skin and left exposed or buried subcutaneously. Exposed wires may be removed in the outpatient clinic, whereas buried wires require a formal procedure under anaesthesia. This advantage may be offset if there is a higher rate of complications with exposed wires. The aim of this study was to compare the safety and efficacy of exposed and buried wires.
  
  
  METHODS
  Retrospective cohort.
  
  
  METHODS
  Children with lateral condyle fractures of the humerus who had undergone surgery were identified from our departmental database. Case records and X-rays of 75 patients were reviewed.
  
  
  RESULTS
  Forty-two patients had buried wires and 33 had exposed wires. There were no serious complications in either group. In the exposed wires group, 1 patient had a superficial wound infection that was treated effectively with 1 week of oral antibiotics, while 2 patients had hypergranulation of pin tracts treated with topical silver nitrate. None of the patients showed loss of reduction, deep infection, or any other complications requiring additional procedures.
  
  
  CONCLUSIONS
  There was no statistically significant difference in the rate of complications between the buried and exposed groups. We conclude that open reduction and exposed wiring is a safe and effective option for lateral condyle fractures, and recommend a period of 4 weeks of K-wire fixation followed by 2 weeks of backslab immobilisation as adequate for union with minimal risk of infection.
authors.affiliation: Department of Orthopaedics, KK Women's and Children's Hospital, Singapore, 229899 Singapore.
authors.forename: Lester Wai Mon
authors.initials: LW
authors.lastname: Chan
authors.forename: Hua Ming
authors.initials: HM
authors.lastname: Siow