title: Method to map individual electromagnetic field components inside a photonic crystal.
abstract: We present a method to map the absolute electromagnetic field strength inside photonic crystals. We apply the method to map the dominant electric field component Ez of a two-dimensional photonic crystal slab at microwave frequencies. The slab is placed between two mirrors to select Bloch standing waves and a subwavelength spherical scatterer is scanned inside the resulting resonator. The resonant Bloch frequencies shift depending on the electric field at the position of the scatterer. To map the electric field component Ez we measure the frequency shift in the reflection and transmission spectrum of the slab versus the scatterer position. Very good agreement is found between measurements and calculations without any adjustable parameters.
authors.affiliation: Laser Physics and Nonlinear Optics, MESA+ Institute for Nanotechnology, University of Twente, PO Box 217, 7500 AE Enschede, The Netherlands. t.denis@utwente.nl
authors.forename: T
authors.initials: T
authors.lastname: Denis
authors.forename: B
authors.initials: B
authors.lastname: Reijnders
authors.forename: J H H
authors.initials: JH
authors.lastname: Lee
authors.forename: P J M
authors.initials: PJ
authors.lastname: van der Slot
authors.forename: W L
authors.initials: WL
authors.lastname: Vos
authors.forename: K-J
authors.initials: KJ
authors.lastname: Boller
mesh_terms: D017076:Computer-Aided Design; D003460:Crystallization; D004574:Electromagnetic Fields; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007909:Lenses; D017785:Photons; D011874:Radiometry / Q000295:instrumentation* / Q000379:methods*