title: Processing method of spectral measurement using F-P etalon and ICCD.
abstract: A processing method for the precise acquisition of 1D interference spectrum from the 2D Fabry-Pérot(F-P) fringe pattern is proposed in the paper. Current methods can only measure the spectrum with full-pixel accuracy. The new method is capable to achieve the sub-pixel accuracy as well as reduce the noise by taking full advantage of the 2D image information and analyzing the statistical values of pixels in a comprehensive way. Experimental results show that the accuracy of the measured Brillouin shift and linewidth is around several MHzs, which is significantly improved compared to methods with full-pixel accuracy.
authors.affiliation: Department of Electronics and Information Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
authors.forename: Jun
authors.initials: J
authors.lastname: Huang
authors.forename: Yong
authors.initials: Y
authors.lastname: Ma
authors.forename: Bo
authors.initials: B
authors.lastname: Zhou
authors.forename: Hao
authors.initials: H
authors.lastname: Li
authors.forename: Yin
authors.initials: Y
authors.lastname: Yu
authors.forename: Kun
authors.initials: K
authors.lastname: Liang
mesh_terms: D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D012031:Refractometry / Q000295:instrumentation* / Q000379:methods*; D013057:Spectrum Analysis / Q000295:instrumentation* / Q000379:methods*