title: Reflection-mode, confocal, tip-enhanced Raman spectroscopy system for scanning chemical microscopy of surfaces.
abstract: A reflection-mode, confocal, tip-enhanced Raman spectroscopy system for nanoscale chemical imaging of surfaces is presented. The instrument is based on a beam-bounce atomic force microscope with a side-on Raman microscope with true confocal light illumination and collection. Localized vibrational (Raman) spectroscopy is demonstrated at length scales down to 20 nm on opaque samples. The design and validation of the instrument are discussed with quantitative emphasis on confocal microscope operation, plasmonic properties of the tip, point spectroscopy, and Raman imaging of SiGe nanowires.
authors.affiliation: Department of Chemical Engineering, University of California Santa Barbara, Santa Barbara, California 93106-5080, USA.
authors.forename: R
authors.initials: R
authors.lastname: Ramos
authors.forename: M J
authors.initials: MJ
authors.lastname: Gordon