title: Ultra-compact, high-Q silicon microdisk reflectors.
abstract: We demonstrate wavelength-selective reflectors based on silicon microdisk resonators integrated with compact Y-branch splitters, using a CMOS-photonics technology. A high quality factor (Q) of ~ 88,000 was measured in the reflection spectrum for a 2.5-μm-radius device with a small footprint of 6 × 17 μm(2) and a wide free-spectral range (FSR) of over 41 nm. As the radius is reduced to 1.5 μm, corresponding to a device footprint of 4 × 15 μm(2), the spectrum shows an ultra-wide FSR of over 71 nm with the compromise of having a reduced Q of ~ 4000. The coupling between a microdisk and a waveguide is numerically investigated. We further propose a multichannel sensing system using cascaded microdisk reflectors.
authors.affiliation: Department of Electrical and Computer Engineering, the University of British Columbia, Vancouver, BC, Canada. weis@ece.ubc.ca
authors.forename: Wei
authors.initials: W
authors.lastname: Shi
authors.forename: Han
authors.initials: H
authors.lastname: Yun
authors.forename: Wen
authors.initials: W
authors.lastname: Zhang
authors.forename: Charlie
authors.initials: C
authors.lastname: Lin
authors.forename: Ting Kai
authors.initials: TK
authors.lastname: Chang
authors.forename: Yun
authors.initials: Y
authors.lastname: Wang
authors.forename: Nicolas A F
authors.initials: NA
authors.lastname: Jaeger
authors.forename: Lukas
authors.initials: L
authors.lastname: Chrostowski
mesh_terms: D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007909:Lenses; D008904:Miniaturization; D012031:Refractometry / Q000295:instrumentation*; D012825:Silicon / Q000737:chemistry* / Q000528:radiation effects*; D020349:Surface Plasmon Resonance / Q000295:instrumentation*
chemical_list: D012825:Silicon