Terahertz detection using spectral domain interferometry.
In this work, we present a novel method based on spectral domain interferometry for the electro-optic (EO) sampling of terahertz (THz) electric fields. This technique allows the use of thick crystals without the drawback of the over-rotation that may occur with intense THz sources, allowing longer temporal scans and thus, better spectral resolution. Using this technique, a phase difference of approximately 8898π can be measured, which is 18,000 times larger than the phase difference that could be measured using EO sampling.
Advanced Laser Light Source, Institut National de la Recherche Scientifique, Énergie, Matériaux et Télécommunications, 1650 Boul. Lionel-Boulet, Varennes, Québec J3X 1S2, Canada.
Gargi
G
Sharma
Kanwarpal
K
Singh
Ibraheem
I
Al-Naib
Roberto
R
Morandotti
Tsuneyuki
T
Ozaki