Precision increase with two orthogonal analyzers in polarization-resolved second-harmonic generation microscopy.
We analyze the increase in precision of parameters estimation for polarization-resolved second-harmonic generation imaging microscopy when two intensities are measured with two orthogonal analyzers. The analysis is performed for measuring anisotropy parameters and molecule orientation for samples with cylindrical symmetry in the presence of photon noise with Poisson statistics. The improvement in comparison to global intensity measurement (i.e., without analyzer) is discussed.
Centrale Marseille, CNRS, Aix-Marseille Université, FRESNEL, UMR 7249, Marseille 13013, France.
Philippe
P
Réfrégier
Muriel
M
Roche
Julien
J
Duboisset
Sophie
S
Brasselet
D007091:Image Processing, Computer-Assisted / Q000379:methods*; D008853:Microscopy / Q000379:methods*; D017785:Photons; D016012:Poisson Distribution