Small-angle electron scattering from magnetic artificial lattice.
In this study, quantitative reciprocal-space analyses of magnetic domain structures in magnetic artificial lattices of patterned elements were performed by means of the small-angle electron scattering (SAES) technique. Using a conventional transmission electron microscope with a LaB(6) thermal-emission electron gun, Lorentz deflection due to magnetic moments in patterned elements and Bragg diffraction due to the lattice periodicity are simultaneously recorded at an angle of the order of less than 1 10(-)(6) rad when using electron waves with high spatial coherency and large camera length. The present SAES technique together with TEM real-space imaging methods such as Lorentz microscopy will be useful in analyzing electromagnetic fields in nano-scaled materials.
Nanoscience and Nanotechnology Research Center (N2RC), Research Institutes for the Twenty First Century, Osaka Prefecture University, Gakuencho 1-2, Sakai, Osaka, Japan.
Kazuya
K
Takayanagi
Tsukasa
T
Koyama
Shigeo
S
Mori
Ken
K
Harada
Yoshihiko
Y
Togawa