title: Selecting EEG components using time series analysis in brain death diagnosis.
abstract: In diagnosis of brain death for human organ transplant, EEG (electroencephalogram) must be flat to conclude the patient's brain death but it has been reported that the flat EEG test is sometimes difficult due to artifacts such as the contamination from the power supply and ECG (electrocardiogram, the signal from the heartbeat). ICA (independent component analysis) is an effective signal processing method that can separate such artifacts from the EEG signals. Applying ICA to EEG channels, we obtain several separated components among which some correspond to the brain activities while others contain artifacts. This paper aims at automatic selection of the separated components based on time series analysis. In the flat EEG test in brain death diagnosis, such automatic component selection is helpful.
authors.affiliation: Department of Business Administration, Asia University, Tokyo, 180-8629 Japan  ; Lab. for Advanced Brain Signal Processing, BSI, RIKEN, Saitama, 351-0198 Japan.
authors.forename: Gen
authors.initials: G
authors.lastname: Hori
authors.forename: Jianting
authors.initials: J
authors.lastname: Cao
keywords: Brain death diagnosis; Independent component analysis; Signal processing; Time series analysis; Wayland test