title: Development and application of integrated optical sensors for intense E-field measurement.
abstract: The measurement of intense E-fields is a fundamental need in various research areas. Integrated optical E-field sensors (IOESs) have important advantages and are potentially suitable for intense E-field detection. This paper comprehensively reviews the development and applications of several types of IOESs over the last 30 years, including the Mach-Zehnder interferometer (MZI), coupler interferometer (CI) and common path interferometer (CPI). The features of the different types of IOESs are compared, showing that the MZI has higher sensitivity, the CI has a controllable optical bias, and the CPI has better temperature stability. More specifically, the improvement work of applying IOESs to intense E-field measurement is illustrated. Finally, typical uses of IOESs in the measurement of intense E-fields are demonstrated, including application areas such as E-fields with different frequency ranges in high-voltage engineering, simulated nuclear electromagnetic pulse in high-power electromagnetic pulses, and ion-accelerating field in high-energy physics.
authors.affiliation: State Key Lab of Power Systems, Department of Electrical Engineering, Tsinghua University, Beijing 100084, China. zengrong@tsinghua.edu.cn
authors.forename: Rong
authors.initials: R
authors.lastname: Zeng
authors.forename: Bo
authors.initials: B
authors.lastname: Wang
authors.forename: Ben
authors.initials: B
authors.lastname: Niu
authors.forename: Zhanqing
authors.initials: Z
authors.lastname: Yu
keywords: E-field sensor; Pockels effect; electric field; integrated optics