title: Complete polarization analysis of an APPLE II undulator using a soft X-ray polarimeter.
abstract: Two APPLE II undulators installed on the Diamond I10 beamline have all four magnet arrays shiftable and thus can generate linear polarization at any arbitrary angle from 0° to 180°, as well as all other states of elliptical polarization. To characterize the emitted radiation polarization state from one APPLE II undulator, the complete polarization measurement was performed using a multilayer-based soft X-ray polarimeter. The measurement results appear to show that the linear polarization angle offset is about 6° compared with other measurements at 712 eV, equivalent to an undulator jaw phase offset of 1.1 mm. In addition, the polarization states of various ellipticities have also been measured as a function of the undulator row phase.
authors.affiliation: Diamond Light Source, Didcot, UK. hongchang.wang@diamond.ac.uk
authors.forename: Hongchang
authors.initials: H
authors.lastname: Wang
authors.forename: Peter
authors.initials: P
authors.lastname: Bencok
authors.forename: Paul
authors.initials: P
authors.lastname: Steadman
authors.forename: Emily
authors.initials: E
authors.lastname: Longhi
authors.forename: Jingtao
authors.initials: J
authors.lastname: Zhu
authors.forename: Zhanshan
authors.initials: Z
authors.lastname: Wang