title: Near-field self-induced hollow spot through localized heating of polycarbonate/ZnS stack layer.
abstract: We have found an alternative way of achieving a doughnutlike focused spot by simply melting a subwavelength scatterer in a polycarbonate/ZnS sample. The near-field microscopy technique is used to directly measure the induced doughnut spot in the near-field regime. A numerical model based on rigorous solution of the Maxwell's equations is proposed to study the phenomena. The simulations help to understand the optical mechanism behind the spot formation.
authors.affiliation: Optics Research Group, Department of Imaging Science and Technology, Delft University of Technology, The Netherlands. a.dacostaassafrao@tudelft.nl
authors.forename: Alberto da Costa
authors.initials: Ada C
authors.lastname: Assafrao
authors.forename: Arthur J H
authors.initials: AJ
authors.lastname: Wachters
authors.forename: Silvania F
authors.initials: SF
authors.lastname: Pereira
authors.forename: H Paul
authors.initials: HP
authors.lastname: Urbach