title: Optimum aberration coefficients for recording high-resolution off-axis holograms in a Cs-corrected TEM.
abstract: Amongst the impressive improvements in high-resolution electron microscopy, the Cs-corrector also has significantly enhanced the capabilities of off-axis electron holography. Recently, it has been shown that the signal above noise in the reconstructable phase can be significantly improved by combining holography and hardware aberration correction. Additionally, with a spherical aberration close to zero, the traditional optimum focus for recording high-resolution holograms ("Lichte's defocus") has become less stringent and both, defocus and spherical aberration, can be selected freely within a certain range. This new degree of freedom can be used to improve the signal resolution in the holographically reconstructed object wave locally, e.g. at the atomic positions. A brute force simulation study for an aberration corrected 200 kV TEM is performed to determine optimum values for defocus and spherical aberration for best possible signal to noise in the reconstructed atomic phase signals. Compared to the optimum aberrations for conventional phase contrast imaging (NCSI), which produce "bright atoms" in the image intensity, the resulting optimum values of defocus and spherical aberration for off-axis holography enable "black atom contrast" in the hologram. However, they can significantly enhance the local signal resolution at the atomic positions. At the same time, the benefits of hardware aberration correction for high-resolution off-axis holography are preserved. It turns out that the optimum is depending on the object and its thickness and therefore not universal.
authors.affiliation: CEOS GmbH, Englerstr. 28, D-69126 Heidelberg, Germany. linck@ceos-gmbh.de
authors.forename: Martin
authors.initials: M
authors.lastname: Linck
mesh_terms: D004583:Electrons; D006696:Holography / Q000379:methods*; D008854:Microscopy, Electron / Q000379:methods*; D059629:Signal-To-Noise Ratio