title: Full tip imaging in atom probe tomography.
abstract: Atom probe tomography (APT) is capable of simultaneously revealing the chemical identities and three dimensional positions of individual atoms within a needle-shaped specimen, but suffers from a limited field-of-view (FOV), i.e., only the core of the specimen is effectively detected. Therefore, the capacity to analyze the full tip is crucial and much desired in cases that the shell of the specimen is also the region of interest. In this paper, we demonstrate that, in the analysis of III-V nanowires epitaxially grown from a substrate, the presence of the flat substrate positioned only micrometers away from the analyzed tip apex alters the field distribution and ion trajectories, which provides extra image compression that allows for the analysis of the entire specimen. An array of experimental results, including field desorption maps, elemental distributions, and crystallographic features clearly demonstrate the fact that the whole tip has been imaged, which is confirmed by electrostatic simulations.
authors.affiliation: School of Physics, The University of Sydney, NSW 2006, Australia.
authors.forename: Sichao
authors.initials: S
authors.lastname: Du
authors.forename: Timothy
authors.initials: T
authors.lastname: Burgess
authors.forename: Shyeh Tjing
authors.initials: ST
authors.lastname: Loi
authors.forename: Baptiste
authors.initials: B
authors.lastname: Gault
authors.forename: Qiang
authors.initials: Q
authors.lastname: Gao
authors.forename: Peite
authors.initials: P
authors.lastname: Bao
authors.forename: Li
authors.initials: L
authors.lastname: Li
authors.forename: Xiangyuan
authors.initials: X
authors.lastname: Cui
authors.forename: Wai
authors.initials: W
authors.lastname: Kong Yeoh
authors.forename: Hark Hoe
authors.initials: HH
authors.lastname: Tan
authors.forename: Chennupati
authors.initials: C
authors.lastname: Jagadish
authors.forename: Simon P
authors.initials: SP
authors.lastname: Ringer
authors.forename: Rongkun
authors.initials: R
authors.lastname: Zheng
mesh_terms: D003198:Computer Simulation; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D014054:Tomography / Q000379:methods*