title: X-ray luminescence based spectrometer for investigation of scintillation properties.
abstract: A new x-ray luminescence based spectrometer was developed and installed to examine the scintillation properties of materials while revealing the origins of luminescence and investigating trapping defects. Measurements were performed on a number of undoped and Ce doped yttrium aluminum garnet crystals and various luminescence centers were characterized. The measured x-ray luminescence spectra provide information about the spectral range and the scintillation efficiency and linearity. The efficiency of charge-carriers production due to x ray, their energy transfer to the luminescence centers, and the efficiency of luminescence are all reflected in the efficiency of x-ray luminescence.
authors.affiliation: Department of Physics and Astronomy, Washington State University, Pullman, Washington 99164-2814, USA.
authors.forename: C R
authors.initials: CR
authors.lastname: Varney
authors.forename: M A
authors.initials: MA
authors.lastname: Khamehchi
authors.forename: Jianfeng
authors.initials: J
authors.lastname: Ji
authors.forename: F A
authors.initials: FA
authors.lastname: Selim