title: Materials analysis and particle probe: a compact diagnostic system for in situ analysis of plasma-facing components (invited).
abstract: The objective of the materials analysis particle probe (MAPP) in NSTX is to enable prompt and direct analysis of plasma-facing components exposed to plasma discharges. MAPP allows multiple samples to be introduced to the level of the plasma-facing surface without breaking vacuum and analyzed using X-ray photoelectron spectroscopy (XPS), ion-scattering and direct recoil spectroscopy, and thermal desorption spectroscopy (TDS) immediately following the plasma discharge. MAPP is designed to operate as a diagnostic within the ∼12 min NSTX minimum between-shot time window to reveal fundamental plasma-surface interactions. Initial calibration demonstrates MAPP's XPS and TDS capabilities.
authors.affiliation: School of Nuclear Engineering, Purdue University, West Lafayette, Indiana 47907, USA.
authors.forename: C N
authors.initials: CN
authors.lastname: Taylor
authors.forename: B
authors.initials: B
authors.lastname: Heim
authors.forename: S
authors.initials: S
authors.lastname: Gonderman
authors.forename: J P
authors.initials: JP
authors.lastname: Allain
authors.forename: Z
authors.initials: Z
authors.lastname: Yang
authors.forename: R
authors.initials: R
authors.lastname: Kaita
authors.forename: A L
authors.initials: AL
authors.lastname: Roquemore
authors.forename: C H
authors.initials: CH
authors.lastname: Skinner
authors.forename: R A
authors.initials: RA
authors.lastname: Ellis