title: Compact "diode-based" multi-energy soft x-ray diagnostic for NSTX.
abstract: A novel and compact, diode-based, multi-energy soft x-ray (ME-SXR) diagnostic has been developed for the National Spherical Tokamak Experiment. The new edge ME-SXR system tested on NSTX consists of a set of vertically stacked diode arrays, each viewing the plasma tangentially through independent pinholes and filters providing an overlapping view of the plasma midplane which allows simultaneous SXR measurements with coarse sub-sampling of the x-ray spectrum. Using computed x-ray spectral emission data, combinations of filters can provide fast (>10 kHz) measurements of changes in the electron temperature and density profiles providing a method to "fill-in" the gaps of the multi-point Thomson scattering system.
authors.affiliation: The Johns Hopkins University, Baltimore, Maryland 21218, USA. ktritz@pppl.gov
authors.forename: K
authors.initials: K
authors.lastname: Tritz
authors.forename: D J
authors.initials: DJ
authors.lastname: Clayton
authors.forename: D
authors.initials: D
authors.lastname: Stutman
authors.forename: M
authors.initials: M
authors.lastname: Finkenthal