title: Tangential x-ray imaging crystal spectrometer on J-TEXT tokamak.
abstract: A tangential x-ray imaging crystal spectrometer (XICS) has been developed for the J-TEXT tokamak to measure the ion temperature and the plasma toroidal rotation velocity. The resonance spectral line and its satellites of Ar XVII in the ranges of 3.94 Å-4.0 Å are detected. A spherically bent quartz crystal with 2d = 4.913 Å is used in this system. The crystal has a dimension of 9 cm high and 3 cm wide and the radius of curvature 3823 mm. The XICS is designed to receive emission of Ar XVII from -10 cm to +10 cm region with a spatial resolution of 3.1 cm in the vertical direction considering the parameters of the J-TEXT plasma. The XICS has a tangential angle of 27° with respect to toroidal direction in the magnetic axis. A two-dimensional 100 mm by 300 mm multi-wire proportional counter is applied to detect the spectra.
authors.affiliation: State Key Laboratory of Advanced Electromagnetic Engineering and Technology, College of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China.
authors.forename: W
authors.initials: W
authors.lastname: Jin
authors.forename: Z Y
authors.initials: ZY
authors.lastname: Chen
authors.forename: Y S
authors.initials: YS
authors.lastname: Cen
authors.forename: S G
authors.initials: SG
authors.lastname: Lee
authors.forename: Y J
authors.initials: YJ
authors.lastname: Shi
authors.forename: Y H
authors.initials: YH
authors.lastname: Ding
authors.forename: Z J
authors.initials: ZJ
authors.lastname: Yang
authors.forename: Z J
authors.initials: ZJ
authors.lastname: Wang
authors.forename: G
authors.initials: G
authors.lastname: Zhuang