title: Thermally induced parametric instability in a back-action evading measurement of a micromechanical quadrature near the zero-point level.
abstract: We report the results of back-action evading experiments utilizing a tightly coupled electro-mechanical system formed by a radio frequency micromechanical resonator parametrically coupled to a NbTiN superconducting microwave resonator. Due to excess dissipation in the microwave resonator, we observe a parametric instability induced by a thermal shift of the mechanical resonance frequency. In light of these measurements, we discuss the constraints on microwave dissipation needed to perform BAE measurements far below the zero-point level.
authors.affiliation: Applied Physics, California Institute of Technology, Pasadena, California 91125, United States.
authors.forename: J
authors.initials: J
authors.lastname: Suh
authors.forename: M D
authors.initials: MD
authors.lastname: Shaw
authors.forename: H G
authors.initials: HG
authors.lastname: Leduc
authors.forename: A J
authors.initials: AJ
authors.lastname: Weinstein
authors.forename: K C
authors.initials: KC
authors.lastname: Schwab