title: Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system.
abstract: A combined x-ray transmission and scanning force microscope setup (NanoXAS) recently installed at a dedicated beamline of the Swiss Light Source combines complementary experimental techniques to access chemical and physical sample properties with nanometer scale resolution. While scanning force microscopy probes physical properties such as sample topography, local mechanical properties, adhesion, electric and magnetic properties on lateral scales even down to atomic resolution, scanning transmission x-ray microscopy offers direct access to the local chemical composition, electronic structure and magnetization. Here we present three studies which underline the advantages of complementary access to nanoscale properties in prototype thin film samples.
authors.affiliation: Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland. nicolas.pilet@psi.ch
authors.forename: Nicolas
authors.initials: N
authors.lastname: Pilet
authors.forename: Joerg
authors.initials: J
authors.lastname: Raabe
authors.forename: Stephanie E
authors.initials: SE
authors.lastname: Stevenson
authors.forename: Sara
authors.initials: S
authors.lastname: Romer
authors.forename: Laetitia
authors.initials: L
authors.lastname: Bernard
authors.forename: Christopher R
authors.initials: CR
authors.lastname: McNeill
authors.forename: Rainer H
authors.initials: RH
authors.lastname: Fink
authors.forename: Hans J
authors.initials: HJ
authors.lastname: Hug
authors.forename: Christoph
authors.initials: C
authors.lastname: Quitmann