title: Simple method to characterize nonlinear refraction and loss in optical waveguides.
abstract: We describe a technique for accurately measuring the ratio between the imaginary and real parts of the third-order nonlinearity in optical waveguides. Unlike most other methods, it does not depend on precise knowledge of the coupling efficiencies, optical propagation loss, or optical pulse shape. We apply the method to characterize a silicon waveguide, a GaAs waveguide, and AlGaAs waveguides with different alloy concentrations.
authors.affiliation: Laboratory for Physical Sciences, College Park, Maryland 20740, USA. wathenjj@lps.umd.edu
authors.forename: Jeremiah J
authors.initials: JJ
authors.lastname: Wathen
authors.forename: Vincent R
authors.initials: VR
authors.lastname: Pagán
authors.forename: Thomas E
authors.initials: TE
authors.lastname: Murphy