title: Electron microscopes.
authors.affiliation: US Military Entrance Processing Command, North Chicago, IL, USA. dondelinger@mepcom.army.mil
authors.forename: Robert M
authors.initials: RM
authors.lastname: Dondelinger
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000295:instrumentation* / Q000379:methods*; D008854:Microscopy, Electron / Q000295:instrumentation* / Q000379:methods*