title: High dynamic range microscope infrared imaging of silicon nanophotonic devices.
abstract: A noninvasive diagnostic technique based on wavelength-resolved and magnified infrared images of weakly scattered light from a silicon photonic device may be useful to infer component characteristics, such as waveguide-resonator coupling, loss, quality factor, etc., at multiple locations, without the constraint of input/output couplers. Here, we demonstrate the benefit of high dynamic range microscope imaging for a silicon coupled microresonator device.
authors.affiliation: University of California, San Diego, Mail Code 0407, La Jolla, California 92093, USA. smookherjea@ucsd.edu
authors.forename: Shayan
authors.initials: S
authors.lastname: Mookherjea
authors.forename: Hannah R
authors.initials: HR
authors.lastname: Grant