title: Sideband spectroscopy and dispersion measurement in microcavities.
abstract: The measurement of dispersion and its control have become important considerations in nonlinear devices based on microcavities. A sideband technique is applied here to accurately measure dispersion in a microcavity resulting from both geometrical and material contributions. Moreover, by combining the method with finite element simulations, we show that mapping of spectral lines to their corresponding transverse mode families is possible. The method is applicable for high-Q, micro-cavities having microwave rate free spectral range and has a relative precision of 5.5 × 10(-6) for a 2 mm disk cavity with FSR of 32.9382 GHz and Q of 150 milllion.
authors.affiliation: T J Watson Laboratory of Applied Physics, California Institute of Technology, Pasadena, California 91125, USA.
authors.forename: Jiang
authors.initials: J
authors.lastname: Li
authors.forename: Hansuek
authors.initials: H
authors.lastname: Lee
authors.forename: Ki Youl
authors.initials: KY
authors.lastname: Yang
authors.forename: Kerry J
authors.initials: KJ
authors.lastname: Vahala
mesh_terms: D017076:Computer-Aided Design; D004867:Equipment Design; D006801:Humans; D008872:Microwaves; D055096:Optical Devices; D055095:Optics and Photonics; D012031:Refractometry / Q000295:instrumentation*; D012542:Scattering, Radiation