title: Analysis on enhanced depth of field for integral imaging microscope.
abstract: Depth of field of the integral imaging microscope is studied. In the integral imaging microscope, 3-D information is encoded as a form of elemental images Distance between intermediate plane and object point decides the number of elemental image and depth of field of integral imaging microscope. From the analysis, it is found that depth of field of the reconstructed depth plane image by computational integral imaging reconstruction is longer than depth of field of optical microscope. From analyzed relationship, experiment using integral imaging microscopy and conventional microscopy is also performed to confirm enhanced depth of field of integral imaging microscopy.
authors.affiliation: College of Electrical and Computer Engineering, Chungbuk National University, 410 SungBong-Ro, Heungduk-Gu, Cheongju-Si, Chungbuk, 361-763, South Korea.
authors.forename: Young-Tae
authors.initials: YT
authors.lastname: Lim
authors.forename: Jae-Hyeung
authors.initials: JH
authors.lastname: Park
authors.forename: Ki-Chul
authors.initials: KC
authors.lastname: Kwon
authors.forename: Nam
authors.initials: N
authors.lastname: Kim
mesh_terms: D000465:Algorithms; D007089:Image Enhancement / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D021621:Imaging, Three-Dimensional / Q000379:methods*; D008853:Microscopy / Q000379:methods*