title: Transient-grating self-referenced spectral interferometry for infrared femtosecond pulse characterization.
abstract: We propose a technique for measuring infrared femtosecond pulses: transient-grating self-referenced spectral interferometry. Based on this technique, we built an extremely simple, alignment-free device and successfully characterized both 38 fs pulses at 800 nm and sub-two-cycle 10 fs pulses at 1.75 μm.
authors.affiliation: State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China. jliu@siom.ac.cn
authors.forename: J
authors.initials: J
authors.lastname: Liu
authors.forename: F J
authors.initials: FJ
authors.lastname: Li
authors.forename: Y L
authors.initials: YL
authors.lastname: Jiang
authors.forename: C
authors.initials: C
authors.lastname: Li
authors.forename: Y X
authors.initials: YX
authors.lastname: Leng
authors.forename: T
authors.initials: T
authors.lastname: Kobayashi
authors.forename: R X
authors.initials: RX
authors.lastname: Li
authors.forename: Z Z
authors.initials: ZZ
authors.lastname: Xu
mesh_terms: D007368:Interferometry / Q000295:instrumentation / Q000379:methods*; D055620:Optical Phenomena; D013055:Spectrophotometry, Infrared / Q000295:instrumentation / Q000379:methods*; D013997:Time Factors