title: Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry.
abstract: Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry based on the Talbot effect and the Fourier transform method was demonstrated in the 1-km-long beamline of SPring-8. 10 keV X-rays were one-dimensionally focused down to 32 nm using a total-reflection elliptical mirror. An intentionally distorted wavefront was generated using a deformable mirror placed just upstream of the focusing mirror. The wavefront measured by interferometry was cross-checked with the phase retrieval method using intensity profiles around the beam waist. Comparison of the obtained wavefront errors revealed that they are in good agreement with each other and with the wavefront error estimated from the shape of the deformable mirror at a ~0.5 rad level.
authors.affiliation: Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan. matsuyama@prec.eng.osaka-u.ac.jp
authors.forename: Satoshi
authors.initials: S
authors.lastname: Matsuyama
authors.forename: Hikaru
authors.initials: H
authors.lastname: Yokoyama
authors.forename: Ryosuke
authors.initials: R
authors.lastname: Fukui
authors.forename: Yoshiki
authors.initials: Y
authors.lastname: Kohmura
authors.forename: Kenji
authors.initials: K
authors.lastname: Tamasaku
authors.forename: Makina
authors.initials: M
authors.lastname: Yabashi
authors.forename: Wataru
authors.initials: W
authors.lastname: Yashiro
authors.forename: Atsushi
authors.initials: A
authors.lastname: Momose
authors.forename: Tetsuya
authors.initials: T
authors.lastname: Ishikawa
authors.forename: Kazuto
authors.initials: K
authors.lastname: Yamauchi