title: Shedding new light on cathodoluminescence--a low voltage perspective.
abstract: Previously, imaging and analysis with cathodoluminescence (CL) detectors required using high accelerating voltages. Utilization of lower accelerating voltage for microanalysis has the advantages of reduced beam-specimen interaction volume, and thus better spatial resolution, as well as reduction in electron beam induced damage. This article will highlight recent developments in field emission gun-scanning electron microscope technology that have allowed acquisition of high spatial resolution CL images at very low accelerating voltages. The advantages of low kV CL imaging will be shown using examples of a geological specimen (shale) and a specimen of an industrial grade diamond.
authors.affiliation: JEOL USA Inc., 11 Dearborn Rd., Peabody, MA 01960, USA. erdman@jeol.com
authors.forename: Natasha
authors.initials: N
authors.lastname: Erdman
authors.forename: Charles
authors.initials: C
authors.lastname: Nielsen
authors.forename: Vernon E
authors.initials: VE
authors.lastname: Robertson