title: Echelle grating silicon multi/demultiplexers with single-reflection total internal reflectors.
abstract: We present a silicon-on-insulator Echelle grating 8-channel demutiplexer showing characteristic features, average insertion loss 2.4 dB measured at 1520~1570 nm, adjacent channel crosstalk 15-18 dB, and channel spacing 11.9 nm. Our Echelle grating is remarked by a total internal reflector (TIR) which reflects incident light by a single reflection in contrast to the double reflections of retro-reflector TIR Echelle gratings.
authors.affiliation: Electronics and Telecommunications Research Institute, 161 Gajong-dong, Yusong-gu, Daejeon, 305-350, South Korea. sahnggi@etri.re.kr
authors.forename: Sahnggi
authors.initials: S
authors.lastname: Park
authors.forename: Sang-Gi
authors.initials: SG
authors.lastname: Kim
authors.forename: Jeagyu
authors.initials: J
authors.lastname: Park
authors.forename: Gyungock
authors.initials: G
authors.lastname: Kim
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D007909:Lenses; D012031:Refractometry / Q000295:instrumentation*; D012666:Semiconductors; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation*; D012825:Silicon
chemical_list: D012825:Silicon