title: Line scan--structured illumination microscopy super-resolution imaging in thick fluorescent samples.
abstract: Structured illumination microscopy in thick fluorescent samples is a challenging task. The out-of-focus fluorescence background deteriorates the illumination pattern and the reconstructed images suffer from influence of noise. We present a combination of structured illumination microscopy with line scanning. This technique reduces the out-of-focus fluorescence background, which improves the modulation and the quality of the illumination pattern and therefore facilitates the reconstruction. We present super-resolution, optically sectioned images of a thick fluorescent sample, revealing details of the specimen's inner structure.
authors.affiliation: Institute for Adaptive and Neural Computation, University of Edinburgh, Edinburgh, UK.
authors.forename: Ondrej
authors.initials: O
authors.lastname: Mandula
authors.forename: Martin
authors.initials: M
authors.lastname: Kielhorn
authors.forename: Kai
authors.initials: K
authors.lastname: Wicker
authors.forename: Gerhard
authors.initials: G
authors.lastname: Krampert
authors.forename: Ingo
authors.initials: I
authors.lastname: Kleppe
authors.forename: Rainer
authors.initials: R
authors.lastname: Heintzmann