title: Impact of ultrafast electronic damage in single-particle x-ray imaging experiments.
abstract: In single-particle coherent x-ray diffraction imaging experiments, performed at x-ray free-electron lasers (XFELs), samples are exposed to intense x-ray pulses to obtain single-shot diffraction patterns. The high intensity induces electronic dynamics on the femtosecond time scale in the system, which can reduce the contrast of the obtained diffraction patterns and adds an isotropic background. We quantify the degradation of the diffraction pattern from ultrafast electronic damage by performing simulations on a biological sample exposed to x-ray pulses with different parameters. We find that the contrast is substantially reduced and the background is considerably strong only if almost all electrons are removed from their parent atoms. This happens at fluences of at least one order of magnitude larger than provided at currently available XFEL sources.
authors.affiliation: Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, D-22607 Hamburg, Germany.
authors.forename: U
authors.initials: U
authors.lastname: Lorenz
authors.forename: N M
authors.initials: NM
authors.lastname: Kabachnik
authors.forename: E
authors.initials: E
authors.lastname: Weckert
authors.forename: I A
authors.initials: IA
authors.lastname: Vartanyants
mesh_terms: D001704:Biopolymers / Q000737:chemistry* / Q000528:radiation effects*; D003198:Computer Simulation; D008954:Models, Biological; D008956:Models, Chemical; D011829:Radiation Dosage; D014965:X-Rays
chemical_list: D001704:Biopolymers