title: Single-shot analysis of hard x-ray laser radiation using a noninvasive grating spectrometer.
abstract: We present a spectrometer setup based on grating dispersion for hard x-ray free-electron lasers. This setup consists of a focusing spectrometer grating and a charge-integrating microstrip detector. Measurement results acquired at Linac Coherent Light Source are presented, demonstrating noninvasive monitoring of single-shot spectra with a resolution of 2.0×10(-4) ±0.3×10(-4) at photon energy of 6 keV with more than 95% transmission of the main beam.
authors.affiliation: Paul Scherrer Institut, Villigen-PSI CH 5232, Switzerland. petri.karvinen@psi.ch
authors.forename: Petri
authors.initials: P
authors.lastname: Karvinen
authors.forename: Simon
authors.initials: S
authors.lastname: Rutishauser
authors.forename: Aldo
authors.initials: A
authors.lastname: Mozzanica
authors.forename: Dominic
authors.initials: D
authors.lastname: Greiffenberg
authors.forename: Pavle N
authors.initials: PN
authors.lastname: Juranić
authors.forename: Andreas
authors.initials: A
authors.lastname: Menzel
authors.forename: Alberto
authors.initials: A
authors.lastname: Lutman
authors.forename: Jacek
authors.initials: J
authors.lastname: Krzywinski
authors.forename: David M
authors.initials: DM
authors.lastname: Fritz
authors.forename: Henrik T
authors.initials: HT
authors.lastname: Lemke
authors.forename: Marco
authors.initials: M
authors.lastname: Cammarata
authors.forename: Christian
authors.initials: C
authors.lastname: David