title: Terahertz deconvolution.
abstract: The ability to retrieve information from different layers within a stratified sample using terahertz pulsed reflection imaging and spectroscopy has traditionally been resolution limited by the pulse width available. In this paper, a deconvolution algorithm is presented which circumvents this resolution limit, enabling deep sub-wavelength and sub-pulse width depth resolution. The algorithm is explained through theoretical investigation, and demonstrated by reconstructing signals reflected from boundaries in stratified materials that cannot be resolved directly from the unprocessed time-domain reflection signal. Furthermore, the deconvolution technique has been used to recreate sub-surface images from a stratified sample: imaging the reverse side of a piece of paper.
authors.affiliation: School of Systems Engineering, University of Reading, Reading, UK. g.c.walker@reading.ac.uk
authors.forename: Gillian C
authors.initials: GC
authors.lastname: Walker
authors.forename: John W
authors.initials: JW
authors.lastname: Bowen
authors.forename: Julien
authors.initials: J
authors.lastname: Labaune
authors.forename: J-Bianca
authors.initials: JB
authors.lastname: Jackson
authors.forename: Sillas
authors.initials: S
authors.lastname: Hadjiloucas
authors.forename: John
authors.initials: J
authors.lastname: Roberts
authors.forename: Gerard
authors.initials: G
authors.lastname: Mourou
authors.forename: Michel
authors.initials: M
authors.lastname: Menu
mesh_terms: D000465:Algorithms; D029786:Cyperus / Q000737:chemistry; D005583:Fourier Analysis; D008962:Models, Theoretical; D010969:Plastics / Q000737:chemistry; D013057:Spectrum Analysis / Q000295:instrumentation / Q000379:methods; D055069:Terahertz Imaging / Q000295:instrumentation* / Q000379:methods*; D055053:Terahertz Radiation
chemical_list: D010969:Plastics