title: Accelerated autofocusing of off-axis holograms using critical sampling.
abstract: In this Letter we propose a fast off-axis hologram autofocusing (AF) approach that is based on the redundant data elimination by the critical resampling of the contained complex field. Implementation of the proposed methodology enables the real-time AF with up to 12× speed-up factors in comparison to the classical approach. The method is further extended for single-shot physical autofocus of the fluorescence imaging channel of multimodal imaging instruments capable of off-axis hologram acquisition.
authors.affiliation: Microvision and Microdiagnostics Group (SCI STI CHD), École Polytechnique Fédérale de Lausanne, Lausanne, CH-1015, Switzerland.
authors.forename: M
authors.initials: M
authors.lastname: Fatih Toy
authors.forename: Jonas
authors.initials: J
authors.lastname: Kühn
authors.forename: Stéphane
authors.initials: S
authors.lastname: Richard
authors.forename: Jérôme
authors.initials: J
authors.lastname: Parent
authors.forename: Marcel
authors.initials: M
authors.lastname: Egli
authors.forename: Christian
authors.initials: C
authors.lastname: Depeursinge
mesh_terms: D000465:Algorithms; D006696:Holography / Q000379:methods*; D007089:Image Enhancement / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D021621:Imaging, Three-Dimensional / Q000379:methods*; D008856:Microscopy, Fluorescence / Q000379:methods*; D015203:Reproducibility of Results; D018401:Sample Size; D012680:Sensitivity and Specificity; D012815:Signal Processing, Computer-Assisted