title: Narrow band, large angular width resonant reflection from a periodic high index grid at terahertz frequency.
abstract: The property of a thin silicon membrane with periodic air slits of definite depth and width to exhibit under normal incidence a close to 100% ultra-narrow band reflection peak is demonstrated experimentally in the terahertz frequency range on a single-crystal silicon grid fabricated by submillimeter microsystem technology. An analysis based on the true modes supported by the grid reveals the nature of such resonances and permits to sort out those exhibiting ultra-narrow band.
authors.affiliation: Université de Lyon, Laboratoire Hubert Curien, UMR CNRS 5516, 18 rue du Professeur Benoît Lauras, 42000 Saint-Etienne, France. olivier.parriaux@univ-st-etienne.fr
authors.forename: Olivier
authors.initials: O
authors.lastname: Parriaux
authors.forename: Thomas
authors.initials: T
authors.lastname: Kämpfe
authors.forename: Frédéric
authors.initials: F
authors.lastname: Garet
authors.forename: Jean-Louis
authors.initials: JL
authors.lastname: Coutaz
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D008567:Membranes, Artificial; D012031:Refractometry / Q000295:instrumentation*; D012825:Silicon / Q000737:chemistry*; D055053:Terahertz Radiation
chemical_list: D008567:Membranes, Artificial; D012825:Silicon