title: Sensitivity to molecular order of the electrical conductivity in oligothiophene monolayer films.
abstract: Using conducting probe atomic force microscopy (CAFM), we show that electrical conductivity in oligothiophene molecular films deposited on SiO(2)/Si wafers is extremely sensitive to degree of crystalline order in the film. By locally distorting the molecular order in the films through the controlled application of pressure with the AFM tip, the lateral charge transport was reduced by factors varying from 2 to 10, even when no changes in the height of the film could be observed.
authors.affiliation: Materials Science Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720, USA.
authors.forename: Florent
authors.initials: F
authors.lastname: Martin
authors.forename: Bas L M
authors.initials: BL
authors.lastname: Hendriksen
authors.forename: Allard J
authors.initials: AJ
authors.lastname: Katan
authors.forename: Yabing
authors.initials: Y
authors.lastname: Qi
authors.forename: Clayton
authors.initials: C
authors.lastname: Mauldin
authors.forename: Jean M J
authors.initials: JM
authors.lastname: Fréchet
authors.forename: Miquel
authors.initials: M
authors.lastname: Salmeron