title: Bidirectional scatter measurements of a guided-mode resonant filter photonic crystal structure.
abstract: This work investigates the Bidirectional Scatter Distribution Function (BSDF) at incident angles other than normal and at 544-nm wavelength of a Guided Mode Resonance Filter (GMRF) Photonic Crystal (PC) structure designed for normally incident light at 532 nm. Strong out-coupling of PC diffraction orders into both the transmitted and reflected hemispheres was observed specifically at a 25.7° incidence angle, which we attribute to this incident angle/wavelength pair being a good match to the ( ± 1, 0) PC grating mode. BSDF measurements at incident angles of 15° and 35° also displayed some out-coupled diffraction, though much lower in magnitude, and are also attributed to being a weaker match to the ( ± 1, 0) PC grating mode. Three-dimensional finite-difference time-domain Maxwell's equation simulations demonstrate that since this GMRF was designed for complete destructive interference of the transmitted light upon normal incidence, stronger out-coupling of the diffraction is expected for modal solutions as the angle of incidence increases.
authors.affiliation: Department of Engineering Physics, Air Force Institute of Technology, Wright-Patterson AFB, Ohio 45433, USA. michael.marciniak@afit.edu
authors.forename: M A
authors.initials: MA
authors.lastname: Marciniak
authors.forename: S R
authors.initials: SR
authors.lastname: Sellers
authors.forename: R B
authors.initials: RB
authors.lastname: Lamott
authors.forename: B T
authors.initials: BT
authors.lastname: Cunningham
mesh_terms: D003460:Crystallization / Q000379:methods; D004867:Equipment Design; D008027:Light; D008855:Microscopy, Electron, Scanning; D055616:Microtechnology / Q000379:methods; D008962:Models, Theoretical; D049329:Nanostructures / Q000737:chemistry; D036103:Nanotechnology / Q000295:instrumentation / Q000379:methods*; D055095:Optics and Photonics / Q000295:instrumentation / Q000379:methods*; D012031:Refractometry / Q000295:instrumentation*; D012542:Scattering, Radiation; D012825:Silicon / Q000737:chemistry
chemical_list: D012825:Silicon