title: Towards automatic alignment of a crystalline sample in an electron microscope along a zone axis.
abstract: A method is presented to use an electron microscope in transmission mode to determine the mis-tilt from a zone axis of a crystalline material. The method involves recording a number of additional diffraction patterns with incident beams tilted over 2 to 3 degrees. It is shown that an accuracy of 0.02 degree can be achieved, which is far better than that of the specimen-stage tilt axes, which is about 0.1 degree for the β-tilt.
authors.affiliation: National Centre for HREM, Kavli Institute of Nano Science, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands. j.jansen@tudelft.nl
authors.forename: J
authors.initials: J
authors.lastname: Jansen
authors.forename: M T
authors.initials: MT
authors.lastname: Otten
authors.forename: H W
authors.initials: HW
authors.lastname: Zandbergen