title: Real-time, high-resolution x-ray diffraction measurements on shocked crystals at a synchrotron facility.
abstract: The Advanced Photon Source (APS) at Argonne National Laboratory was used to obtain real-time, high-resolution x-ray diffraction measurements to determine the microscopic response of shock-compressed single crystals. Disk shaped samples were subjected to plane shock wave compression by impacting them with half-inch diameter, flat-faced projectiles. The projectiles were accelerated to velocities ranging between 300 and 1200 m/s using a compact powder gun designed specifically for use at a synchrotron facility. The experiments were designed to keep the sample probed volume under uniaxial strain and constant stress for a duration longer than the 153.4 ns spacing between x-ray bunches. X-rays from a single pulse (<100 ps duration) out of the periodic x-ray pulses emitted by the synchrotron were used for the diffraction measurements. A synchronization and x-ray detection technique was developed to ensure that the measured signal was obtained unambiguously from the desired x-ray pulse incident on the sample while the sample was in a constant uniaxial strain state. The synchronization and x-ray detection techniques described can be used for a variety of x-ray measurements on shock compressed solids and liquids at the APS. Detailed procedures for applying the Bragg-Brentano parafocusing approach to single crystals at the APS are presented. Analytic developments to determine the effects of crystal substructure and non-ideal geometry on the diffraction pattern position and shape are presented. Representative real-time x-ray diffraction data, indicating shock-induced microstructural changes, are presented for a shock-compressed Al(111) sample. The experimental developments presented here provided, in part, the impetus for the Dynamic Compression Sector (DCS) currently under development at the APS. Both the synchronization∕x-ray detection methods and the analysis equations for high-resolution single crystal x-ray diffraction can be used at the DCS.
authors.affiliation: Institute for Shock Physics and the Department of Physics, Washington State University, Pullman, Washington 99164-2816, USA.
authors.forename: Y M
authors.initials: YM
authors.lastname: Gupta
authors.forename: Stefan J
authors.initials: SJ
authors.lastname: Turneaure
authors.forename: K
authors.initials: K
authors.lastname: Perkins
authors.forename: K
authors.initials: K
authors.lastname: Zimmerman
authors.forename: N
authors.initials: N
authors.lastname: Arganbright
authors.forename: G
authors.initials: G
authors.lastname: Shen
authors.forename: P
authors.initials: P
authors.lastname: Chow