title: Low-noise single-photon avalanche diodes in 0.25 μm high-voltage CMOS technology.
abstract: By using 0.25 μm high-voltage CMOS technology, we have designed and fabricated a structure of single-photon detectors. The new single-photon avalanche diode (SPAD) has (to our knowledge) the lowest dark count rate per unit area at room temperature without any technology customization. Our design is promising for realizing low-cost and high-performance SPAD arrays for imaging applications.
authors.affiliation: Department of Electronics Engineering, National Chiao Tung University, 1001 University Road, Hsinchu 300, Taiwan.
authors.forename: Fang-Ze
authors.initials: FZ
authors.lastname: Hsu
authors.forename: Jau-Yang
authors.initials: JY
authors.lastname: Wu
authors.forename: Sheng-Di
authors.initials: SD
authors.lastname: Lin