title: On practical charge injection at the metal/organic semiconductor interface.
abstract: We have revealed practical charge injection at metal and organic semiconductor interface in organic field effect transistor configurations. We have developed a facile interface structure that consisted of double-layer electrodes in order to investigate the efficiency through contact metal dependence. The metal interlayer with few nanometers thickness between electrode and organic semiconductor drastically reduces the contact resistance at the interface. The improvement has clearly obtained when the interlayer is a metal with lower standard electrode potential of contact metals than large work function of the contact metals. The electrode potential also implies that the most dominant effect on the mechanism at the contact interface is induced by charge transfer. This mechanism represents a step forward towards understanding the fundamental physics of intrinsic charge injection in all organic devices.
authors.affiliation: WPI center for Materials Nanoarchitectronics (WPI-MANA), National Institute of Materials Science (NIMS), Tsukuba, Ibaraki 305-0044, Japan. KUMATANI@wpi-aimr.tohoku.ac.jp
authors.forename: Akichika
authors.initials: A
authors.lastname: Kumatani
authors.forename: Yun
authors.initials: Y
authors.lastname: Li
authors.forename: Peter
authors.initials: P
authors.lastname: Darmawan
authors.forename: Takeo
authors.initials: T
authors.lastname: Minari
authors.forename: Kazuhito
authors.initials: K
authors.lastname: Tsukagoshi