title: Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization.
abstract: Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction.
authors.affiliation: State Key Laboratory for Turbulence and Complex System, Department of Mechanics and Aerospace Engineering, CAPT, College of Engineering, Peking University, Beijing 100871, China.
authors.forename: M
authors.initials: M
authors.lastname: Lanza
authors.forename: A
authors.initials: A
authors.lastname: Bayerl
authors.forename: T
authors.initials: T
authors.lastname: Gao
authors.forename: M
authors.initials: M
authors.lastname: Porti
authors.forename: M
authors.initials: M
authors.lastname: Nafria
authors.forename: G Y
authors.initials: GY
authors.lastname: Jing
authors.forename: Y F
authors.initials: YF
authors.lastname: Zhang
authors.forename: Z F
authors.initials: ZF
authors.lastname: Liu
authors.forename: H L
authors.initials: HL
authors.lastname: Duan
mesh_terms: D004560:Electricity; D006108:Graphite / Q000737:chemistry*; D018625:Microscopy, Atomic Force; D036103:Nanotechnology; D019904:Polymethyl Methacrylate / Q000737:chemistry
chemical_list: D006108:Graphite; D019904:Polymethyl Methacrylate