title: A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device.
abstract: We present a combined scanning force and tunneling microscope working in a dilution refrigerator that is optimized for the study of individual electronic nano-devices. This apparatus is equipped with commercial piezo-electric positioners enabling the displacement of a sample below the probe over several hundred microns at very low temperature, without excessive heating. Atomic force microscopy based on a tuning fork resonator probe is used for cryogenic precise alignment of the tip with an individual device. We demonstrate the local tunneling spectroscopy of a hybrid Josephson junction as a function of its current bias.
authors.affiliation: Institut Néel, CNRS, Grenoble INP and Université Joseph Fourier, 25 rue des Martyrs, BP 166, 38042 Grenoble, France.
authors.forename: T
authors.initials: T
authors.lastname: Quaglio
authors.forename: F
authors.initials: F
authors.lastname: Dahlem
authors.forename: S
authors.initials: S
authors.lastname: Martin
authors.forename: A
authors.initials: A
authors.lastname: Gérardin
authors.forename: C B
authors.initials: CB
authors.lastname: Winkelmann
authors.forename: H
authors.initials: H
authors.lastname: Courtois