title: [Spectral analysis method for precisely measuring specific rotation of quartz].
abstract: A spectral analysis method for precisely measuring specific rotation of quartz is proposed. The measuring principle is analyzed by using the method of optical matrix. The result indicates that the specific rotation of quartz can be exactly calculated by measuring the transmittance curve of a sample quartz plate sandwiched between two paralleled polarizing prisms, and the correctness of the method is validated by a designed experiment using a spectrophotometer. The data is analyzed, and the rotary dispersion formula of quartz is fitted. Compared with Lowry' formula, our formula is more accurate in visible spectral scope. Errors in the experiment is analyzed and the result shows that the measuring accuracy will be improved by choosing thicker quartz plate, longer wave band, lower scan speed, and smaller slit width.
authors.affiliation: Shandong Provincial Key Laboratory of Laser Polarization and Information Technology, Laser Institute, Qufu Normal University, Qufu 273165, China. Lily9981@tom.com
authors.forename: Li-Li
authors.initials: LL
authors.lastname: Ma
authors.forename: Fu-Quan
authors.initials: FQ
authors.lastname: Wu
authors.forename: Dian-Zhong
authors.initials: DZ
authors.lastname: Hao
authors.forename: Fu-Fang
authors.initials: FF
authors.lastname: Su
authors.forename: Meng
authors.initials: M
authors.lastname: Shi