title: Tuning the spring constant of cantilever-free tip arrays.
abstract: A method to measure and tune the spring constant of tips in a cantilever-free array by adjusting the mechanical properties of the elastomeric layer on which it is based is reported. Using this technique, large-area silicon tip arrays are fabricated with spring constants tuned ranging from 7 to 150 N/m. To illustrate the benefit of utilizing a lower spring constant array, the ability to pattern on a delicate 50 nm silicon nitride substrate is explored.
authors.affiliation: Department of Chemistry, Northwestern University, 2145 Sheridan Road, Evanston, Illinois 60208, USA.
authors.forename: Daniel J
authors.initials: DJ
authors.lastname: Eichelsdoerfer
authors.forename: Keith A
authors.initials: KA
authors.lastname: Brown
authors.forename: Radha
authors.initials: R
authors.lastname: Boya
authors.forename: Wooyoung
authors.initials: W
authors.lastname: Shim
authors.forename: Chad A
authors.initials: CA
authors.lastname: Mirkin