title: Indentation device for in situ Raman spectroscopic and optical studies.
abstract: Instrumented indentation is a widely used technique to study the mechanical behavior of materials at small length scales. Mechanical tests of bulk materials, microscopic, and spectroscopic studies may be conducted to complement indentation and enable the determination of the kinetics and physics involved in the mechanical deformation of materials at the crystallographic and molecular level, e.g., strain build-up in crystal lattices, phase transformations, and changes in crystallinity or orientation. However, many of these phenomena occurring during indentation can only be observed in their entirety and analyzed in depth under in situ conditions. This paper describes the design, calibration, and operation of an indentation device that is coupled with a Raman microscope to conduct in situ spectroscopic and optical analysis of mechanically deformed regions of Raman-active, transparent bulk material, thin films or fibers under contact loading. The capabilities of the presented device are demonstrated by in situ studies of the indentation-induced phase transformations of Si thin films and modifications of molecular conformations in high density polyethylene films.
authors.affiliation: Ceramics Division, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, USA. yvonne.gerbig@nist.gov
authors.forename: Y B
authors.initials: YB
authors.lastname: Gerbig
authors.forename: C A
authors.initials: CA
authors.lastname: Michaels
authors.forename: A M
authors.initials: AM
authors.lastname: Forster
authors.forename: J W
authors.initials: JW
authors.lastname: Hettenhouser
authors.forename: W E
authors.initials: WE
authors.lastname: Byrd
authors.forename: D J
authors.initials: DJ
authors.lastname: Morris
authors.forename: R F
authors.initials: RF
authors.lastname: Cook
mesh_terms: D002138:Calibration; D004867:Equipment Design; D007834:Lasers; D008422:Materials Testing / Q000295:instrumentation*; D055595:Mechanical Phenomena; D008853:Microscopy; D055620:Optical Phenomena; D020959:Polyethylene / Q000737:chemistry; D012825:Silicon / Q000737:chemistry; D013059:Spectrum Analysis, Raman / Q000295:instrumentation*
chemical_list: D020959:Polyethylene; D012825:Silicon