title: A macroscopic non-destructive testing system based on the cantilever-sample contact resonance.
abstract: Detecting the inside or buried defects in materials and structures is always a challenge in the field of nondestructive testing (NDT). In this paper, enlightened by the operation principle of the contact resonance force microscopy or atomic force acoustic microscopy (AFAM), we proposed a macroscopic NDT system based on contact resonance of the cantilever-sample surface to detect the local stiffness variations in materials or structures. We fabricated a piezoelectric unimorph with the dimension typically of 150 mm × 8 mm × 2 mm to act as a macroscopic cantilever, whose flexural mode vibration was driven by a wideband power amplifier together with a signal generator. The vibration signal of the macroscopic cantilever is detected by a high sensitive strain gauge bonded on the cantilever surface which is much more stable than the laser diode sensor in AFAM, thus making it very suitable for outdoor operations. Scanning is realized by a three-dimensional motorized stage with the Z axis for pressing force setting. The whole system is controlled by a LabVIEW-based homemade software. Like the AFAM, this NDT system can also work in two modes, i.e., the single-frequency mode and the resonance-tracking mode. In the latter mode, the contact stiffness at each pixel of the sample can be obtained by using the measured contact resonance frequency and a beam dynamics model. Testing results of this NDT system on a grid structure with an opaque panel show that in both modes the prefabricated defect beneath the panel can be detected and the grid structures can be clearly "seen," which indicates the validity of this NDT system. The sensitivity of this NDT system was also examined.
authors.affiliation: State Key Laboratory for Turbulence and Complex Systems, College of Engineering, Peking University, Beijing 100871, China.
authors.forename: Ji
authors.initials: J
authors.lastname: Fu
authors.forename: Lizhi
authors.initials: L
authors.lastname: Lin
authors.forename: Xilong
authors.initials: X
authors.lastname: Zhou
authors.forename: Yingwei
authors.initials: Y
authors.lastname: Li
authors.forename: Faxin
authors.initials: F
authors.lastname: Li