title: Gentle and fast atomic force microscopy with a piezoelectric scanning probe for nanorobotics applications.
abstract: A novel dual tip nanomanipulation atomic force microscope (AFM) platform operating in ambient conditions is presented. The system is equipped with a high frequency quartz piezoelectric self-sensing scanning probe for fast imaging and a passive cantilever for manipulation. The system is validated by imaging and selective pushing/pulling of gold colloid beads (diameters from 80 to 180 nm). This provides a more compact integration compared to an external optical lever and avoids several of its drawbacks such as optical interference and noise, and recalibration in the case of a moving cantilever and a fixed laser source and photodiode sensor. Moreover, as the quartz oscillator exhibits oscillation amplitudes in the sub-picometer range with a resonant frequency in the megahertz range, this dynamic force sensor is ideal for fast AFM imaging. Experiments show an increase by five times in imaging speed compared to a classical AFM system.
authors: Departamento de Automática y Electrónica, Universidad Autónoma de Occidente, Cll 25 N 115-85 Km. 2 Vía Cali-Jamundí, Colombia. jcacosta@uao.edu.co
authors: Juan Camilo
authors: JC
authors: Acosta
authors: Jérôme
authors: J
authors: Polesel-Maris
authors: François
authors: F
authors: Thoyer
authors: Hui
authors: H
authors: Xie
authors: Sinan
authors: S
authors: Haliyo
authors: Stéphane
authors: S
authors: Régnier