title: Soft x-ray free-electron laser imaging by LiF crystal and film detectors over a wide range of fluences.
abstract: LiF crystal and film detectors were used to measure the far-field fluence profile of a self-amplified spontaneous-emission free-electron laser beam and diffraction imaging with high spatial resolution. In these measurements the photoluminescence (PL) response of LiF crystal and film was compared over a wide range of soft x-ray fluences. It was found that the soft x-ray fluence dependences of LiF crystal and film differ. At low fluence, the LiF crystal shows higher PL response compared to LiF film, while this comparison is the opposite at higher fluence. Accurate measurement of LiF crystal and film PL response is important for precise characterization of the spatial, spectral, and coherence features of x-ray beams across the full profile and in localized areas. For such measurements, crucial LiF detector attributes are high spatial resolution and high dynamic range.
authors: Quantum Beam Science Directorate, Japan Atomic Energy Agency, Kizugawa, Kyoto, Japan.
authors: Tatiana A
authors: TA
authors: Pikuz
authors: Anatoly Ya
authors: AY
authors: Faenov
authors: Yuji
authors: Y
authors: Fukuda
authors: Masaki
authors: M
authors: Kando
authors: Paul
authors: P
authors: Bolton
authors: Alexander
authors: A
authors: Mitrofanov
authors: Alexander V
authors: AV
authors: Vinogradov
authors: Mitsuru
authors: M
authors: Nagasono
authors: Haruhiko
authors: H
authors: Ohashi
authors: Makina
authors: M
authors: Yabashi
authors: Kensuke
authors: K
authors: Tono
authors: Yasunori
authors: Y
authors: Senba
authors: Tadashi
authors: T
authors: Togashi
authors: Tetsuya
authors: T
authors: Ishikawa