title: Using optical anisotropy as a quality factor to rapidly characterize structural qualities of large-area graphene films.
abstract: In this study, we find that the optical anisotropy of graphene films could be used as an alternative quality factor for the rapid characterization of large-area graphene films prepared through chemical vapor deposition. We develop an angle-variable spectroscopic method to rapidly determine the optical anisotropy of graphene films. Unlike approaches using Raman scattering spectroscopy, this optical anisotropy method allows ready characterization of the structural quality of large-area graphene samples without the application of high-intensity laser irradiation or complicated optical setups. Measurements of optical anisotropy also allow us to distinguish graphene samples with different extents of structural imperfections; the results are consistent with those obtained from using Raman scattering spectroscopy. In addition, we also study the properties of graphene-based transparent conductive films at wide incident angles because of the advantage of the optical anisotropic properties of graphene. The transmittance of graphene is much higher than that of indium tin oxide films, especially at large incident angles.
authors: Department of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan.
authors: Yu-Lun
authors: YL
authors: Liu
authors: Chen-Chieh
authors: CC
authors: Yu
authors: Cheng-Yi
authors: CY
authors: Fang
authors: Hsuen-Li
authors: HL
authors: Chen
authors: Chun-Wei
authors: CW
authors: Chen
authors: Chun-Chiang
authors: CC
authors: Kuo
authors: Cheng-Kai
authors: CK
authors: Chang
authors: Li-Chyong
authors: LC
authors: Chen
authors: Kuei-Hsien
authors: KH
authors: Chen