title: Helium ion microscopy: a new tool for imaging novel mesoporous silica and organosilica materials.
abstract: Helium ion microscopy (HIM) has been used to image mesoporous silica and organosilica for the first time. Images of chiral nematic silica, ethylenesilica, and new benzenesilica reveal the structural organization, pore dimensions and connectivity of these materials on the nanometer length scale.
authors: Department of Chemistry, University of British Columbia, 2036 Main Mall, Vancouver, BC V6T 1Z1, Canada.
authors: Andrea S
authors: AS
authors: Terpstra
authors: Kevin E
authors: KE
authors: Shopsowitz
authors: Camille F
authors: CF
authors: Gregory
authors: Alan P
authors: AP
authors: Manning
authors: Carl A
authors: CA
authors: Michal
authors: Wadood Y
authors: WY
authors: Hamad
authors: Jijin
authors: J
authors: Yang
authors: Mark J
authors: MJ
authors: MacLachlan
mesh_terms: D002942:Circular Dichroism; D006371:Helium / Q000737:chemistry*; D007477:Ions / Q000737:chemistry; D009682:Magnetic Resonance Spectroscopy; D017646:Organosilicon Compounds / Q000737:chemistry*; D016062:Porosity; D012822:Silicon Dioxide / Q000737:chemistry*; D013056:Spectrophotometry, Ultraviolet; D019265:Spectroscopy, Near-Infrared; D013499:Surface Properties
chemical_list: D007477:Ions; D017646:Organosilicon Compounds; D006371:Helium; D012822:Silicon Dioxide