Sample heating system for spin-polarized scanning electron microscopy.
A sample-heating system for spin-polarized scanning electron microscopy (spin SEM) has been developed and used for microscopic magnetization analysis at temperatures up to 500°C. In this system, a compact ceramic heater and a preheating operation keep the ultra-high vacuum conditions while the sample is heated during spin SEM measurement. Moreover, the secondary-electron collector, which is arranged close to the sample, was modified so that it is not damaged at high temperatures. The system was used to heat a Co(1000) single-crystal sample from room temperature up to 500°C, and the magnetic-domain structures were observed. Changes of the domain structures were observed around 220 and 400°C, and these changes are considered to be due to phase transitions of this sample.
Central Research Laboratory, Hitachi, Ltd, Hatoyama, Saitama 350-0395, Japan.
Teruo
T
Kohashi
Kumi
K
Motai
D006361:Heating / Q000295:instrumentation / Q000379:methods; D060526:Magnetic Fields; D059346:Magnets; D008855:Microscopy, Electron, Scanning / Q000379:methods*; D013048:Specimen Handling / Q000379:methods*; D013113:Spin Labels
D013113:Spin Labels
Co; SEM; high temperature; magnetic domain; secondary electrons; spin