title: Multi-beam confocal microscopy based on a custom image sensor with focal-plane pinhole array effect.
abstract: Multi-beam confocal microscopy without any physical pinhole was demonstrated. As a key device, a custom CMOS image sensor realizing a focal-plane pinhole array effect by special pixel addressing and discarding of the unwanted photocarriers was developed. The axial resolution in the confocal mode measured by FWHM for a planar mirror was 8.9 μm, which showed that the confocality has been achieved with the proposed CMOS image sensor.
authors: Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Naka-ku, Hamamatsu, Shizuoka 432-8011, Japan. kagawa@idl.rie.shizuoka.ac.jp
authors: Keiichiro
authors: K
authors: Kagawa
authors: Min-Woong
authors: MW
authors: Seo
authors: Keita
authors: K
authors: Yasutomi
authors: Susumu
authors: S
authors: Terakawa
authors: Shoji
authors: S
authors: Kawahito
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000295:instrumentation*; D008029:Lighting / Q000295:instrumentation*; D018613:Microscopy, Confocal / Q000295:instrumentation*; D012666:Semiconductors; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation*; D014159:Transducers