title: Microscope mode secondary ion mass spectrometry imaging with a Timepix detector.
abstract: In-vacuum active pixel detectors enable high sensitivity, highly parallel time- and space-resolved detection of ions from complex surfaces. For the first time, a Timepix detector assembly was combined with a secondary ion mass spectrometer for microscope mode secondary ion mass spectrometry (SIMS) imaging. Time resolved images from various benchmark samples demonstrate the imaging capabilities of the detector system. The main advantages of the active pixel detector are the higher signal-to-noise ratio and parallel acquisition of arrival time and position. Microscope mode SIMS imaging of biomolecules is demonstrated from tissue sections with the Timepix detector.
authors: FOM Institute AMOLF, Science Park 104, 1098 XG Amsterdam, The Netherlands.
authors: Andras
authors: A
authors: Kiss
authors: Julia H
authors: JH
authors: Jungmann
authors: Donald F
authors: DF
authors: Smith
authors: Ron M A
authors: RM
authors: Heeren