title: Rapid fabrication of micro-nanometric tapered fiber lens and characterization by a novel scanning optical microscope with submicron resolution.
abstract: In numerous applications of optical scanning microscopy, a reference tapered fiber lens with high symmetry at sub-wavelength scale remains a challenge. Here, we demonstrate the ability to manufacture it with a wide range of geometry control, either for the length from several hundred nanometers to several hundred microns, or for the curvature radius from several tens of nanometers to several microns on the endface of a single mode fiber. On this basis, a scanning optical microscope has been developed, which allows for fast characterization of various sub-wavelength tapered fiber lenses. Focal position and depth of microlenses with different geometries have been determined to be ranged from several hundreds of nanometers to several microns. FDTD calculations are consistent with experimental results.
authors: Institute of Intelligent Machines, Chinese Academy of Sciences, Hefei, China.
authors: Shouguo
authors: S
authors: Zheng
authors: Xinhua
authors: X
authors: Zeng
authors: Wei
authors: W
authors: Luo
authors: Safi
authors: S
authors: Jradi
authors: Jérôme
authors: J
authors: Plain
authors: Miao
authors: M
authors: Li
authors: Philippe
authors: P
authors: Renaud-Goud
authors: Régis
authors: R
authors: Deturche
authors: Zengfu
authors: Z
authors: Wang
authors: Jieting
authors: J
authors: Kou
authors: Renaud
authors: R
authors: Bachelot
authors: Pascal
authors: P
authors: Royer