title: Mapping the local dielectric response at the nanoscale by means of plasmonic force spectroscopy.
abstract: At the present, the local optical properties of nanostructured materials are difficult to be measured by available instrumentation. We investigated the capability of plasmonic force spectroscopy of measuring the optical response at the nanoscale. The proposed technique is based on force measurements performed by combining Atomic Force Microscopy, or optical tweezers, and adiabatic compression of surface plasmon polaritons. We show that the optical forces, caused by the plasmonic field, depend on the local response of the substrates and, in principle, allow probing both the real and the imaginary part of the local permittivity with a spatial resolution of few nanometers.
authors: Istituto Italiano di Tecnologia, via Morego 30, 16163 Genova, Italy. francesco.deangelis@iit.it
authors: Francesco
authors: F
authors: De Angelis
authors: Remo Proietti
authors: RP
authors: Zaccaria
authors: Enzo
authors: E
authors: Di Fabrizio