title: Photostimulated control of laser transmission through photoresponsive cholesteric liquid crystals.
abstract: Cholesteric liquid crystals (CLCs) are selectively reflective optical materials, the color of which can be tuned via electrical, thermal, mechanical, or optical stimuli. In this work, we show that self-regulation of the transmission of a circularly polarized incident beam can occur upon phototuning of the selective reflection peak of a photosensitive CLC mixture towards the pump wavelength. The autonomous behavior occurs as the red-shifting selective reflection peak approaches the wavelength of the incident laser light. Once the red-edge of the CLC bandgap and incident laser wavelength overlap, the rate of tuning dramatically slows. The dwell time (i.e., duration of the overlap of stimulus wavelength with CLC bandgap) is shown to depend on the radiation wavelength, polarization, and intensity. Necessary conditions for substantial dwell time of the CLC reflection peak at the pump beam wavelength include irradiation with low intensity light (~1mW/cm²) and the utilization of circularly polarized light of the same handedness as the helical structure within the CLC. Monitoring the optical properties in both reflection and transmission geometries elucidates differences associated with attenuation of the light through the thickness of the CLC film.
authors: Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson Air Force Base, OH 45433, USA.
authors: Jonathan P
authors: JP
authors: Vernon
authors: Aaron D
authors: AD
authors: Zhao
authors: Rafael
authors: R
authors: Vergara
authors: Hyunmin
authors: H
authors: Song
authors: Vincent P
authors: VP
authors: Tondiglia
authors: Timothy J
authors: TJ
authors: White
authors: Nelson V
authors: NV
authors: Tabiryan
authors: Timothy J
authors: TJ
authors: Bunning
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D005246:Feedback; D007834:Lasers; D008027:Light; D050866:Liquid Crystals / Q000737:chemistry* / Q000528:radiation effects*; D012031:Refractometry / Q000295:instrumentation*