title: Differentiation of deformation modes in nanocrystalline Pd films inferred from peak asymmetry evolution using in situ x-ray diffraction.
abstract: Synchrotron-based in situ tensile testing was used to study the dominant deformation mechanisms of nanocrystalline Pd thin films on a compliant substrate. An x-ray diffraction peak profile analysis reveals an (hkl) independent deformation induced peak asymmetry. It is argued that the asymmetry is caused by a broad distribution of elastic strains among individual grains and the complexity of accommodation processes. The reversal of peak asymmetry manifests the transition from heterogeneous microplasticity to dislocation-based macroplasticity. Independently, stress-driven grain boundary migration is active.
authors: Karlsruhe Institute of Technology, Institute for Applied Materials, P.O. Box 3640, 76021 Karlsruhe, Germany.
authors: Jochen
authors: J
authors: Lohmiller
authors: Rudolf
authors: R
authors: Baumbusch
authors: Oliver
authors: O
authors: Kraft
authors: Patric A
authors: PA
authors: Gruber