title: Facility implementation and comparative performance evaluation of probe-corrected TEM/STEM with Schottky and cold field emission illumination.
abstract: We report the installation and performance evaluation of a probe aberration-corrected high-resolution JEOL JEM-ARM200F transmission electron microscope (TEM). We provide details on construction of the room that enables us to obtain scanning transmission electron microscope (STEM) data without any evident distortions/noise from the external environment. The microscope routinely delivers expected performance. We show that the highest STEM spatial resolution and energy resolution achieved with this microscope are 0.078 nm and 0.34 eV, respectively. We report a direct comparative evaluation of the performance of this microscope with a Schottky thermal field-emission gun versus a cold field-emission gun. Cold field-emission illumination improves spatial resolution of the high current probe for analytical spectroscopy, the TEM information limit, and the electron energy resolution compared to the Schottky thermal field-emission source.
authors: National High Magnetic Field Laboratory, Florida State University, Tallahassee, FL 32310, USA. xin@magnet.fsu.edu
authors: Yan
authors: Y
authors: Xin
authors: John
authors: J
authors: Kynoch
authors: Ke
authors: K
authors: Han
authors: Zhiyong
authors: Z
authors: Liang
authors: Peter J
authors: PJ
authors: Lee
authors: David C
authors: DC
authors: Larbalestier
authors: Yi-Feng
authors: YF
authors: Su
authors: Kohei
authors: K
authors: Nagahata
authors: Toshihiro
authors: T
authors: Aoki
authors: Paolo
authors: P
authors: Longo