title: Note: reducing polarization induced sidebands in Rayleigh backscattering spectra for accurate distributed strain measurement using optical frequency-domain reflectometry.
abstract: We describe a phenomenon called polarization-induced sidebands (PIS) in Rayleigh backscatter spectra (RBS) and discuss its deteriorating effects on the distributed strain measurement using an optical frequency-domain reflectometry. We propose using a special polarization diversity detection scheme to remove PIS and successfully demonstrate accurate distributed strain measurement in the range of 0.75 με-225 με in a 50 m standard single mode fiber, with a good linearity between the strain and the spectra shift in RBS.
authors: College of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China.
authors: Zhenyang
authors: Z
authors: Ding
authors: X Steve
authors: XS
authors: Yao
authors: Tiegen
authors: T
authors: Liu
authors: Yang
authors: Y
authors: Du
authors: Kun
authors: K
authors: Liu
authors: Qun
authors: Q
authors: Han
authors: Zhuo
authors: Z
authors: Meng
authors: Dingjie
authors: D
authors: Li