title: Some aspects of achieving an ultimate accuracy during insertion device magnetic measurements by a Hall probe.
abstract: An extensive test of a new Senis 2-axis Hall probe was done at the Advanced Photon Source using the Undulator A device and calibration system. This new probe has clear advantages compared with previously used Bell and Sentron Hall probes: very stable zero offset (less than the noise of 0.026 G) and compensated planar Hall effect. It can be used with proper calibration even for first and second field integral measurements. A comparison with reference measurements by long stretched coil shows that the difference in the first field integral measurement results for a 2.4-m-long Undulator A device is between 17 G cm for the best of four Hall probes used for the test and 51 G cm for the worst of them for all gap ranges from 10.5 mm to 150 mm.
authors: Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA. vasserman@aps.anl.gov
authors: I B
authors: IB
authors: Vasserman
authors: N O
authors: NO
authors: Strelnikov
authors: J Z
authors: JZ
authors: Xu