title: Thermal and electrical conduction in ultrathin metallic films: 7 nm down to sub-nanometer thickness.
abstract: For ultrathin metallic films (e.g., less than 5 nm), no knowledge is yet available on how electron scattering at surface and grain boundaries reduces the electrical and thermal transport. The thermal and electrical conduction of metallic films is characterized down to 0.6 nm average thickness. The electrical and thermal conductivities of 0.6 nm Ir film are reduced by 82% and 50% from the respective bulk values. The Lorenz number is measured as 7.08 × 10⁻⁸ W Ω K⁻², almost a twofold increase of the bulk value. The Mayadas-Shatzkes model is used to interpret the experimental results and reveals very strong electron reflection (>90%) at grain boundaries.
authors: Department of Mechanical Engineering, Iowa State University, 2010 Black Engineering Building, Ames, Iowa 50011, USA.
authors: Huan
authors: H
authors: Lin
authors: Shen
authors: S
authors: Xu
authors: Xinwei
authors: X
authors: Wang
authors: Ning
authors: N
authors: Mei
keywords: Lorenz number; electrical conductivity; iridium films; thermal conductivity; ultrathin films