title: Diminishing relative jitter in electrooptic sampling of active mm-wave and THz circuits.
abstract: In this work a novel approach in synchronization of electrooptic sampling systems for the ultra-broadband characterization of active mm-wave and THz devices is presented. The relative time jitter between sampled circuit and probing electrooptic head is eliminated by using a femtosecond laser system both as the generator of CW driving the device under test as well as the impulsively probing element. Previous ultra-broadband approaches were applicable to passive components driven by THz impulses, only. The presented system is more generally applicable to active mm-wave and THz components driven by conventional CW electronic sources. Broadband analysis on silicon nonlinear transmission line elements up to a frequency of 300 GHz is presented in order to illustrate the capabilities of the concept.
authors.affiliation: Institute of High Frequency and Quantum Electronics (HQE), University of Siegen, Germany. mehran.jamshidifar@uni-siegen.de
authors.forename: M
authors.initials: M
authors.lastname: Jamshidifar
authors.forename: P Haring
authors.initials: PH
authors.lastname: Bolívar
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D007834:Lasers; D018401:Sample Size; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation*; D013685:Telecommunications / Q000295:instrumentation*; D055053:Terahertz Radiation