title: Coupling atom probe tomography and photoluminescence spectroscopy: exploratory results and perspectives.
abstract: The development of laser-assisted atom probes makes it possible, in principle, to exploit the femtosecond laser pulse not only for triggering ion evaporation from a nanometric field emission tip, but also for generating photons via the radiative recombination of electron-hole pairs in tips made of dielectric materials. In this article we demonstrate a first step towards a correlation of micro-photoluminescence (μ-PL) and laser-assisted tomographic atom probe (LA-TAP) analysis applied separately on the same objects, namely on ZnO microwires. In particular, we assess that the use of the focused ion beam (FIB) tip preparation method significantly degrades the radiative recombination yield of the analyzed microwires. We discuss the strategies to avoid the FIB-induced damage on the optical properties of the sample and how to get beyond the correlated μ-PL and LA-TAP analysis with a coupled approach allowing to perform the two analyses within the same instrument.
authors.affiliation: Groupe de Physique des Matériaux, UMR CNRS 6643, INSA et Université de Rouen, St Etienne du Rouvray, France. Electronic address: lorenzo.rigutti@univ-rouen.fr.
authors.forename: Lorenzo
authors.initials: L
authors.lastname: Rigutti
authors.forename: Angela
authors.initials: A
authors.lastname: Vella
authors.forename: François
authors.initials: F
authors.lastname: Vurpillot
authors.forename: Aurore
authors.initials: A
authors.lastname: Gaillard
authors.forename: Nicolas
authors.initials: N
authors.lastname: Sevelin-Radiguet
authors.forename: Jonathan
authors.initials: J
authors.lastname: Houard
authors.forename: Ammar
authors.initials: A
authors.lastname: Hideur
authors.forename: Gilles
authors.initials: G
authors.lastname: Martel
authors.forename: Gwénolé
authors.initials: G
authors.lastname: Jacopin
authors.forename: Andrés
authors.initials: A
authors.lastname: De Luna Bugallo
authors.forename: Bernard
authors.initials: B
authors.lastname: Deconihout
keywords: Atom probe tomography; Instrumental developement; Photoluminescence; Semiconductors