title: Empirical mode decomposition based background removal and de-noising in polarization interference imaging spectrometer.
abstract: Based on empirical mode decomposition (EMD), the background removal and de-noising procedures of the data taken by polarization interference imaging interferometer (PIIS) are implemented. Through numerical simulation, it is discovered that the data processing methods are effective. The assumption that the noise mostly exists in the first intrinsic mode function is verified, and the parameters in the EMD thresholding de-noising methods is determined. In comparison, the wavelet and windowed Fourier transform based thresholding de-noising methods are introduced. The de-noised results are evaluated by the SNR, spectral resolution and peak value of the de-noised spectrums. All the methods are used to suppress the effect from the Gaussian and Poisson noise. The de-noising efficiency is higher for the spectrum contaminated by Gaussian noise. The interferogram obtained by the PIIS is processed by the proposed methods. Both the interferogram without background and noise free spectrum are obtained effectively. The adaptive and robust EMD based methods are effective to the background removal and de-noising in PIIS.
authors.affiliation: School of science, Xi’an Jiaotong University, Xi’an 710049, China. zcm@mail.xjtu.edu.cn
authors.forename: Chunmin
authors.initials: C
authors.lastname: Zhang
authors.forename: Wenyi
authors.initials: W
authors.lastname: Ren
authors.forename: Tingkui
authors.initials: T
authors.lastname: Mu
authors.forename: Lili
authors.initials: L
authors.lastname: Fu
authors.forename: Chenling
authors.initials: C
authors.lastname: Jia
mesh_terms: D000465:Algorithms; D016477:Artifacts; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007368:Interferometry / Q000295:instrumentation*; D012031:Refractometry / Q000295:instrumentation*; D059629:Signal-To-Noise Ratio