title: Near-infrared Hong-Ou-Mandel interference on a silicon quantum photonic chip.
abstract: Near-infrared Hong-Ou-Mandel quantum interference is observed in silicon nanophotonic directional couplers with raw visibilities on-chip at 90.5%. Spectrally-bright 1557-nm two-photon states are generated in a periodically-poled KTiOPO₄ waveguide chip, serving as the entangled photon source and pumped with a self-injection locked laser, for the photon statistical measurements. Efficient four-port coupling in the communications C-band and in the high-index-contrast silicon photonics platform is demonstrated, with matching theoretical predictions of the quantum interference visibility. Constituents for the residual quantum visibility imperfection are examined, supported with theoretical analysis of the sequentially-triggered multipair biphoton, towards scalable high-bitrate quantum information processing and communications. The on-chip HOM interference is useful towards scalable high-bitrate quantum information processing and communications.
authors.affiliation: Optical Nanostructures Laboratory, Center for Integrated Science and Engineering, Solid-State Science and Engineering, and Mechanical Engineering, Columbia University, New York, New York 10027, USA.
authors.forename: Xinan
authors.initials: X
authors.lastname: Xu
authors.forename: Zhenda
authors.initials: Z
authors.lastname: Xie
authors.forename: Jiangjun
authors.initials: J
authors.lastname: Zheng
authors.forename: Junlin
authors.initials: J
authors.lastname: Liang
authors.forename: Tian
authors.initials: T
authors.lastname: Zhong
authors.forename: Mingbin
authors.initials: M
authors.lastname: Yu
authors.forename: Serdar
authors.initials: S
authors.lastname: Kocaman
authors.forename: Guo-Qiang
authors.initials: GQ
authors.lastname: Lo
authors.forename: Dim-Lee
authors.initials: DL
authors.lastname: Kwong
authors.forename: Dirk R
authors.initials: DR
authors.lastname: Englund
authors.forename: Franco N C
authors.initials: FN
authors.lastname: Wong
authors.forename: Chee Wei
authors.initials: CW
authors.lastname: Wong
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D007259:Infrared Rays; D008027:Light; D008422:Materials Testing; D017785:Photons; D012031:Refractometry / Q000295:instrumentation*; D012542:Scattering, Radiation; D012825:Silicon / Q000737:chemistry*; D020349:Surface Plasmon Resonance / Q000295:instrumentation*
chemical_list: D012825:Silicon