title: Comparison of ionisation chamber and semiconductor detector devices for measurement of the dose-width product for panoramic dental units.
abstract: Doses for panoramic dental radiography are assessed in terms of the dose-width product (DWP) or dose-area product, which gives a measure of the radiation through a whole exposure. The DWP can be measured using a pencil ionisation chamber (IC) similar to that used for computed tomography dose assessment. However, ICs are sensitive to radiation incident from all directions and so backscatter from the image receptor may increase the recorded dose. This study compares measurements performed using four options: a pencil IC mounted straight on the image receptor, the IC mounted with a steel plate to the rear to standardise scatter conditions, the IC mounted with a steel plate and lead collimators in front to minimise the effect of extra-focal radiation, and a Quart Dido employing a one square centimetre semiconductor detector (SD) designed for panoramic measurements. The results indicate that modification of the current method by incorporating a steel plate reduced the measurement dose by 7% on average, but the reduction was greater for units with semiconductor imaging plates. The measurements with the SD agree more closely with the IC with the steel plate to the rear. An IC with a backing plate to standardise scatter or a suitable SD is recommended for measurement on panoramic dental units.
authors.affiliation: Health Physics, Department of Clinical Physics and Bio-Engineering, Gartnavel Royal Hospital, 1055 Great Western Road, Glasgow, UK. stephen.mitchell@ggc.scot.nhs.uk
authors.forename: S A
authors.initials: SA
authors.lastname: Mitchell
authors.forename: C J
authors.initials: CJ
authors.lastname: Martin
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis / Q000295:instrumentation* / Q000379:methods*; D011829:Radiation Dosage; D011862:Radiography, Panoramic / Q000295:instrumentation*; D011874:Radiometry / Q000295:instrumentation*; D015203:Reproducibility of Results; D012666:Semiconductors; D012680:Sensitivity and Specificity