title: Decoupling of geometric thickness and refractive index in quantitative phase microscopy.
abstract: In quantitative phase imaging, a priori knowledge of either refractive index or physical thickness is used to estimate the change in one of these parameters. Here, we report a method for decoupling geometric thickness from refractive index in quantitative phase microscopy.
authors.affiliation: Biophysics and Physiology Lab, Department of Physics, University of Texas-Arlington, Texas 76019, USA.
authors.forename: Nelson
authors.initials: N
authors.lastname: Cardenas
authors.forename: Samarendra
authors.initials: S
authors.lastname: Mohanty
mesh_terms: D008853:Microscopy / Q000379:methods*; D008863:Microspheres; D055620:Optical Phenomena; D011137:Polystyrenes / Q000737:chemistry
chemical_list: D011137:Polystyrenes