title: Cross-section metal sample preparations for transmission electron microscopy by electro-deposition and electropolishing.
abstract: A cross-section sample preparation technique is described for transmission electron microscopy studies of metallic materials. The technique uses jet electro-polishing for the final perforation. Examples are provided of using this technique for copper-support/copper-films/copper-support multilayer structures, grown by electro-deposition. The samples prepared by our current technique are compared with the ones made by ion-milling. The technique is also applicable to materials which are susceptible to ion beam and thermal damages.
authors.affiliation: National High Magnetic Field Laboratory, Tallahassee, FL 32310, USA.
authors.forename: Rongmei
authors.initials: R
authors.lastname: Niu
authors.forename: Ke
authors.initials: K
authors.lastname: Han