title: Electron tomographic resolution of microns-thick specimens in the ultrahigh voltage electron microscope.
abstract: In this study, we determine the electron tomography (ET) resolution for microns-thick specimens by experiment in the ultra-high voltage electron microscope. A tilt series of projection images of a tilted 8μm thick epoxy-resin film are first acquired. Tomographic reconstructions are then calculated and the resolution is evaluated with the Fourier shell correlation method. The ET resolution of 32nm is achieved under the condition of 2MV accelerating voltage. We also demonstrate that some high tilt angle projections may be little useful for improving the final ET resolution because of the corresponding poor image qualities. These results are helpful to understand the possibility and limitation of ET applications in microns-thick specimens.
authors.affiliation: Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Department of Electronic Science and Technology, Xi'an Jiaotong University, Xi'an 710049, People's Republic of China.
authors.forename: Meng
authors.initials: M
authors.lastname: Cao
authors.forename: Fang
authors.initials: F
authors.lastname: Wang
authors.forename: Zhi-Wei
authors.initials: ZW
authors.lastname: Qiao
authors.forename: Hai-Bo
authors.initials: HB
authors.lastname: Zhang
authors.forename: Ryuji
authors.initials: R
authors.lastname: Nishi