title: Torsional resonance mode magnetic force microscopy: enabling higher lateral resolution magnetic imaging without topography-related effects.
abstract: We present experimental work that reveals the benefits of performing magnetic force microscopy measurements employing the torsional resonance mode of cantilever oscillation. This approach provides two clear advantages: the ability of performing magnetic imaging without topography-related interference and the significant lateral resolution improvement (approximately 15%). We believe that this work demonstrates a significant improvement to a versatile magnetic imaging technique widely used in academia and in industry.
authors.affiliation: IMM-Instituto de Microelectrónica de Madrid (CNM-CSIC), Isaac Newton 8, PTM, E-28760 Tres Cantos, Madrid, Spain. andreas.kaidatzis@imm.cnm.csic.es
authors.forename: A
authors.initials: A
authors.lastname: Kaidatzis
authors.forename: J M
authors.initials: JM
authors.lastname: García-Martín
mesh_terms: D004867:Equipment Design; D008280:Magnetics / Q000295:instrumentation*; D018625:Microscopy, Atomic Force / Q000295:instrumentation*; D013499:Surface Properties; D054159:Torsion, Mechanical