title: A flange on electron spectromicroscope with spherical deflector analyzer--simultaneous imaging of reciprocal and real spaces.
abstract: An instrumental realization of the idea for the electron emission spectromicroscope based on the newly developed imaging energy filter called α-SDA (Spherical Deflector Analyzer) is reported. Its compact design enables the realization of the flange-on spectromicroscope concept. It is equipped with two independent energy selective imaging channels: one for real and another for reciprocal space visualization. These images can be acquired quasi-simultaneousely by means of the software based on the switching on and off potentials of the energy filter. An electron gun located inside the immersion objective lens allows a new kind of sample illumination by high energy primary electrons and thus, opens a new application field for electron spectromicroscopy under laboratory conditions.
authors.affiliation: OPTICON Nanotechnology, Muchoborska 18, PL54-424 Wroclaw, Poland. kgrzelakowski@op.pl
authors.forename: Krzysztof P
authors.initials: KP
authors.lastname: Grzelakowski
keywords: Chemical mapping; EFPEEM; Electron microscope; Electron spectromicroscope; Emission electron microscopy; Energy selective imaging; Imaging ESCA; Imaging energy analyzer; Imaging energy filter; SPELEEM; XPEEM