title: Resonant elastic soft x-ray scattering.
abstract: Resonant (elastic) soft x-ray scattering (RSXS) offers a unique element, site and valence specific probe to study spatial modulations of charge, spin and orbital degrees of freedom in solids on the nanoscopic length scale. It is not only used to investigate single-crystalline materials. This method also enables one to examine electronic ordering phenomena in thin films and to zoom into electronic properties emerging at buried interfaces in artificial heterostructures. During the last 20 years, this technique, which combines x-ray scattering with x-ray absorption spectroscopy, has developed into a powerful probe to study electronic ordering phenomena in complex materials and furthermore delivers important information on the electronic structure of condensed matter. This review provides an introduction to the technique, covers the progress in experimental equipment, and gives a survey on recent RSXS studies of ordering in correlated electron systems and at interfaces.
authors.affiliation: Leibniz-Institute for Solid State and Materials Research Dresden, PO Box 270116, D-01171 Dresden, Germany. J.Fink@ifw-dresden.de
authors.forename: J
authors.initials: J
authors.lastname: Fink
authors.forename: E
authors.initials: E
authors.lastname: Schierle
authors.forename: E
authors.initials: E
authors.lastname: Weschke
authors.forename: J
authors.initials: J
authors.lastname: Geck
mesh_terms: D018360:Crystallography, X-Ray; D004548:Elasticity; D008027:Light; D013057:Spectrum Analysis; D014961:X-Ray Diffraction / Q000379:methods*