title: Complete spatial characterization of an optical wavefront using a variable-separation pinhole pair.
abstract: We present a technique for measuring the transverse spatial properties of an optical wavefront. Intensity and phase profiles are recovered by analysis of a series of interference patterns produced by the combination of a scanning X-shaped slit and a static horizontal slit; the spatial coherence may be found from the same data. We demonstrate the technique by characterizing high harmonic radiation generated in a gas cell, however the method could be extended to a wide variety of light sources.
authors.affiliation: Department of Physics, University of Oxford, Clarendon Laboratory, Oxford, UK. d.lloyd1@physics.ox.ac.uk
authors.forename: David T
authors.initials: DT
authors.lastname: Lloyd
authors.forename: Kevin
authors.initials: K
authors.lastname: O'Keeffe
authors.forename: Simon M
authors.initials: SM
authors.lastname: Hooker