title: Reflectometry based on a frequency-shifted interferometer using sideband interference.
abstract: Frequency-shifted interferometry has shown great potential in optical fiber sensor multiplexing. In this letter, we propose and demonstrate a frequency-shifted interferometer (FSI) based on sideband interference. Comparing with previous implementation of FSI based on a Sagnac interferometer, this scheme is much simpler and compact. By scanning the driving frequency of a LiNbO3 phase modulator in the range of 4.5-5.5 GHz, we demonstrate a spatial resolution of 0.1 m, which is 50 times better than the previously reported results.
authors.affiliation: Center for Quantum Information and Quantum Control, University of Toronto, Toronto, Ontario, Canada. bing.qi@utoronto.ca
authors.forename: Bing
authors.initials: B
authors.lastname: Qi
authors.forename: Fei
authors.initials: F
authors.lastname: Ye
authors.forename: Li
authors.initials: L
authors.lastname: Qian
authors.forename: Hoi-Kwong
authors.initials: HK
authors.lastname: Lo