title: Critical evaluation of the potential of radiofrequency pulsed glow discharge-time-of-flight mass spectrometry for depth-profile analysis of innovative materials.
abstract: The combination of radiofrequency pulsed glow discharge (RF-PGD) analytical plasmas with time-of-flight mass spectrometry (TOFMS) has promoted the applicability of this ion source to direct analysis of innovative materials. In this sense, this emerging technique enables multi-elemental depth profiling with high depth resolution and sensitivity, and simultaneous production of elemental, structural, and molecular information. The analytical potential and trends of this technique are critically presented, including comparison with other complementary and well-established techniques (e.g. SIMS, GD-OES, etc.). An overview of recent applications of RF-PGD-TOFMS is given, including analysis of nano-structured materials, coated-glasses, photovoltaic materials, and polymer coatings.
authors.affiliation: Department of Physics, University of Oviedo, c/ Gonzalo Gutiérrez Quirós, Campus de Mieres, 33600, Mieres, Spain. pisonerojorge@uniovi.es
authors.forename: Jorge
authors.initials: J
authors.lastname: Pisonero
authors.forename: Nerea
authors.initials: N
authors.lastname: Bordel
authors.forename: Claudia
authors.initials: C
authors.lastname: Gonzalez de Vega
authors.forename: Beatriz
authors.initials: B
authors.lastname: Fernández
authors.forename: Rosario
authors.initials: R
authors.lastname: Pereiro
authors.forename: Alfredo
authors.initials: A
authors.lastname: Sanz-Medel