title: Interference effects in the UV(VUV)-excited luminescence spectroscopy of thin dielectric films.
abstract: The problem of exciting UV and VUV light interference affecting experimental photoluminescence excitation spectra is analysed for the case of thin transparent films containing arbitrarily distributed emission centres. A numerical technique and supplied software aimed at modelling the phenomenon and correcting the distorted spectra are proposed. Successful restoration results of the experimental synchrotron data for ion-implanted silica films show that the suggested method has high potential.
authors.affiliation: Institute of Physics and Technology, Ural Federal University, Mira St 19, Ekaterinburg, Russian Federation. e.a.buntov@ustu.ru
authors.forename: Evgeny
authors.initials: E
authors.lastname: Buntov
authors.forename: Anatoly
authors.initials: A
authors.lastname: Zatsepin
mesh_terms: D016477:Artifacts; D017097:Electric Impedance; D008029:Lighting / Q000379:methods*; D008163:Luminescent Measurements / Q000379:methods*; D008567:Membranes, Artificial; D012542:Scattering, Radiation; D013057:Spectrum Analysis / Q000379:methods*; D014466:Ultraviolet Rays
chemical_list: D008567:Membranes, Artificial
keywords: Fresnel equations; interference modelling; photoluminescence; thin films