title: Time-resolved magnetic imaging in an aberration-corrected, energy-filtered photoemission electron microscope.
abstract: We report on the implementation and usage of a synchrotron-based time-resolving operation mode in an aberration-corrected, energy-filtered photoemission electron microscope. The setup consists of a new type of sample holder, which enables fast magnetization reversal of the sample by sub-ns pulses of up to 10 mT. Within the sample holder current pulses are generated by a fast avalanche photo diode and transformed into magnetic fields by means of a microstrip line. For more efficient use of the synchrotron time structure, we developed an electrostatic deflection gating mechanism capable of beam blanking within a few nanoseconds. This allows us to operate the setup in the hybrid bunch mode of the storage ring facility, selecting one or several bright singular light pulses which are temporally well-separated from the normal high-intensity multibunch pulse pattern.
authors.affiliation: Peter Grünberg Institut PGI-6 "Electronic Properties", Research Center Jülich, 52425 Jülich, Germany. fl.nickel@fz-juelich.de
authors.forename: F
authors.initials: F
authors.lastname: Nickel
authors.forename: D M
authors.initials: DM
authors.lastname: Gottlob
authors.forename: I P
authors.initials: IP
authors.lastname: Krug
authors.forename: H
authors.initials: H
authors.lastname: Doganay
authors.forename: S
authors.initials: S
authors.lastname: Cramm
authors.forename: A M
authors.initials: AM
authors.lastname: Kaiser
authors.forename: G
authors.initials: G
authors.lastname: Lin
authors.forename: D
authors.initials: D
authors.lastname: Makarov
authors.forename: O G
authors.initials: OG
authors.lastname: Schmidt
authors.forename: C M
authors.initials: CM
authors.lastname: Schneider
keywords: Aberration correction; Photoemission electron microscopy; TR-PEEM; X-PEEM