title: Sensitivity enhancement for evanescent-wave sensing using cavity-ring-down ellipsometry.
abstract: We demonstrate a method to increase the sensitivity of the s-p phase shift under total internal reflection (TIR) for optical sensing. This is achieved by the introduction of two simple dielectric layers to the TIR surface of a fused silica prism. The enhanced sensitivity is demonstrated using evanescent-wave cavity-ring-down-ellipsometry by measuring the refractive index of liquid mixtures and by studying the adsorption of polymers to the TIR surface of the fused silica prism.
authors.affiliation: Institute of Electronic Structure and Laser, Foundation for Research and Technology-Hellas, Heraklion-Crete 71110, Greece.
authors.forename: Dimitris
authors.initials: D
authors.lastname: Sofikitis
authors.forename: Katerina
authors.initials: K
authors.lastname: Stamataki
authors.forename: Michael A
authors.initials: MA
authors.lastname: Everest
authors.forename: Vassilis
authors.initials: V
authors.lastname: Papadakis
authors.forename: Jean-Louis
authors.initials: JL
authors.lastname: Stehle
authors.forename: Benoit
authors.initials: B
authors.lastname: Loppinet
authors.forename: T Peter
authors.initials: TP
authors.lastname: Rakitzis