title: Ultrafast optical wide field microscopy.
abstract: We have developed a new imaging method, ultrafast optical wide field microscopy, capable of rapidly acquiring wide field images of nearly any sample in a non-contact manner with high spatial and temporal resolution. Time-resolved images of the photoinduced changes in transmission for a patterned semiconductor thin film and a single silicon nanowire after optical excitation are captured using a two-dimensional smart pixel array detector. These images represent the time-dependent carrier dynamics with high sensitivity, femtosecond time resolution and sub-micrometer spatial resolution.
authors.affiliation: Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA.
authors.forename: M
authors.initials: M
authors.lastname: Seo
authors.forename: S
authors.initials: S
authors.lastname: Boubanga-Tombet
authors.forename: J
authors.initials: J
authors.lastname: Yoo
authors.forename: Z
authors.initials: Z
authors.lastname: Ku
authors.forename: A V
authors.initials: AV
authors.lastname: Gin
authors.forename: S T
authors.initials: ST
authors.lastname: Picraux
authors.forename: S R J
authors.initials: SR
authors.lastname: Brueck
authors.forename: A J
authors.initials: AJ
authors.lastname: Taylor
authors.forename: R P
authors.initials: RP
authors.lastname: Prasankumar
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000295:instrumentation*; D008853:Microscopy / Q000295:instrumentation*