title: Versatility of a hard X-ray Kirkpatrick-Baez focus characterized by ptychography.
abstract: In the past decade Kirkpatrick-Baez (KB) mirrors have been established as powerful focusing systems in hard X-ray microscopy applications. Here a ptychographic characterization of the KB focus in the dedicated nano-imaging setup GINIX (Göttingen Instrument for Nano-Imaging with X-rays) at the P10 coherence beamline of the PETRA III synchrotron at HASLYLAB/DESY, Germany, is reported. More specifically, it is shown how aberrations in the KB beam, caused by imperfections in the height profile of the focusing mirrors, can be eliminated using a pinhole as a spatial filter near the focal plane. A combination of different pinhole sizes and illumination conditions of the KB setup makes the prepared optical setup well suited not only for high-resolution ptychographic coherent X-ray diffractive imaging but also for moderate-resolution/large-field-of-view propagation imaging in the divergent KB beam.
authors.affiliation: Institut für Röntgenphysik, Georg-August-Universität Göttingen, Göttingen, Germany. klaus.giewekemeyer@xfel.eu
authors.forename: Klaus
authors.initials: K
authors.lastname: Giewekemeyer
authors.forename: Robin N
authors.initials: RN
authors.lastname: Wilke
authors.forename: Markus
authors.initials: M
authors.lastname: Osterhoff
authors.forename: Matthias
authors.initials: M
authors.lastname: Bartels
authors.forename: Sebastian
authors.initials: S
authors.lastname: Kalbfleisch
authors.forename: Tim
authors.initials: T
authors.lastname: Salditt
mesh_terms: D003198:Computer Simulation; D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007909:Lenses; D008853:Microscopy / Q000295:instrumentation* / Q000379:methods*; D008962:Models, Theoretical; D011856:Radiographic Image Enhancement / Q000295:instrumentation* / Q000379:methods*
keywords: Kirkpatrick–Baez mirrors; beamlines and optics; imaging; ptychography