title: An optical test for identifying topological insulator thin films.
abstract: As the search for new compounds of a topological insulator (TI) becomes more extensive, it is increasingly important to develop an experimental technique that can identify TIs. In this work, we theoretically propose a simple optical method for distinguishing between topological and conventional insulator thin films. An electromagnetic interference wave consisting of waves transmitted through and reflected by the TI thin film is sensitive to the circular polarization direction of the incident electromagnetic wave. Based on this fact, we can identify a TI by observing the interference wave. This method is straightforward, and thus should propel TI research.
authors.affiliation: National Institute for Materials Science, 1-1 Namiki, Tsukuba, 305-0044 Japan. inoue.junichi@nims.go.jp
authors.forename: Jun-ichi
authors.initials: J
authors.lastname: Inoue
mesh_terms: D004553:Electric Conductivity; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008422:Materials Testing / Q000295:instrumentation*; D008567:Membranes, Artificial; D012031:Refractometry / Q000295:instrumentation*; D020349:Surface Plasmon Resonance / Q000295:instrumentation*
chemical_list: D008567:Membranes, Artificial