title: Stretching single atom contacts at multiple subatomic step-length.
abstract: This work describes jump-to-contact STM-break junction experiments leading to novel statistical distribution of last-step length associated with conductance of a single atom contact. Last-step length histograms are observed with up to five for Fe and three for Cu peaks at integral multiples close to 0.075 nm, a subatomic distance. A model is proposed in terms of gliding from a fcc hollow-site to a hcp hollow-site of adjacent atomic planes at 1/3 regular layer spacing along with tip stretching to account for the multiple subatomic step-length behavior.
authors.affiliation: State Key Laboratory of Physical Chemistry of Solid Surfaces and College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, Fujian, China.
authors.forename: Yi-Min
authors.initials: YM
authors.lastname: Wei
authors.forename: Jing-Hong
authors.initials: JH
authors.lastname: Liang
authors.forename: Zhao-Bin
authors.initials: ZB
authors.lastname: Chen
authors.forename: Xiao-Shun
authors.initials: XS
authors.lastname: Zhou
authors.forename: Bing-Wei
authors.initials: BW
authors.lastname: Mao
authors.forename: Oscar A
authors.initials: OA
authors.lastname: Oviedo
authors.forename: Ezequiel P M
authors.initials: EP
authors.lastname: Leiva