title: Automatic crystallographic characterization in a transmission electron microscope: applications to twinning induced plasticity steels and Al thin films.
abstract: A new automated crystallographic orientation mapping tool in a transmission electron microscope technique, which is based on pattern matching between every acquired electron diffraction pattern and precalculated templates, has been used for the microstructural characterization of nondeformed and deformed aluminum thin films and twinning-induced plasticity steels. The increased spatial resolution and the use of electron diffraction patterns rather than Kikuchi lines make this tool very appropriate to characterize fine grained and deformed microstructures.
authors: 4MAT (Materials Engineering, Characterization, Synthesis and Recycling), Université Libre de Bruxelles, Avenue F.D. Roosevelt 50, 1050 Brussels, Belgium. mgalcera@ulb.ac.be
authors: M
authors: M
authors: Galceran
authors: A
authors: A
authors: Albou
authors: K
authors: K
authors: Renard
authors: M
authors: M
authors: Coulombier
authors: P J
authors: PJ
authors: Jacques
authors: S
authors: S
authors: Godet