title: Exploring electronic transport in molecular junctions by conducting atomic force microscopy.
abstract: Measuring the electronic transport properties of single molecules and molecular nanostructuresis an interesting and challenging new frontier from both a fundamental as well as technologicalperspective. Conducting atomic force microscopy (C-AFM) represents an attractive line of approachgiven its ability to position a sharp electrical probe with nanometer-scale precision and a controllednano-Newton-range force. Moreover, the combination of AFM imaging and C-AFM electrical characterizationenables investigation of the relationship between structure and function in molecular architectures.The aim of the present review is twofold: (1) to introduce the C-AFM method, alongside a discussionof experimental practices, capabilities and limitations, and (2) to provide an overview of the applicationof C-AFM to different types of molecular systems. These include alkane-based and oligomer-based self-assembledmonolayers, molecular crystals, conducting polymer films, molecular wires (e.g. carbon nanotubes),and electrically active biomolecules. We will also discuss C-AFM approaches that allow single moleculemeasurements as well as other recent developments.
authors: Institut de Science et d'Ingénierie Supramoléculaires (ISIS) - CNRS7006, Université Louis Pasteur, 8 Allée Gaspard Monge, F-67000, Strasbourg, France.
authors: Jeffrey M
authors: JM
authors: Mativetsky
authors: Matteo
authors: M
authors: Palma
authors: Paolo
authors: P
authors: Samorì