title: Apparatus for measuring the Seebeck coefficients of highly resistive organic semiconducting materials.
abstract: A Seebeck coefficient measurement apparatus for high resistance organic semiconductor materials has been designed and built. It can measure materials with resistance over 7 × 10(12) Ω. This is the highest material resistance value ever reported for Seebeck coefficient measurement. A cyclic temperature gradient generation technique and a corresponding algorithm are proposed to eliminate the negative effects of the long term drift of Seebeck voltage. Sources of errors in these measurements are discussed.
authors: State Key Laboratory of Transducer Technology, Institute of Electronics, Chinese Academy of Sciences, China. hycai@mail.ie.ac.cn
authors: H Y
authors: HY
authors: Cai
authors: D F
authors: DF
authors: Cui
authors: Y T
authors: YT
authors: Li
authors: X
authors: X
authors: Chen
authors: L L
authors: LL
authors: Zhang
authors: J H
authors: JH
authors: Sun