title: Separate-type scanner and wideband high-voltage amplifier for atomic-resolution and high-speed atomic force microscopy.
abstract: We have developed a liquid-environment atomic force microscope with a wideband and low-noise scanning system for atomic-scale imaging of dynamic processes at solid/liquid interfaces. The developed scanning system consists of a separate-type scanner and a wideband high-voltage amplifier (HVA). By separating an XY-sample scanner from a Z-tip scanner, we have enabled to use a relatively large sample without compromising the high resonance frequency. We compared various cantilever- and sample-holding mechanisms by experiments and finite element analyses for optimizing the balance between the usability and frequency response characteristics. We specifically designed the HVA to drive the developed scanners, which enabled to achieve the positioning accuracy of 5.7 and 0.53 pm in the XY and Z axes, respectively. Such an excellent noise performance allowed us to perform atomic-resolution imaging of mica and calcite in liquid. Furthermore, we demonstrate in situ and atomic-resolution imaging of the calcite crystal growth process in water.
authors: Division of Electrical Engineering and Computer Science, Kanazawa University, Kakuma-machi, Kanazawa 920-1192, Japan.
authors: Kazuki
authors: K
authors: Miyata
authors: Satoshi
authors: S
authors: Usho
authors: Satoshi
authors: S
authors: Yamada
authors: Shoji
authors: S
authors: Furuya
authors: Kiyonori
authors: K
authors: Yoshida
authors: Hitoshi
authors: H
authors: Asakawa
authors: Takeshi
authors: T
authors: Fukuma