title: Note: Submicrometer-precision sample holder for accurate re-positioning of samples in scanning force microscopy.
abstract: In this work we describe two simple and compact submicrometer-precision sample holders that are easily integrated into a Scanning Force Microscopy (SFM) system. The designs are based on a traditional kinematic mounting or on self-adjustment of the sample holder and the upper piece of the piezoelectric scanner. With these sample holders the sample position is automatically recovered to within about 100 nm. The setup allows ex situ manipulation of the sample and SFM imaging of the same region without the aid of an optical microscope, positioning marks, and tedious re-allocation.
authors: Instituto Universitario de Investigación en Óptica y Nanofísica (IUOyN), Campus Espinardo, Universidad de Murcia, E-30100 Murcia, Spain. jose.abad@upct.es
authors: José
authors: J
authors: Abad
authors: Juan Francisco
authors: JF
authors: González Martínez
authors: Jaime
authors: J
authors: Colchero