title: Uniformity of the lasing wavelength of heterogeneously integrated InP microdisk lasers on SOI.
abstract: We report a high lasing wavelength uniformity of optically pumped InP-based microdisk lasers processed with electron-beam lithography, heterogeneously integrated with adhesive bonding on silicon-on-insulator (SOI) waveguide circuits and evanescently coupled to an underlying waveguide. We study the continuous wave laser emission coupling out of the SOI via a grating coupler etched at one side of the waveguide, and demonstrate a standard deviation in lasing wavelength of nominally identical devices on the same chip lower than 500 pm. The deviation in the diameter of the microdisks as low as a few nanometers makes all-optical signal processing applications requiring cascadability possible.
authors.affiliation: 1imec - Ghent University, Photonics Research Group, Department of Information Technology, INTEC, Sint-Pietersnieuwstraat 41, 9000 Ghent, Belgium. Pauline.Mechet@intec.ugent.be
authors.forename: P
authors.initials: P
authors.lastname: Mechet
authors.forename: F
authors.initials: F
authors.lastname: Raineri
authors.forename: A
authors.initials: A
authors.lastname: Bazin
authors.forename: Y
authors.initials: Y
authors.lastname: Halioua
authors.forename: T
authors.initials: T
authors.lastname: Spuesens
authors.forename: T J
authors.initials: TJ
authors.lastname: Karle
authors.forename: P
authors.initials: P
authors.lastname: Regreny
authors.forename: P
authors.initials: P
authors.lastname: Monnier
authors.forename: D
authors.initials: D
authors.lastname: Van Thourhout
authors.forename: I
authors.initials: I
authors.lastname: Sagnes
authors.forename: R
authors.initials: R
authors.lastname: Raj
authors.forename: G
authors.initials: G
authors.lastname: Roelkens
authors.forename: G
authors.initials: G
authors.lastname: Morthier
mesh_terms: D004553:Electric Conductivity; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007204:Indium / Q000737:chemistry*; D007834:Lasers; D010720:Phosphines / Q000737:chemistry*; D012031:Refractometry / Q000295:instrumentation*; D012825:Silicon / Q000737:chemistry*; D020349:Surface Plasmon Resonance / Q000295:instrumentation*; D018511:Systems Integration
chemical_list: D010720:Phosphines; D007204:Indium; C090882:indium phosphide; D012825:Silicon