title: Small-angle electron scattering of magnetic fine structures.
abstract: Magnetic structures in magnetic artificial lattices and chiral magnetic orders in chiral magnets have been quantitatively analyzed in the reciprocal space by means of small-angle electron scattering (SAES) method. Lorentz deflection due to magnetic moments and Bragg diffraction due to periodicity are simultaneously recorded at an angle of the order of or less than 1 × 10(-6) rad, using a camera length of more than 100 m. The present SAES method, together with TEM real-space imaging methods such as in-situ Lorentz microscopy, is very powerful in analyzing magnetic fine structures in magnetic materials. Indeed, the existence of both a chiral helimagnetic structure and a chiral magnetic soliton lattice in a chiral magnet CrNb3S6 has been successfully verified for the first time using the present complementary methods.
authors.affiliation: Nanoscience and Nanotechnology Research Center (N2RC), Research Institutes for the Twenty First Century, Osaka Prefecture University, Gakuencho 1-2, Naka-ku, Sakai, Osaka 599-8570, Japan. y-togawa@21c.osakafu-u.ac.jp
authors.forename: Yoshihiko
authors.initials: Y
authors.lastname: Togawa
keywords: Bragg diffraction; Lorentz deflection; chiral magnet; chiral magnetic order; magnetic artificial lattice; small-angle electron scattering (SAES)