title: Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography.
abstract: Convergent beam electron diffraction (CBED), nano-beam electron diffraction (NBED or NBD), high resolution imaging (HRTEM and HRSTEM) and dark field electron holography (DFEH or HoloDark) are five TEM based techniques able to quantitatively measure strain at the nanometer scale. In order to demonstrate the advantages and disadvantages of each technique, two samples composed of epitaxial silicon-germanium layers embedded in a silicon matrix have been investigated. The five techniques are then compared in terms of strain precision and accuracy, spatial resolution, field of view, mapping abilities and ease of performance and analysis.
authors.affiliation: CEA-INAC/UJF-Grenoble UMR-E, SP2M, LEMMA, Minatec Grenoble F-38054, France. armand.beche@ua.ac.be
authors.forename: A
authors.initials: A
authors.lastname: Béché
authors.forename: J L
authors.initials: JL
authors.lastname: Rouvière
authors.forename: J P
authors.initials: JP
authors.lastname: Barnes
authors.forename: D
authors.initials: D
authors.lastname: Cooper
keywords: Convergent beam electron diffraction (CBED); Dark field electron holography (DFEH); High resolution scanning transmission electron microscopy (HRSTEM); High resolution transmission electron microscopy (HRTEM); Nano-beam electron diffraction (NBED or NBD); Strain; Transmission electron microscopy