title: Optical constants of amorphous, transparent titanium-doped tungsten oxide thin films.
abstract: We report on the optical constants and their dispersion profiles determined from spectroscopic ellipsometry (SE) analysis of the 20%-titanium (Ti) doped of tungsten oxide (WO3) thin films grown by sputter-deposition. The Ti-doped WO3 films grown in a wide range of temperatures (25-500 °C) are amorphous and optically transparent. SE data indicates that there is no significant interdiffusion at the film-substrate interface for a W-Ti oxide film growth of ~90 nm. The index refraction (n) at λ = 550 nm vary in the range of 2.17-2.31 with a gradual increase in growth temperature. A correlation between the growth conditions and optical constants is discussed.
authors.affiliation: Department of Mechanical Engineering, University of Texas at El Paso, El Paso, Texas 79968, United States.
authors.forename: C V
authors.initials: CV
authors.lastname: Ramana
authors.forename: Gaurav
authors.initials: G
authors.lastname: Baghmar
authors.forename: Ernesto J
authors.initials: EJ
authors.lastname: Rubio
authors.forename: Manuel J
authors.initials: MJ
authors.lastname: Hernandez