title: Very low energy electron microscopy of graphene flakes.
abstract: Commercially available graphene samples are examined by Raman spectroscopy and very low energy scanning transmission electron microscopy. Limited lateral resolution of Raman spectroscopy may produce a Raman spectrum corresponding to a single graphene layer even for flakes that can be identified by very low energy electron microscopy as an aggregate of smaller flakes of various thicknesses. In addition to diagnostics of graphene samples at larger dimensions, their electron transmittance can also be measured at very low energies.
authors.affiliation: Institute of Scientific Instruments ASCR, v.v.i, Královopolská 147, 61264, Brno, Czech Republic.
authors.forename: E
authors.initials: E
authors.lastname: Mikmeková
authors.forename: H
authors.initials: H
authors.lastname: Bouyanfif
authors.forename: M
authors.initials: M
authors.lastname: Lejeune
authors.forename: I
authors.initials: I
authors.lastname: Müllerová
authors.forename: M
authors.initials: M
authors.lastname: Hovorka
authors.forename: M
authors.initials: M
authors.lastname: Unčovský
authors.forename: L
authors.initials: L
authors.lastname: Frank
keywords: Graphene; very low energy STEM