title: Measurement method for light transmittance of layered metamaterials.
abstract: We propose a method to measure light transmittance of layered metamaterials by placing the metamaterials directly on a Si photodiode. Our measurement method enables the direct detection of transmitted light that appears as an evanescent wave in natural materials. Here, we report the transmittance measurements of a typical metamaterial using this method. The metamaterial was composed of Ag/Al(2)O(3) layers and was fabricated by direct evaporation on the Si photodiode. The measured transmittance agrees with the simulated transmittance. Our results confirmed that this measurement method can determine the transmittance properties of metamaterials and that it is applicable to other types of metamaterials.
authors.affiliation: Department of Mechano-Informatics, Graduate School of Information Science and Technology, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan. a_isozaki@leopard.t.u‑tokyo.ac.jp
authors.forename: Akihiro
authors.initials: A
authors.lastname: Isozaki
authors.forename: Tetsuo
authors.initials: T
authors.lastname: Kan
authors.forename: Yoshiharu
authors.initials: Y
authors.lastname: Ajiki
authors.forename: Kiyoshi
authors.initials: K
authors.lastname: Matsumoto
authors.forename: Isao
authors.initials: I
authors.lastname: Shimoyama