title: [Investigation of characteristic microstructures of adhesive interface in wood/bamboo composite material by synchrotron radiation X-ray phase contrast microscopy].
abstract: Third-generation synchrotron radiation X-ray phase-contrast microscopy(XPCM)can be used for obtaining image with edge enhancement, and achieve the high contrast imaging of low-Z materials with the spatial coherence peculiarity of X-rays. In the present paper, the characteristic microstructures of adhesive at the interface and their penetration in wood/bamboo composite material were investigated systematically by XPCM at Shanghai Synchrotron Radiation Facility (SSRF). And the effect of several processing techniques was analyzed for the adhesive penetration in wood/bamboo materials. The results show that the synchrotron radiation XPCM is expected to be one of the important precision detection methods for wood-based panels.
authors.affiliation: Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, China. pengguanyun@sinap.ac.cn
authors.forename: Guan-Yun
authors.initials: GY
authors.lastname: Peng
authors.forename: Yu-Rong
authors.initials: YR
authors.lastname: Wang
authors.forename: Hai-Qing
authors.initials: HQ
authors.lastname: Ren
authors.forename: Shu-Min
authors.initials: SM
authors.lastname: Yang
authors.forename: Hong-Xia
authors.initials: HX
authors.lastname: Ma
authors.forename: Hong-Lan
authors.initials: HL
authors.lastname: Xie
authors.forename: Biao
authors.initials: B
authors.lastname: Deng
authors.forename: Guo-Hao
authors.initials: GH
authors.lastname: Du
authors.forename: Ti-Qiao
authors.initials: TQ
authors.lastname: Xiao
mesh_terms: D000269:Adhesives; D008420:Manufactured Materials; D008858:Microscopy, Phase-Contrast / Q000379:methods*; D011856:Radiographic Image Enhancement; D031787:Sasa / Q000648:ultrastructure*; D017356:Synchrotrons; D014057:Tomography, X-Ray Computed / Q000379:methods*; D014934:Wood / Q000648:ultrastructure*
chemical_list: D000269:Adhesives