title: Sensing the wavefront of x-ray free-electron lasers using aerosol spheres.
abstract: Characterizing intense, focused x-ray free electron laser (FEL) pulses is crucial for their use in diffractive imaging. We describe how the distribution of average phase tilts and intensities on hard x-ray pulses with peak intensities of 10(21) W/m(2) can be retrieved from an ensemble of diffraction patterns produced by 70 nm-radius polystyrene spheres, in a manner that mimics wavefront sensors. Besides showing that an adaptive geometric correction may be necessary for diffraction data from randomly injected sample sources, our paper demonstrates the possibility of collecting statistics on structured pulses using only the diffraction patterns they generate and highlights the imperative to study its impact on single-particle diffractive imaging.
authors.affiliation: PULSE Institute, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA. duaneloh@slac.stanford.edu
authors.forename: N Duane
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authors.lastname: Loh
authors.forename: Dmitri
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authors.forename: Christina Y
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authors.lastname: Graafsma
authors.forename: Filipe R N C
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authors.lastname: Maia
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authors.lastname: Ekeberg
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authors.lastname: Hantke
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authors.lastname: Fleckenstein
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authors.lastname: Hirsemann
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authors.lastname: Nass
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authors.lastname: White
authors.forename: Herbert J
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authors.lastname: Tobias
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authors.lastname: Farquar
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authors.lastname: Benner
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authors.lastname: Hau-Riege
authors.forename: Christian
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authors.lastname: Reich
authors.forename: Andreas
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authors.lastname: Hartmann
authors.forename: Heike
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authors.lastname: Soltau
authors.forename: Stefano
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authors.lastname: Marchesini
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authors.lastname: Bajt
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authors.lastname: Barthelmess
authors.forename: Lothar
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authors.lastname: Strueder
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authors.lastname: Ullrich
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authors.lastname: Bucksbaum
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authors.lastname: Frank
authors.forename: Ilme
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authors.lastname: Schlichting
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authors.lastname: Chapman
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mesh_terms: D000336:Aerosols / Q000032:analysis* / Q000737:chemistry*; D004583:Electrons; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007834:Lasers; D008863:Microspheres; D010783:Photometry / Q000379:methods*; D012031:Refractometry / Q000379:methods*; D020349:Surface Plasmon Resonance / Q000379:methods*; D014965:X-Rays
chemical_list: D000336:Aerosols