title: Optical design of the short pulse x-ray imaging and microscopy time-angle correlated diffraction beamline at the Advanced Photon Source.
abstract: The short pulse x-ray imaging and microscopy beamline is one of the two x-ray beamlines that will take full advantage of the short pulse x-ray source in the Advanced Photon Source (APS) upgrade. A horizontally diffracting double crystal monochromator which includes a sagittally focusing second crystal will collect most of the photons generated when the chirped electron beam traverses the undulator. A Kirkpatrick-Baez mirror system after the monochromator will deliver to the sample a beam which has an approximately linear correlation between time and vertical beam angle. The correlation at the sample position has a slope of 0.052 ps/μrad extending over an angular range of 800 μrad for a cavity deflection voltage of 2 MV. The expected time resolution of the whole system is 2.6 ps. The total flux expected at the sample position at 10 keV with a 0.9 eV energy resolution is 5.7 × 10(12) photons/s at a spot having horizontal and vertical full width at half maximum of 33 μm horizontal by 14 μm vertical. This new beamline will enable novel time-dispersed diffraction experiments on small samples using the full repetition rate of the APS.
authors.affiliation: Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
authors.forename: R
authors.initials: R
authors.lastname: Reininger
authors.forename: E M
authors.initials: EM
authors.lastname: Dufresne
authors.forename: M
authors.initials: M
authors.lastname: Borland
authors.forename: M A
authors.initials: MA
authors.lastname: Beno
authors.forename: L
authors.initials: L
authors.lastname: Young
authors.forename: K-J
authors.initials: KJ
authors.lastname: Kim
authors.forename: P G
authors.initials: PG
authors.lastname: Evans