title: Compact integrated X-ray intensity and beam position monitor based on rare gas scintillation.
abstract: We have created and tested a compact integrated X-ray beam intensity and position monitor using Ar-gas scintillation. The light generated inside the device's cavity is detected by diametrically opposed PIN diodes located above and below the beam. The intensity is derived from the sum of the top and bottom signals, while the beam position is calculated from the difference-over-sum of the two signals. The device was tested at Cornell High Energy Synchrotron Source with both 17 keV and 59 keV x-rays. For intensity monitoring, the Ar-scintillation monitor performance is comparable to standard ion chambers in terms of precision. As an X-ray beam position monitor the new device response is linear with vertical beam position over a 2 mm span with a precision of 2 μm.
authors.affiliation: Cornell University, Cornell High Energy Synchrotron Source, Ithaca, New York 14853, USA.
authors.forename: Peter
authors.initials: P
authors.lastname: Revesz
authors.forename: Jacob
authors.initials: J
authors.lastname: Ruff
authors.forename: Darren
authors.initials: D
authors.lastname: Dale
authors.forename: Thomas
authors.initials: T
authors.lastname: Krawczyk
mesh_terms: D005741:Noble Gases; D012588:Scintillation Counting / Q000295:instrumentation*; D014965:X-Rays
chemical_list: D005741:Noble Gases