title: Subsurface defects of fused silica optics and laser induced damage at 351 nm.
abstract: Many kinds of subsurface defects are always present together in the subsurface of fused silica optics. It is imperfect that only one kind of defects is isolated to investigate its impact on laser damage. Therefore it is necessary to investigate the impact of subsurface defects on laser induced damage of fused silica optics with a comprehensive vision. In this work, we choose the fused silica samples manufactured by different vendors to characterize subsurface defects and measure laser induced damage. Contamination defects, subsurface damage (SSD), optical-thermal absorption and hardness of fused silica surface are characterized with time-of-flight secondary ion mass spectrometry (TOF-SIMS), fluorescence microscopy, photo-thermal common-path interferometer and fully automatic micro-hardness tester respectively. Laser induced damage threshold and damage density are measured by 351 nm nanosecond pulse laser. The correlations existing between defects and laser induced damage are analyzed. The results show that Cerium element and SSD both have a good correlation with laser-induced damage thresholds and damage density. Research results evaluate process technology of fused silica optics in China at present. Furthermore, the results can provide technique support for improving laser induced damage performance of fused silica.
authors.affiliation: Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China. hongjie3713@163.com
authors.forename: Liu
authors.initials: L
authors.lastname: Hongjie
authors.forename: Huang
authors.initials: H
authors.lastname: Jin
authors.forename: Wang
authors.initials: W
authors.lastname: Fengrui
authors.forename: Zhou
authors.initials: Z
authors.lastname: Xinda
authors.forename: Ye
authors.initials: Y
authors.lastname: Xin
authors.forename: Zhou
authors.initials: Z
authors.lastname: Xiaoyan
authors.forename: Sun
authors.initials: S
authors.lastname: Laixi
authors.forename: Jiang
authors.initials: J
authors.lastname: Xiaodong
authors.forename: Sui
authors.initials: S
authors.lastname: Zhan
authors.forename: Zheng
authors.initials: Z
authors.lastname: Wanguo
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D007834:Lasers; D007909:Lenses; D008422:Materials Testing; D012822:Silicon Dioxide / Q000737:chemistry* / Q000528:radiation effects*; D013499:Surface Properties / Q000528:radiation effects
chemical_list: D012822:Silicon Dioxide