title: Ultra-low crosstalk, CMOS compatible waveguide crossings for densely integrated photonic interconnection networks.
abstract: We explore the design space for optimizing CMOS compatible waveguide crossings on a silicon photonics platform. This paper presents simulated and experimental excess loss and crosstalk suppression data for vertically integrated silicon nitride over silicon-on-insulator waveguide crossings. Experimental results show crosstalk suppression exceeding -49/-44 dB with simulation results as low as -65/-60 dB for the TE/TM mode in a waveguide crossing with a 410 nm vertical gap.
authors.affiliation: Applied Photonic Microsystems, Sandia National Laboratories,Albuquerque, NM 87123, USA. adajone@sandia.gov
authors.forename: Adam M
authors.initials: AM
authors.lastname: Jones
authors.forename: Christopher T
authors.initials: CT
authors.lastname: DeRose
authors.forename: Anthony L
authors.initials: AL
authors.lastname: Lentine
authors.forename: Douglas C
authors.initials: DC
authors.lastname: Trotter
authors.forename: Andrew L
authors.initials: AL
authors.lastname: Starbuck
authors.forename: Robert A
authors.initials: RA
authors.lastname: Norwood
mesh_terms: D016477:Artifacts; D003195:Computer Communication Networks / Q000295:instrumentation*; D004867:Equipment Design; D019544:Equipment Failure Analysis; D017785:Photons; D012031:Refractometry / Q000295:instrumentation*; D012666:Semiconductors; D059629:Signal-To-Noise Ratio; D020349:Surface Plasmon Resonance / Q000295:instrumentation*; D018511:Systems Integration