title: Fundaments of optical far-field subwavelength resolution based on illumination with surface waves.
abstract: We present a general discussion about the fundamental physical principles involved in a novel class of optical superlenses that permit to realize in the far-field direct non-scanning images with subwavelength resolution. Described superlenses are based in the illumination of the object under observation with surface waves excited by fluorescence, the enhanced transmission of fluorescence via coupling with surface waves, and the occurrence of far-field coherence-related fluorescence diffraction phenomena. A Fourier optics description of the image formation based on illumination with surface waves is presented, and several recent experimental realizations of this technique are discussed. Our theoretical approach explains why images with subwavelength resolution can be formed directly in the microscope camera, without involving scanning or numerical post-processing. While resolution of the order of λ/7 has been demonstrated using the described approach, we anticipate that deeper optical subwavelength resolution should be expected.
authors.affiliation: ACE, Barry University, Miami Shores, FL 33161, USA.
authors.forename: Roberto
authors.initials: R
authors.lastname: Lopez-Boada
authors.forename: Charles J
authors.initials: CJ
authors.lastname: Regan
authors.forename: Daniel
authors.initials: D
authors.lastname: Dominguez
authors.forename: Ayrton A
authors.initials: AA
authors.lastname: Bernussi
authors.forename: Luis
authors.initials: L
authors.lastname: Grave de Peralta
mesh_terms: D003198:Computer Simulation; D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007909:Lenses; D008027:Light; D008029:Lighting / Q000295:instrumentation*; D008853:Microscopy / Q000295:instrumentation*; D008962:Models, Theoretical; D012542:Scattering, Radiation