title: Inner structure detection by optical tomography technology based on feedback of microchip Nd:YAG lasers.
abstract: We describe a new optical tomography technology based on feedback of microchip Nd:YAG lasers. In the case of feedback light frequency-shifted, light can be magnified by a fact of 10(6) in the Nd:YAG microchip lasers, which makes it possible to realize optical tomography with a greater depth than current optical tomography. The results of the measuring and imaging of kinds of samples are presented, which demonstrate the feasibility and potential of this approach in the inner structure detection. The system has a lateral resolution of ~1 μm, a vertical resolution of 15 μm and a longitudinal scanning range of over 10mm.
authors.affiliation: Institute of Opto-Electronic Engineering, Tsinghua University, Beijing 100084, China.
authors.forename: Chunxin
authors.initials: C
authors.lastname: Xu
authors.forename: Shulian
authors.initials: S
authors.lastname: Zhang
authors.forename: Yidong
authors.initials: Y
authors.lastname: Tan
authors.forename: Shijie
authors.initials: S
authors.lastname: Zhao
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D005246:Feedback; D007089:Image Enhancement / Q000295:instrumentation*; D007834:Lasers; D008422:Materials Testing / Q000295:instrumentation*; D008904:Miniaturization; D041622:Tomography, Optical / Q000295:instrumentation*