title: X-ray absorption study of the local structure at the NiO/oxide interfaces.
abstract: This work reports an X-ray absorption near-edge structure (XANES) spectroscopy study at the Ni K-edge in the early stages of growth of NiO on non-ordered SiO2, Al2O3 and MgO thin films substrates. Two different coverages of NiO on the substrates have been studied. The analysis of the XANES region shows that for high coverages (80 Eq-ML) the spectra are similar to that of bulk NiO, being identical for all substrates. In contrast, for low coverages (1 Eq-ML) the spectra differ from that of large coverages indicating that the local order around Ni is limited to the first two coordination shells. In addition, the results also suggest the formation of cross-linking bonds Ni-O-M (M = Si, Al, Mg) at the interface.
authors.affiliation: Departamento de Física Aplicada and Instituto de Ciencia de Materiales Nicolás Cabrera, Universidad Autónoma de Madrid, Cantoblanco, 28049 Madrid, Spain.
authors.forename: Iulian
authors.initials: I
authors.lastname: Preda
authors.forename: Leonardo
authors.initials: L
authors.lastname: Soriano
authors.forename: Daniel
authors.initials: D
authors.lastname: Díaz-Fernández
authors.forename: Guillermo
authors.initials: G
authors.lastname: Domínguez-Cañizares
authors.forename: Alejandro
authors.initials: A
authors.lastname: Gutiérrez
authors.forename: Germán R
authors.initials: GR
authors.lastname: Castro
authors.forename: Jesús
authors.initials: J
authors.lastname: Chaboy
keywords: NiO; XANES; oxide/oxide interfaces