title: Density measurement of thin layers by electron energy loss spectroscopy (EELS).
abstract: A method to measure the density of thin layers is presented which utilizes electron energy loss spectroscopy (EELS) techniques within a transmission electron microscope. The method is based on the acquisition of energy filtered images in the low loss region as well as of an element distribution map using core loss edges. After correction of multiple inelastic scattering effects, the intensity of the element distribution map is proportional to density and thickness. The dependence of the intensities of images with low energy loss electrons on the density is different from that. This difference allows the calculation of the relative density pixel by pixel and to determine lateral density gradients or fluctuations in thin films without relying on a constant specimen thickness. The method is demonstrated at thin carbon layers produced with density gradients.
authors.affiliation: IFW Dresden, P.O. Box 270116, D-01171 Dresden, Germany. j.thomas@ifw-dresden.de
authors.forename: Jürgen
authors.initials: J
authors.lastname: Thomas
authors.forename: Jürgen
authors.initials: J
authors.lastname: Ramm
authors.forename: Thomas
authors.initials: T
authors.lastname: Gemming
keywords: Density; EELS; TEM; Thin films