title: Capability of insulator study by photoemission electron microscopy at SPring-8.
abstract: The observation method of photoemission electron microscopy (PEEM) on insulating samples has been established in an extremely simple way. Surface conductivity is induced locally on an insulating surface by continuous radiation of soft X-rays, and Au films close to the area of interest allow the accumulated charges on the insulated area to be released to ground level. Magnetic domain observations of a NiZn ferrite, local X-ray absorption spectroscopy of sapphire, high-resolution imaging of a poorly conducting Li0.9CoO2 film surface, and Au pattern evaporation on a fine rock particle are demonstrated. Using this technique, all users' experiments on poorly conducting samples have been performed successfully at the PEEM experimental station of SPring-8.
authors.affiliation: Japan Synchrotron Radiation Research Institute/SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan. o-taku@spring8.or.jp
authors.forename: Takuo
authors.initials: T
authors.lastname: Ohkochi
authors.forename: Masato
authors.initials: M
authors.lastname: Kotsugi
authors.forename: Keisuke
authors.initials: K
authors.lastname: Yamada
authors.forename: Kenji
authors.initials: K
authors.lastname: Kawano
authors.forename: Koji
authors.initials: K
authors.lastname: Horiba
authors.forename: Fumio
authors.initials: F
authors.lastname: Kitajima
authors.forename: Masaki
authors.initials: M
authors.lastname: Oura
authors.forename: Susumu
authors.initials: S
authors.lastname: Shiraki
authors.forename: Taro
authors.initials: T
authors.lastname: Hitosugi
authors.forename: Masaharu
authors.initials: M
authors.lastname: Oshima
authors.forename: Teruo
authors.initials: T
authors.lastname: Ono
authors.forename: Toyohiko
authors.initials: T
authors.lastname: Kinoshita
authors.forename: Takayuki
authors.initials: T
authors.lastname: Muro
authors.forename: Yoshio
authors.initials: Y
authors.lastname: Watanabe
keywords: PEEM; evaporator; ferrite; insulator; photon-induced surface conductivity