title: Reflection spectra of etched FBGs under the influence of axial contraction and stress-induced index change.
abstract: We present a new theoretical model for the broadband reflection spectra of etched FBGs which includes the effects of axial contraction and stress-induced index change. The reflection spectra of the etched FBGs with several different taper profiles are simulated based on the proposed model. In our observation, decaying exponential profile produces a broadband reflection spectrum with good uniformity over the range of 1540-1560 nm. An etched FBG with similar taper profile is fabricated and the experimental result shows good agreement with the theoretical model.
authors.affiliation: Photonics Research Centre, Dept. of Physics, Faculty of Science, University of Malaya, 50603 Kuala Lumpur, Malaysia.
authors.forename: Hang-Zhou
authors.initials: HZ
authors.lastname: Yang
authors.forename: Kok-Sing
authors.initials: KS
authors.lastname: Lim
authors.forename: Xue-Guang
authors.initials: XG
authors.lastname: Qiao
authors.forename: Wu-Yi
authors.initials: WY
authors.lastname: Chong
authors.forename: Yew-Ken
authors.initials: YK
authors.lastname: Cheong
authors.forename: Weng-Hong
authors.initials: WH
authors.lastname: Lim
authors.forename: Wei-Sin
authors.initials: WS
authors.lastname: Lim
authors.forename: Harith
authors.initials: H
authors.lastname: Ahmad
mesh_terms: D003198:Computer Simulation; D017076:Computer-Aided Design; D055119:Elastic Modulus; D004867:Equipment Design; D019544:Equipment Failure Analysis; D005336:Fiber Optic Technology / Q000295:instrumentation*; D008027:Light; D008962:Models, Theoretical; D012031:Refractometry / Q000295:instrumentation*; D012542:Scattering, Radiation