title: Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?
abstract: Statistical parameter estimation theory is proposed as a quantitative method to measure unknown structure parameters from electron microscopy images. Images are then purely considered as data planes from which structure parameters have to be determined as accurately and precisely as possible using a parametric statistical model of the observations. For this purpose, an efficient algorithm is proposed for the estimation of atomic column positions and intensities from high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) images. Furthermore, the so-called Cramér-Rao lower bound (CRLB) is reviewed to determine the limits to the precision with which continuous parameters such as atomic column positions and intensities can be estimated. Since this lower bound can only be derived for continuous parameters, alternative measures using the principles of detection theory are introduced for problems concerning the estimation of discrete parameters such as atomic numbers. An experimental case study is presented to show the practical use of these measures for the optimization of the experiment design if the purpose is to decide between the presence of specific atom types using STEM images.
authors.affiliation: Delft Center for Systems and Control, Delft University of Technology, Mekelweg 2, 2628 CD Delft, The Netherlands. Electronic address: a.j.dendekker@tudelft.nl.
authors.forename: A J
authors.initials: AJ
authors.lastname: den Dekker
authors.forename: J
authors.initials: J
authors.lastname: Gonnissen
authors.forename: A
authors.initials: A
authors.lastname: De Backer
authors.forename: J
authors.initials: J
authors.lastname: Sijbers
authors.forename: S
authors.initials: S
authors.lastname: Van Aert
mesh_terms: D000465:Algorithms; D055032:Electron Microscope Tomography / Q000379:methods*; D007091:Image Processing, Computer-Assisted; D017348:Microscopy, Electron, Scanning Transmission / Q000379:methods*; D015233:Models, Statistical
keywords: Data processing/image processing; Electron microscope design and characterization; High resolution transmission electron microscopy (HRTEM)