title: Single defect center scanning near-field optical microscopy on graphene.
abstract: We present a scanning-probe microscope based on an atomic-size emitter, a single nitrogen-vacancy center in a nanodiamond. We employ this tool to quantitatively map the near-field coupling between the NV center and a flake of graphene in three dimensions with nanoscale resolution. Further we demonstrate universal energy transfer distance scaling between a point-like atomic emitter and a two-dimensional acceptor. Our study paves the way toward a versatile single emitter scanning microscope, which could image and excite molecular-scale light fields in photonic nanostructures or single fluorescent molecules.
authors.affiliation: 3. Institute of Physics, Stuttgart University , 70550 Stuttgart, Germany.
authors.forename: Julia
authors.initials: J
authors.lastname: Tisler
authors.forename: Thomas
authors.initials: T
authors.lastname: Oeckinghaus
authors.forename: Rainer J
authors.initials: RJ
authors.lastname: Stöhr
authors.forename: Roman
authors.initials: R
authors.lastname: Kolesov
authors.forename: Rolf
authors.initials: R
authors.lastname: Reuter
authors.forename: Friedemann
authors.initials: F
authors.lastname: Reinhard
authors.forename: Jörg
authors.initials: J
authors.lastname: Wrachtrup
mesh_terms: D006108:Graphite / Q000737:chemistry*; D007089:Image Enhancement / Q000379:methods*; D008422:Materials Testing / Q000379:methods*; D018625:Microscopy, Atomic Force / Q000379:methods*; D053758:Nanoparticles / Q000737:chemistry* / Q000648:ultrastructure*; D013499:Surface Properties
chemical_list: D006108:Graphite