title: Fluorescent microscopy beyond diffraction limits using speckle illumination and joint support recovery.
abstract: Structured illumination microscopy (SIM) breaks the optical diffraction limit by illuminating a sample with a series of line-patterned light. Recently, in order to alleviate the requirement of precise knowledge of illumination patterns, structured illumination microscopy techniques using speckle patterns have been proposed. However, these methods require stringent assumptions of the speckle statistics: for example, speckle patterns should be nearly incoherent or their temporal average should be roughly homogeneous. Here, we present a novel speckle illumination microscopy technique that overcomes the diffraction limit by exploiting the minimal requirement that is common for all the existing super-resolution microscopy, i.e. that the fluorophore locations do not vary during the acquisition time. Using numerical and real experiments, we demonstrate that the proposed method can improve the resolution up to threefold. Because our proposed method succeeds for standard fluorescence probes and experimental protocols, it can be applied in routine biological experiments.
authors.affiliation: Department of Bio and Brain Engineering, KAIST, Daejeon, Korea.
authors.forename: Junhong
authors.initials: J
authors.lastname: Min
authors.forename: Jaeduck
authors.initials: J
authors.lastname: Jang
authors.forename: Dongmin
authors.initials: D
authors.lastname: Keum
authors.forename: Seung-Wook
authors.initials: SW
authors.lastname: Ryu
authors.forename: Chulhee
authors.initials: C
authors.lastname: Choi
authors.forename: Ki-Hun
authors.initials: KH
authors.lastname: Jeong
authors.forename: Jong Chul
authors.initials: JC
authors.lastname: Ye
mesh_terms: D006367:HeLa Cells; D006801:Humans; D008856:Microscopy, Fluorescence / Q000379:methods*; D053758:Nanoparticles