title: Association between exposure to electromagnetic fields from high voltage transmission lines and neurobehavioral function in children.
abstract: BACKGROUND
  Evidence for a possible causal relationship between exposure to electromagnetic fields (EMF) emitted by high voltage transmission (HVT) lines and neurobehavioral dysfunction in children is insufficient. The present study aims to investigate the association between EMF exposure from HVT lines and neurobehavioral function in children.
  
  
  METHODS
  Two primary schools were chosen based on monitoring data of ambient electromagnetic radiation. A cross-sectional study with 437 children (9 to 13 years old) was conducted. Exposure to EMF from HVT lines was monitored at each school. Information was collected on possible confounders and relevant exposure predictors using standardized questionnaires. Neurobehavioral function in children was evaluated using established computerized neurobehavioral tests. Data was analyzed using multivariable regression models adjusted for relevant confounders.
  
  
  RESULTS
  After controlling for potential confounding factors, multivariable regression revealed that children attending a school near 500 kV HVT lines had poorer performance on the computerized neurobehavioral tests for Visual Retention and Pursuit Aiming compared to children attending a school that was not in close proximity to HVT lines.
  
  
  CONCLUSIONS
  The results suggest long-term low-level exposure to EMF from HVT lines might have a negative impact on neurobehavioral function in children. However, because of differences in results only for two of four tests achieved statistical significance and potential limitations, more studies are needed to explore the effects of exposure to extremely low frequency EMF on neurobehavioral function and development in children.
authors.affiliation: Center for Environmental Health Research, South China Institute of Environmental Sciences, Ministry of Environmental Protection, Guangzhou, Guangdong, China.
authors.forename: Jiongli
authors.initials: J
authors.lastname: Huang
authors.forename: Tiantong
authors.initials: T
authors.lastname: Tang
authors.forename: Guocheng
authors.initials: G
authors.lastname: Hu
authors.forename: Jing
authors.initials: J
authors.lastname: Zheng
authors.forename: Yuyu
authors.initials: Y
authors.lastname: Wang
authors.forename: Qiang
authors.initials: Q
authors.lastname: Wang
authors.forename: Jing
authors.initials: J
authors.lastname: Su
authors.forename: Yunfeng
authors.initials: Y
authors.lastname: Zou
authors.forename: Xiaowu
authors.initials: X
authors.lastname: Peng
mesh_terms: D000293:Adolescent; D000704:Analysis of Variance; D002648:Child; D003430:Cross-Sectional Studies; D004560:Electricity / Q000009:adverse effects; D004574:Electromagnetic Fields / Q000009:adverse effects; D004781:Environmental Exposure / Q000009:adverse effects; D005260:Female; D006801:Humans; D008297:Male; D009483:Neuropsychological Tests; D015203:Reproducibility of Results; D011795:Surveys and Questionnaires