title: High speed atomic force microscopy enabled by a sample profile estimator.
abstract: In this paper, an estimation scheme for imaging in Atomic Force Microscopy (AFM) is presented which yields imaging rates well beyond the bandwidth of the vertical positioner and allows for high-speed AFM on a typical commercial instrument. The estimator can be applied to existing instruments with little to no hardware modification other than that needed to sample the cantilever signal. Experiments on a calibration sample as well as lambda DNA are performed to illustrate the effectiveness of this method. These show a greater than an order-of-magnitude improvement in the imaging rate.
authors.affiliation: Department of Mechanical Engineering, Boston University, Boston, Massachusetts 02215, USA.
authors.forename: Peng
authors.initials: P
authors.lastname: Huang
authors.forename: Sean B
authors.initials: SB
authors.lastname: Andersson