title: Dielectrophoresis-based integrated Lab-on-Chip for nano and micro-particles manipulation and capacitive detection.
abstract: We present in this paper a new Lab-on-Chip (LoC) architecture for dielectrophoresis-based cell manipulation, detection, and capacitive measurement. The proposed LoC is built around a CMOS full-custom chip and a microfluidic structure. The CMOS chip is used to deliver all parameters required to control the dielectrophoresis (DEP) features such as frequency, phase, and amplitude of signals spread on in-channel electrodes of the LoC. It is integrated to the LoC and experimental results are related to micro and nano particles manipulation and detection in a microfluidic platform. The proposed microsystem includes an on-chip 27-bit frequency divider, a digital phase controller with a 3.6° phase shift resolution and a 2.5 V dynamic range. The sensing module is composed of a 3 × 3 capacitive sensor array with 10 fF per mV sensitivity, and a dynamic range of 1.5 V. The obtained results show an efficient nano and micro-particles (PC05N, PA04N and PS03N) separation based on frequency segregation with low voltages less than 1.7 V and a fully integrated and reconfigurable system.
authors.affiliation: Department of Electrical Engineering, Polystim Neurotechnologies Laboratory, Ecole Polytechnique de Montreal, Montreal, QC H3T 1J4 Canada. med-amine.miled@polymtl.ca
authors.forename: Mohamed Amine
authors.initials: MA
authors.lastname: Miled
authors.forename: Geneviève
authors.initials: G
authors.lastname: Massicotte
authors.forename: Mohamad
authors.initials: M
authors.lastname: Sawan
mesh_terms: D000703:Analog-Digital Conversion; D003198:Computer Simulation; D025802:Electric Capacitance; D004566:Electrodes; D008670:Metals / Q000737:chemistry; D046210:Microfluidic Analytical Techniques / Q000295:instrumentation* / Q000379:methods*; D008863:Microspheres; D055616:Microtechnology / Q000295:instrumentation* / Q000379:methods*; D053758:Nanoparticles / Q000737:chemistry*; D010087:Oxides / Q000737:chemistry; D012666:Semiconductors; D012815:Signal Processing, Computer-Assisted
chemical_list: D008670:Metals; D010087:Oxides