title: Space- and time-resolved mapping of ionic dynamic and electroresistive phenomena in lateral devices.
abstract: A scanning probe microscopy-based technique for probing local ionic and electronic transport and their dynamic behavior on the 10 ms to 10 s scale is presented. The time-resolved Kelvin probe force microscopy (tr-KPFM) allows mapping of surface potential in both space and time domains, visualizing electronic and ionic charge dynamics and separating underlying processes based on their time responses. Here, tr-KPFM is employed to explore the interplay of the adsorbed surface ions and bulk oxygen vacancies and their role in the resistive switching in a Ca-substituted bismuth ferrite thin film.
authors.affiliation: Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States. strelcove@ornl.gov
authors.forename: Evgheni
authors.initials: E
authors.lastname: Strelcov
authors.forename: Stephen
authors.initials: S
authors.lastname: Jesse
authors.forename: Yen-Lin
authors.initials: YL
authors.lastname: Huang
authors.forename: Yung-Chun
authors.initials: YC
authors.lastname: Teng
authors.forename: Ivan I
authors.initials: II
authors.lastname: Kravchenko
authors.forename: Ying-Hao
authors.initials: YH
authors.lastname: Chu
authors.forename: Sergei V
authors.initials: SV
authors.lastname: Kalinin