title: Analytical estimations for the reference wavelength reflectance and width of high reflection zone of two-material periodic multilayers.
abstract: Periodic multilayer structures of quarterwave and multiple quarterwave stacks with shifted ratios of high and low index layers in the half-wave pairs are considered. Analytical dependencies of the reference wavelength reflectance and the width of high reflectance zone on the number of layers, fraction quarterwave and layer refractive indices are obtained. The structures are used as starting designs for notch filters. Obtained dependencies allow one to estimate in advance parameters required to achieve target spectral characteristics.
authors.affiliation: Research Computing Center, Moscow State University, Leninskie Gory, 119991 Moscow, Russia. tatiana@srcc.msu.ru
authors.forename: Tatiana V
authors.initials: TV
authors.lastname: Amotchkina