title: High-precision x-ray polarimetry.
abstract: The polarization purity of 6.457- and 12.914-keV x rays has been improved to the level of 2.4×10(-10) and 5.7×10(-10). The polarizers are channel-cut silicon crystals using six 90° reflections. Their performance and possible applications are demonstrated in the measurement of the optical activity of a sucrose solution.
authors.affiliation: Institut für Optik und Quantenelektronik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, D-07743 Jena, Germany. berit.marx@uni-jena.de
authors.forename: B
authors.initials: B
authors.lastname: Marx
authors.forename: K S
authors.initials: KS
authors.lastname: Schulze
authors.forename: I
authors.initials: I
authors.lastname: Uschmann
authors.forename: T
authors.initials: T
authors.lastname: Kämpfer
authors.forename: R
authors.initials: R
authors.lastname: Lötzsch
authors.forename: O
authors.initials: O
authors.lastname: Wehrhan
authors.forename: W
authors.initials: W
authors.lastname: Wagner
authors.forename: C
authors.initials: C
authors.lastname: Detlefs
authors.forename: T
authors.initials: T
authors.lastname: Roth
authors.forename: J
authors.initials: J
authors.lastname: Härtwig
authors.forename: E
authors.initials: E
authors.lastname: Förster
authors.forename: T
authors.initials: T
authors.lastname: Stöhlker
authors.forename: G G
authors.initials: GG
authors.lastname: Paulus