title: Improvement of axial resolution and contrast in temporally focused widefield two-photon microscopy with structured light illumination.
abstract: Although temporally focused wide-field two-photon microscopy (TFM) can perform depth resolved wide field imaging, it cannot avoid the image degradation due to scattering of excitation and emission photons when imaging in a turbid medium. Further, its axial resolution is inferior to standard point-scanning two-photon microscopy. We implemented a structured light illumination for TFM and have shown that it can effectively reject the out-of-focus scattered emission photons improving image contrast. Further, the depth resolution of the improved system is dictated by the spatial frequency of the structure light with the potential of attaining depth resolution better than point-scanning two-photon microscopy.
authors.affiliation: Department of Mechanical Engineering Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.
authors.forename: Heejin
authors.initials: H
authors.lastname: Choi
authors.forename: Elijah Y S
authors.initials: EY
authors.lastname: Yew
authors.forename: Bertan
authors.initials: B
authors.lastname: Hallacoglu
authors.forename: Sergio
authors.initials: S
authors.lastname: Fantini
authors.forename: Colin J R
authors.initials: CJ
authors.lastname: Sheppard
authors.forename: Peter T C
authors.initials: PT
authors.lastname: So
keywords: (110.0113) Imaging through turbid media; (170.6900) Three-dimensional microscopy; (180.4315) Nonlinear microscopy