title: The use of a central beam stop for contrast enhancement in TEM imaging.
abstract: Dark field TEM imaging using a stop of the central beam (DF-000) is reported. It is shown that a strong enhancement in the contrast can be obtained for graphene as example of weak phase object and endocytic multivescilar body as example of an unstained biological sample. No charging or significant contamination of the central beam stop is observed. For graphene, a resolution beyond 1Å(-1) was easily obtained. DF-000 imaging can be considered as a good and easy to use alternative of a phase plate.
authors.affiliation: Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ, Delft, The Netherlands; College of Computer, National University of Defense Technology, Changsha, China.
authors.forename: Chao
authors.initials: C
authors.lastname: Zhang
authors.forename: Qiang
authors.initials: Q
authors.lastname: Xu
authors.forename: Peter J
authors.initials: PJ
authors.lastname: Peters
authors.forename: Henny
authors.initials: H
authors.lastname: Zandbergen
mesh_terms: D006108:Graphite / Q000737:chemistry; D046529:Microscopy, Electron, Transmission / Q000379:methods*
chemical_list: D006108:Graphite
keywords: Biological TEM; Center stop; Contrast enhancement; Dark field imaging; Phase plate