title: Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy.
abstract: Several techniques can be applied to characterize redox properties of wide bandgap semiconductors, however some of them are of limited use. In this paper we propose a new modification of the old spectroelectrochemical method developed two decades ago. A procedure based on measurements of the reflectance changes as a function of potential applied to the electrode coated with the studied material appears to be a very convenient tool for characterizing redox properties of semiconductors, forming either transparent or opaque films at a platinum electrode. A discussion on the measured redox parameters of semiconductor films concludes with a definition of a new term, the absorption onset potential of the material.
authors.affiliation: Faculty of Chemistry, Jagiellonian University, Ingardena 3, 30-060 Kraków, Poland.
authors.forename: Elżbieta
authors.initials: E
authors.lastname: Świętek
authors.forename: Kacper
authors.initials: K
authors.lastname: Pilarczyk
authors.forename: Justyna
authors.initials: J
authors.lastname: Derdzińska
authors.forename: Konrad
authors.initials: K
authors.lastname: Szaciłowski
authors.forename: Wojciech
authors.initials: W
authors.lastname: Macyk