title: Memristor-based programmable logic array (PLA) and analysis as Memristive networks.
abstract: A Memristor theorized by Chua in 1971 has the potential to dramatically influence the way electronic circuits are designed. It is a two terminal device whose resistance state is based on the history of charge flow brought about as the result of the voltage being applied across its terminals and hence can be thought of as a special case of a reconfigurable resistor. Nanoscale devices using dense and regular fabrics such as Memristor cross-bar is promising new architecture for System-on-Chip (SoC) implementations in terms of not only the integration density that the technology can offer but also both improved performance and reduced power dissipation. Memristor has the capacity to switch between high and low resistance states in a cross-bar circuit configuration. The cross-bars are formed from an array of vertical conductive nano-wires cross a second array of horizontal conductive wires. Memristors are realized at the intersection of the two wires in the array through appropriate processing technology such that any particular wire in the vertical array can be connected to a wire in the horizontal array by switching the resistance of a particular intersection to a low state while other cross-points remain in a high resistance state. However the approach introduces a number of challenges. The lack of voltage gain prevents logic being cascaded and voltage level degradation affects robustness of the operation. Moreover the cross-bars introduce sneak current paths when two or more cross points are connected through the switched Memristor. In this paper, we propose Memristor-based programmable logic array (PLA) architecture and develop an analytical model to analyze the logic level on the memristive networks. The proposed PLA architecture has 12 inputs maximum and can be cascaded for more input variables with R(off)/R(on) ratio in the range from 55 to 160 of Memristors.
authors.affiliation: College of Electrical and Computer Engineering, Chungbuk National University, Cheongju, Chungbuk, South Korea.
authors.forename: Kwan-Hee
authors.initials: KH
authors.lastname: Lee
authors.forename: Sang-Jin
authors.initials: SJ
authors.lastname: Lee
authors.forename: Seok-Man
authors.initials: SM
authors.lastname: Kim
authors.forename: Kyoungrok
authors.initials: K
authors.lastname: Cho
mesh_terms: D016248:Computer Storage Devices; D017076:Computer-Aided Design; D017097:Electric Impedance; D004867:Equipment Design; D019544:Equipment Failure Analysis; D036103:Nanotechnology / Q000295:instrumentation*; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation*