title: Temperature dependence of the electrical transport properties in few-layer graphene interconnects.
abstract: We report a systematic investigation of the temperature dependence of electrical resistance behaviours in tri- and four-layer graphene interconnects. Nonlinear current-voltage characteristics were observed at different temperatures, which are attributed to the heating effect. With the resistance curve derivative analysis method, our experimental results suggest that Coulomb interactions play an essential role in our devices. The room temperature measurements further indicate that the graphene layers exhibit the characteristics of semiconductors mainly due to the Coulomb scattering effects. By combining the Coulomb and short-range scattering theory, we derive an analytical model to explain the temperature dependence of the resistance, which agrees well with the experimental results.
authors.affiliation: NOVITAS, Nanoelectronics Centre of Excellence, School of Electrical & Electronic Engineering, Nanyang Technological University, 50 Nanyang Ave, Singapore 639798, Singapore. wensiang@ntu.edu.sg.
authors.forename: Yanping
authors.initials: Y
authors.lastname: Liu
authors.forename: Zongwen
authors.initials: Z
authors.lastname: Liu
authors.forename: Wen Siang
authors.initials: WS
authors.lastname: Lew
authors.forename: Qi Jie
authors.initials: QJ
authors.lastname: Wang