title: Electronic superlattice revealed by resonant scattering from random impurities in Sr3Ru2O7.
abstract: Resonant elastic x-ray scattering (REXS) is an exquisite element-sensitive tool for the study of subtle charge, orbital, and spin superlattice orders driven by the valence electrons, which therefore escape detection in conventional x-ray diffraction (XRD). Although the power of REXS has been demonstrated by numerous studies of complex oxides performed in the soft x-ray regime, the cross section and photon wavelength of the material-specific elemental absorption edges ultimately set the limit to the smallest superlattice amplitude and periodicity one can probe. Here we show--with simulations and REXS on Mn-substituted Sr3Ru2O7--that these limitations can be overcome by performing resonant scattering experiments at the absorption edge of a suitably-chosen, dilute impurity. This establishes that--in analogy with impurity-based methods used in electron-spin-resonance, nuclear-magnetic resonance, and Mössbauer spectroscopy--randomly distributed impurities can serve as a non-invasive, but now momentum-dependent probe, greatly extending the applicability of resonant x-ray scattering techniques.
authors.affiliation: Department of Physics & Astronomy, University of British Columbia, Vancouver, British Columbia V6T 1Z1, Canada. mahossain@lbl.gov
authors.forename: M A
authors.initials: MA
authors.lastname: Hossain
authors.forename: I
authors.initials: I
authors.lastname: Zegkinoglou
authors.forename: Y-D
authors.initials: YD
authors.lastname: Chuang
authors.forename: J
authors.initials: J
authors.lastname: Geck
authors.forename: B
authors.initials: B
authors.lastname: Bohnenbuck
authors.forename: A G Cruz
authors.initials: AG
authors.lastname: Gonzalez
authors.forename: H-H
authors.initials: HH
authors.lastname: Wu
authors.forename: C
authors.initials: C
authors.lastname: Schüßler-Langeheine
authors.forename: D G
authors.initials: DG
authors.lastname: Hawthorn
authors.forename: J D
authors.initials: JD
authors.lastname: Denlinger
authors.forename: R
authors.initials: R
authors.lastname: Mathieu
authors.forename: Y
authors.initials: Y
authors.lastname: Tokura
authors.forename: S
authors.initials: S
authors.lastname: Satow
authors.forename: H
authors.initials: H
authors.lastname: Takagi
authors.forename: Y
authors.initials: Y
authors.lastname: Yoshida
authors.forename: Z
authors.initials: Z
authors.lastname: Hussain
authors.forename: B
authors.initials: B
authors.lastname: Keimer
authors.forename: G A
authors.initials: GA
authors.lastname: Sawatzky
authors.forename: A
authors.initials: A
authors.lastname: Damascelli
mesh_terms: D003198:Computer Simulation; D004583:Electrons; D008670:Metals / Q000737:chemistry*; D008956:Models, Chemical; D012542:Scattering, Radiation; D014961:X-Ray Diffraction / Q000379:methods*
chemical_list: D008670:Metals
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