title: Focused electron beam in pyroelectric electron probe microanalyzer.
abstract: We report a method to focus the electron beam generated using a pyroelectric crystal. An electron beam with a spot size of 100 μm was achieved by applying an electrical field to an electroconductive needle tip set on a pyroelectric crystal. When the focused electron beam bombarded a sample, characteristic X-rays of the sample were only detected due to the production of an electric field between the needle tip and the sample.
authors.affiliation: Department of Materials Science and Engineering, Kyoto University, Kyoto 606-8501, Japan. imashuku.susumu.2m@kyoto-u.ac.jp
authors.forename: Susumu
authors.initials: S
authors.lastname: Imashuku
authors.forename: Akira
authors.initials: A
authors.lastname: Imanishi
authors.forename: Jun
authors.initials: J
authors.lastname: Kawai