title: Focused ion beam nanoscale patterned transmission-enhanced fiber-optic tips.
abstract: The angled and tapered antireflection and transmission-enhanced fiber-optic tips were designed, fabricated, and characterized based on nanoscale surface modification using the nano-precision focused ion beam (FIB). The developed optical fiber tips showed combined functions of antireflection and transmission enhancement for higher detection efficiency or signal-to-noise ratio because the FIB-milled nanoholes into the fiber tip endfaces could act as tapered air-filled nanopillars, changing the light propagation direction, enhancing the scattering effect, and allowing more photons to transmit along/near the glass/air interface to enhance the local evanescent field for sensing/detection.
authors.affiliation: School of Mechanical and Aerospace Engineering, Nanyang Technological University, 50 Nanyang Avenue, 639798 Singapore.
authors.forename: Houxiao
authors.initials: H
authors.lastname: Wang
authors.forename: Wei
authors.initials: W
authors.lastname: Zhou
authors.forename: Ying
authors.initials: Y
authors.lastname: Cui
authors.forename: Guanghui
authors.initials: G
authors.lastname: Wang
authors.forename: Perry Ping
authors.initials: PP
authors.lastname: Shum
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D005336:Fiber Optic Technology / Q000295:instrumentation*; D020450:Heavy Ions; D008422:Materials Testing; D054802:Molecular Imprinting / Q000379:methods*; D049329:Nanostructures / Q000737:chemistry* / Q000528:radiation effects / Q000648:ultrastructure; D012031:Refractometry / Q000295:instrumentation*; D020349:Surface Plasmon Resonance / Q000295:instrumentation*; D014159:Transducers