title: Layer-resolved study of Mg atom incorporation at the MgO/Ag(001) buried interface.
abstract: By combining x-ray excited Auger electron diffraction experiments and multiple scattering calculations we reveal a layer-resolved shift for the Mg KL23L23 Auger transition in MgO ultrathin films (4-6 Å) on Ag(001). This resolution is exploited to demonstrate the possibility of controlling Mg atom incorporation at the MgO/Ag(001) interface by exposing the MgO films to a Mg flux. A substantial reduction of the MgO/Ag(001) work function is observed during the exposition phase and reflects both band-offset variations at the interface and band bending effects in the oxide film.
authors.affiliation: Département de Physique and Fribourg Center for Nanomaterials, Université de Fribourg, CH-1700 Fribourg, Switzerland. thomas.jaouen@unifr.ch
authors.forename: T
authors.initials: T
authors.lastname: Jaouen
authors.forename: S
authors.initials: S
authors.lastname: Tricot
authors.forename: G
authors.initials: G
authors.lastname: Delhaye
authors.forename: B
authors.initials: B
authors.lastname: Lépine
authors.forename: D
authors.initials: D
authors.lastname: Sébilleau
authors.forename: G
authors.initials: G
authors.lastname: Jézéquel
authors.forename: P
authors.initials: P
authors.lastname: Schieffer