Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device.
The atomic force microscope (AFM) has been widely used for surface fabrication and manipulation. However, nanomanipulation using a conventional AFM is inefficient because of the sequential nature of the scan-manipulation scan cycle, which makes it difficult for the operator to observe the region of interest and perform the manipulation simultaneously. In this paper, a nanomanipulation technique using a high-speed atomic force microscope (HS-AFM) is described. During manipulation using the AFM probe, the operation is periodically interrupted for a fraction of a second for high-speed imaging that allows the topographical image of the manipulated surface to be periodically updated. With the use of high-speed imaging, the interrupting time for imaging can be greatly reduced, and as a result, the operator almost does not notice the blink time of the interruption for imaging during the manipulation. This creates a more intuitive interface with greater feedback and finesse to the operator. Nanofabrication under real-time monitoring was performed to demonstrate the utility of this arrangement for real-time nanomanipulation of sample surfaces under ambient conditions. Furthermore, the HS-AFM is coupled with a haptic device for the human interface, enabling the operator to move the HS-AFM probe to any position on the surface while feeling the response from the surface during the manipulation.
Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561, Japan; Research Institute of Electronics, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8011, Japan. Electronic address: tmfiwat@ipc.shizuoka.ac.jp.
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Iwata
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Ohashi
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Ishisaki
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Picco
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Ushiki
D005246:Feedback; D006801:Humans; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods*; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods*
Atomic force microscope; Nanofabrication; Nanomanipulation