Extraction of anisotropic parameters of turbid media using hybrid model comprising differential- and decomposition-based Mueller matrices.
A hybrid model comprising the differential Mueller matrix formalism and the Mueller matrix decomposition method is proposed for extracting the linear birefringence (LB), linear dichroism (LD), circular birefringence (CB), circular dichroism (CD), and depolarization properties (Dep) of turbid optical samples. In contrast to the differential-based Mueller matrix method, the proposed hybrid model provides full-range measurements of all the anisotropic properties of the optical sample. Furthermore, compared to the decomposition-based Mueller matrix method, the proposed model is insensitive to the multiplication order of the constituent basis matrices. The validity of the proposed method is confirmed by extracting the anisotropic properties of a compound chitosan-glucose-microsphere sample with LB/CB/Dep properties and two ferrofluidic samples with CB/CD/Dep and LB/LD/Dep properties, respectively. It is shown that the proposed hybrid model not only yields full-range measurements of all the anisotropic parameters, but is also more accurate and more stable than the decomposition method. Moreover, compared to the decomposition method, the proposed model more accurately reflects the dependency of the phase retardation angle and linear dichroism angle on the direction of the external magnetic field for ferrofluidic samples. Overall, the results presented in this study confirm that the proposed model has significant potential for extracting the optical parameters of real-world samples characterized by either single or multiple anisotropic properties.
Department of Mechanical Engineering, National Cheng Kung University, Tainan 70101, Taiwan.
Chia-Chi
CC
Liao
Yu-Lung
YL
Lo
D000465:Algorithms; D016880:Anisotropy; D003198:Computer Simulation; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008027:Light; D008962:Models, Theoretical; D009391:Nephelometry and Turbidimetry / Q000379:methods*; D012031:Refractometry / Q000295:instrumentation*; D012542:Scattering, Radiation