Patterned defect structures predicted for graphene are observed on single-layer silica films.
Topological defects in two-dimensional materials such as graphene are considered as a tool for tailoring their physical properties. Here, we studied defect structures on a single-layer silica (silicatene) supported on Ru(0001) using a low energy electron diffraction, scanning tunneling microscopy, infrared reflection-absorption spectroscopy, and photoelectron spectroscopy. The results revealed easy formation of periodic defect structures, which were previously predicted for graphene on a theoretical ground, yet experimentally unrealized. The structural similarities between single-layer materials (graphene, silicene, silicatene) open a new playground for deeper understanding and tailoring structural, electronic, and chemical properties of the truly two-dimensional systems.
Department of Chemical Physics, Fritz Haber Institute of the Max Planck Society , Faradayweg 4-6, 14195 Berlin, Germany.
Bing
B
Yang
Jorge Anibal
JA
Boscoboinik
Xin
X
Yu
Shamil
S
Shaikhutdinov
Hans-Joachim
HJ
Freund