Structural evolution of Ga-Ge-Te glasses by combined EXAFS and XPS analysis.
The structural evolution of GaxGeyTe100-x-y glasses in the vicinity of GeTe4-GaTe3 pseudo-binary tie-line is determined with high-resolution X-ray photoelectron (XPS) and extended X-ray absorption fine structure (EXAFS) spectroscopies. The analysis of XPS data is complicated by similar electronegativity values for the constituent chemical elements, but then the interpretation is facilitated by information from complementary EXAFS analysis of the structure around each element independently. The results show 4∕4∕2 coordination for Ga∕Ge∕Te atoms and absence of Ga(Ge)-Ge(Ga) bonds or extended Te clusters in significant concentrations within the whole range of studied composition. The observed structural features correlate well with the measured basic physical properties of Ga-containing germanium telluride glasses.
Department of Physics and Astronomy, Austin Peay State University, Clarksville, Tennessee 37044, USA. ryh206@lehigh.edu
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Golovchak
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Calvez
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Bureau
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Jain