title: Validation of three-dimensional diffraction contrast tomography reconstructions by means of electron backscatter diffraction characterization.
abstract: Microstructure reconstructions resulting from diffraction contrast tomography data of polycrystalline bulk strontium titanate were reinvestigated by means of electron backscatter diffraction (EBSD) characterization. Corresponding two-dimensional grain maps from the two characterization methods were aligned and compared, focusing on the spatial resolution at the internal interfaces. The compared grain boundary networks show a remarkably good agreement both morphologically and in crystallographic orientation. Deviations are critically assessed and discussed in the context of diffraction data reconstruction and EBSD data collection techniques.
authors.affiliation: Institute of Applied Materials, Karlsruhe Institute of Technology, Kaiserstrasse 12, 76128 Karlsruhe, Germany.
authors.forename: Melanie
authors.initials: M
authors.lastname: Syha
authors.forename: Andreas
authors.initials: A
authors.lastname: Trenkle
authors.forename: Barbara
authors.initials: B
authors.lastname: Lödermann
authors.forename: Andreas
authors.initials: A
authors.lastname: Graff
authors.forename: Wolfgang
authors.initials: W
authors.lastname: Ludwig
authors.forename: Daniel
authors.initials: D
authors.lastname: Weygand
authors.forename: Peter
authors.initials: P
authors.lastname: Gumbsch
keywords: diffraction contrast tomography; electron backscatter diffraction; microstructure characterization
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