title: A direct evidence of morphological degradation on a nanometer scale in polymer solar cells.
abstract: In situ measurement of a polymer solar cell using micro grazing incidence small angle X-ray scattering (μGISAXS) and current-voltage tracking is demonstrated. While measuring electric characteristics under illumination, morphological changes are probed by μGISAXS. The X-ray beam (green) impinges on the photo active layer with a shallow angle and scatters on a 2d detector. Degradation is explained by the ongoing nanomorphological changes observed.
authors.affiliation: Technische Universität München, Physik-Department, Lehrstuhl für Funktionelle Materialien, James-Franck-Str. 1, 85748, Garching, Germany.
authors.forename: Christoph J
authors.initials: CJ
authors.lastname: Schaffer
authors.forename: Claudia M
authors.initials: CM
authors.lastname: Palumbiny
authors.forename: Martin A
authors.initials: MA
authors.lastname: Niedermeier
authors.forename: Christian
authors.initials: C
authors.lastname: Jendrzejewski
authors.forename: Gonzalo
authors.initials: G
authors.lastname: Santoro
authors.forename: Stephan V
authors.initials: SV
authors.lastname: Roth
authors.forename: Peter
authors.initials: P
authors.lastname: Müller-Buschbaum
mesh_terms: D037741:Fullerenes / Q000737:chemistry; D049329:Nanostructures / Q000737:chemistry*; D011108:Polymers / Q000737:chemistry*; D012993:Solar Energy; D013876:Thiophenes / Q000737:chemistry
chemical_list: C539575:(6,6)-phenyl C61-butyric acid methyl ester; D037741:Fullerenes; D011108:Polymers; D013876:Thiophenes; C000588862:poly(3-hexylthiophene-2,5-diyl)
keywords: bulk heterojunction; degradation; in situ grazing incidence small angle X-ray scattering (GISAXS); morphology; organic photovoltaics