title: High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzers.
abstract: Spherical analyzers are well known instruments for inelastic X-ray scattering (IXS) experiments. High-resolution IXS experiments almost always use Si single crystals as monochromators and spherical analyzers. At higher energies (>20 keV) Si shows a high energy resolution (<10 meV), at an exact symmetric back-diffraction condition, since the energy resolution is given by the real part of the susceptibility or polarizability. However, at low energies (<10 keV), high energy resolution is difficult to achieve with Si. α-SiO2(quartz) can be an option, since it offers high energy resolution at low energies. In this work, the characterization of high-quality α-SiO2is presented. Such characterization is made by high-resolution rocking curve, topography and lattice parameter mapping in different samples from a single block. X-ray optics with α-SiO2for IXS at lower energies (from 2.5 to 12.6 keV) with medium to high energy resolution (from 90 to 11 meV) are proposed and theoretically exploited.
authors.affiliation: Universidade Federal da Integração Latino-Americana , Caixa Postal 2044, Foz do Iguacu, Parana 85867-970, Brazil.
authors.forename: Marcelo Goncalves
authors.initials: MG
authors.lastname: Hönnicke
authors.forename: Xianrong
authors.initials: X
authors.lastname: Huang
authors.forename: Cesar
authors.initials: C
authors.lastname: Cusatis
authors.forename: Chaminda Nalaka
authors.initials: CN
authors.lastname: Koditwuakku
authors.forename: Yong Q
authors.initials: YQ
authors.lastname: Cai
keywords: X-ray optics; inelastic X-ray scattering analyzers; quartz single crystals; spherical analyzers
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