Static hyperspectral fluorescence imaging of viscous materials based on a linear variable filter spectrometer.
This paper presents a low-cost hyperspectral measurement setup in a new application based on fluorescence detection in the visible (Vis) wavelength range. The aim of the setup is to take hyperspectral fluorescence images of viscous materials. Based on these images, fluorescent and non-fluorescent impurities in the viscous materials can be detected. For the illumination of the measurement object, a narrow-band high-power light-emitting diode (LED) with a center wavelength of 370 nm was used. The low-cost acquisition unit for the imaging consists of a linear variable filter (LVF) and a complementary metal oxide semiconductor (CMOS) 2D sensor array. The translucent wavelength range of the LVF is from 400 nm to 700 nm. For the confirmation of the concept, static measurements of fluorescent viscous materials with a non-fluorescent impurity have been performed and analyzed. With the presented setup, measurement surfaces in the micrometer range can be provided. The measureable minimum particle size of the impurities is in the nanometer range. The recording rate for the measurements depends on the exposure time of the used CMOS 2D sensor array and has been found to be in the microsecond range.
Institute for Measurement Systems and Sensor Technology, Technische Universität München, Theresienstrasse 90/N5, Munich 80333, Germany. patrik.murr@tum.de.
Patrik J
PJ
Murr
Michael
M
Schardt
Alexander W
AW
Koch
D004867:Equipment Design; D019544:Equipment Failure Analysis; D005374:Filtration / Q000295:instrumentation*; D008029:Lighting / Q000295:instrumentation; D008422:Materials Testing / Q000295:instrumentation*; D008856:Microscopy, Fluorescence / Q000295:instrumentation*; D053758:Nanoparticles / Q000737:chemistry* / Q000648:ultrastructure*; D012666:Semiconductors; D013050:Spectrometry, Fluorescence / Q000295:instrumentation*; D014159:Transducers; D014783:Viscosity