Trace elemental analysis of Indian natural moonstone gems by PIXE and XRD techniques.
A selected number of Indian Eastern Ghats natural moonstone gems were studied with a powerful nuclear analytical and non-destructive Proton Induced X-ray Emission (PIXE) technique. Thirteen elements, including V, Co, Ni, Zn, Ga, Ba and Pb, were identified in these moonstones and may be useful in interpreting the various geochemical conditions and the probable cause of their inceptions in the moonstone gemstone matrix. Furthermore, preliminary XRD studies of different moonstone patterns were performed. The PIXE technique is a powerful method for quickly determining the elemental concentration of a substance. A 3MeV proton beam was employed to excite the samples. The chemical constituents of moonstones from parts of the Eastern Ghats geological formations of Andhra Pradesh, India were determined, and gemological studies were performed on those gems. The crystal structure and the lattice parameters of the moonstones were estimated using X-Ray Diffraction studies, trace and minor elements were determined using the PIXE technique, and major compositional elements were confirmed by XRD. In the present work, the usefulness and versatility of the PIXE technique for research in geo-scientific methodology is established.
Department of Engineering Physics, Lendi Institute of Engineering & Technology, Jonnada,Vizianagaram 535005, Andhra Pradesh, India. Electronic address: rvrao.venkat999@gmail.com.
R
R
Venkateswara Rao
P
P
Venkateswarulu
C
C
Kasipathi
S
S
Sivajyothi
India; Moonstone; Natural gemstones; PIXE; Trace elements; XRD