X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison.
Novel scanning synchrotron cross-sectional nanobeam and conventional laboratory as well as synchrotron Laplace X-ray diffraction methods are used to characterize residual stresses in exemplary 11.5 µm-thick TiN coatings. Both real and Laplace space approaches reveal a homogeneous tensile stress state and a very pronounced compressive stress gradient in as-deposited and blasted coatings, respectively. The unique capabilities of the cross-sectional approach operating with a beam size of 100 nm in diameter allow the analysis of stress variation with sub-micrometre resolution at arbitrary depths and the correlation of the stress evolution with the local coating microstructure. Finally, advantages and disadvantages of both approaches are extensively discussed.
Materials Center Leoben Forschung GmbH, A-8700 Leoben, Austria.
Mario
M
Stefenelli
Juraj
J
Todt
Angelika
A
Riedl
Werner
W
Ecker
Thomas
T
Müller
Rostislav
R
Daniel
Manfred
M
Burghammer
Jozef
J
Keckes
Laplace methods; TiN coatings; X-ray diffraction; cross-sectional nanodiffraction; residual stress