Tip-enhanced Raman imaging and nano spectroscopy of etched silicon nanowires.
Tip-enhanced Raman spectroscopy (TERS) is used to investigate the influence of strains in isolated and overlapping silicon nanowires prepared by chemical etching of a (100) silicon wafer. An atomic force microscopy tip made of nanocrystalline diamond coated with a thin layer of silver is used in conjunction with an excitation wavelength of 532 nm in order to probe the first order optical phonon mode of the [100] silicon nanowires. The frequency shift and the broadening of the silicon first order phonon are analyzed and compared to the topographical measurements for distinct configuration of nanowires that are disposed in straight, bent or overlapping configuration over a microscope coverslip. The TERS spatial resolution is close to the topography provided by the nanocrystalline diamond tip and subtle spectral changes are observed for different nanowire configurations.
Department of Chemistry and Centre for Advanced Materials and Biomaterials, University of Western Ontario, 1151 Richmond Street, London, N6A 5B7, Canada. flagugne@uwo.ca.
Nastaran
N
Kazemi-Zanjani
Erwan
E
Kergrene
Lijia
L
Liu
Tsun-Kong
TK
Sham
François
F
Lagugné-Labarthet
D019245:Compressive Strength; D055119:Elastic Modulus; D004867:Equipment Design; D019544:Equipment Failure Analysis; D018625:Microscopy, Atomic Force / Q000295:instrumentation*; D036103:Nanotechnology / Q000295:instrumentation*; D053770:Nanowires / Q000737:chemistry* / Q000648:ultrastructure*; D010316:Particle Size; D012825:Silicon / Q000737:chemistry*; D013059:Spectrum Analysis, Raman / Q000295:instrumentation*; D013314:Stress, Mechanical; D013499:Surface Properties; D013718:Tensile Strength; D014159:Transducers
D012825:Silicon