title: Cuticle structure of the scarab beetle Cetonia aurata analyzed by regression analysis of Mueller-matrix ellipsometric data.
abstract: Since one hundred years it is known that some scarab beetles reflect elliptically and near-circular polarized light as demonstrated by Michelson for the beetle Chrysina resplendens. The handedness of the polarization is in a majority of cases left-handed but also right-handed polarization has been found. In addition, brilliant colors with metallic shine are observed. The polarization and color effects are generated in the beetle exoskeleton, the so-called cuticle. The objective of this work is to demonstrate that structural parameters and materials optical functions of these photonic structures can be extracted by advanced modeling of spectral multi-angle Mueller-matrix data recorded from beetle cuticles. A dual-rotating compensator ellipsometer is used to record normalized Mueller-matrix data in the spectral range 400 - 800 nm at angles of incidence in the range 25-75°. Analysis of data measured on the scarab beetle Cetonia aurata are presented in detail. The model used in the analysis mimics a chiral nanostructure and is based on a twisted layered structure. Given the complexity of the nanostructure, an excellent fit between experimental and model data is achieved. The obtained model parameters are the spectral variation of the refractive indices of the cuticle layers and structural parameters of the chiral structure.
authors.forename: Hans
authors.initials: H
authors.lastname: Arwin
authors.forename: Torun
authors.initials: T
authors.lastname: Berlind
authors.forename: Blaine
authors.initials: B
authors.lastname: Johs
authors.forename: Kenneth
authors.initials: K
authors.lastname: Järrendahl
mesh_terms: D000465:Algorithms; D000818:Animals; D001517:Coleoptera / Q000502:physiology* / Q000648:ultrastructure*; D003198:Computer Simulation; D034582:Integumentary System / Q000502:physiology*; D008954:Models, Biological; D015233:Models, Statistical; D012031:Refractometry / Q000379:methods*; D012044:Regression Analysis; D013499:Surface Properties