title: Combined in situ atomic force microscopy and infrared attenuated total reflection spectroelectrochemistry.
abstract: A novel analytical platform combining infrared attenuated total reflection (IR-ATR) spectroelectrochemistry (SE) with atomic force microscopy (AFM) using a boron-doped diamond (BDD)-modified ATR crystal is presented. The utility of this combination is demonstrated investigating the electrodeposition of a polymer film via IR spectroscopy, while the surface modification is simultaneously imaged by AFM. The ATR waveguide consists of a single-crystal intrinsic diamond overgrown with a homoepitaxial BDD layer (thickness: ∼100 nm, boron content: ∼5 × 10(20) cm(-3)) to provide electric conductivity. The diamond ATR crystal is shaped in the form of a hemisphere with a beveled top and an octahedronal surface area of approximately 400 μm(2). To demonstrate combined IR-ATR-SE-AFM measurements, the electro-polymerization of 3,4-ethylenedioxothiophene (EDOT) was selected as a model system. Depositions were obtained from aqueous solutions, while changes in IR signature, topography, and electrochemical behavior were recorded in situ and simultaneously during the polymerization process.
authors.affiliation: Institute of Analytical and Bioanalytical Chemistry, University of Ulm, Albert-Einstein-Allee 11, 89081 Ulm, Germany. christine.kranz@uni-ulm.de.
authors.forename: Daniel
authors.initials: D
authors.lastname: Neubauer
authors.forename: Jochen
authors.initials: J
authors.lastname: Scharpf
authors.forename: Alberto
authors.initials: A
authors.lastname: Pasquarelli
authors.forename: Boris
authors.initials: B
authors.lastname: Mizaikoff
authors.forename: Christine
authors.initials: C
authors.lastname: Kranz