title: Elongated nanostructures for radial junction solar cells.
abstract: In solar cell technology, the current trend is to thin down the active absorber layer. The main advantage of a thinner absorber is primarily the reduced consumption of material and energy during production. For thin film silicon (Si) technology, thinning down the absorber layer is of particular interest since both the device throughput of vacuum deposition systems and the stability of the devices are significantly enhanced. These features lead to lower cost per installed watt peak for solar cells, provided that the (stabilized) efficiency is the same as for thicker devices. However, merely thinning down inevitably leads to a reduced light absorption. Therefore, advanced light trapping schemes are crucial to increase the light path length. The use of elongated nanostructures is a promising method for advanced light trapping. The enhanced optical performance originates from orthogonalization of the light's travel path with respect to the direction of carrier collection due to the radial junction, an improved anti-reflection effect thanks to the three-dimensional geometric configuration and the multiple scattering between individual nanostructures. These advantages potentially allow for high efficiency at a significantly reduced quantity and even at a reduced material quality, of the semiconductor material. In this article, several types of elongated nanostructures with the high potential to improve the device performance are reviewed. First, we briefly introduce the conventional solar cells with emphasis on thin film technology, following the most commonly used fabrication techniques for creating nanostructures with a high aspect ratio. Subsequently, several representative applications of elongated nanostructures, such as Si nanowires in realistic photovoltaic (PV) devices, are reviewed. Finally, the scientific challenges and an outlook for nanostructured PV devices are presented.
authors.affiliation: Physics of Devices, Debye Institute for Nanomaterials Science, Utrecht University, High Tech Campus, Building 5; p-041 (WAY), 5656 AE Eindhoven, The Netherlands.
authors.forename: Yinghuan
authors.initials: Y
authors.lastname: Kuang
authors.forename: Marcel Di
authors.initials: MD
authors.lastname: Vece
authors.forename: Jatindra K
authors.initials: JK
authors.lastname: Rath
authors.forename: Lourens van
authors.initials: Lv
authors.lastname: Dijk
authors.forename: Ruud E I
authors.initials: RE
authors.lastname: Schropp
mesh_terms: D017076:Computer-Aided Design; D011211:Electric Power Supplies; D004566:Electrodes; D004867:Equipment Design; D019544:Equipment Failure Analysis; D049329:Nanostructures / Q000737:chemistry* / Q000528:radiation effects / Q000648:ultrastructure*; D036103:Nanotechnology / Q000295:instrumentation*; D010316:Particle Size; D012993:Solar Energy