title: Tip-enhanced nano-Raman analytical imaging of locally induced strain distribution in carbon nanotubes.
abstract: Tip-enhanced Raman scattering microscopy is a powerful technique for analysing nanomaterials at high spatial resolution far beyond the diffraction limit of light. However, imaging of intrinsic properties of materials such as individual molecules or local structures has not yet been achieved even with a tip-enhanced Raman scattering microscope. Here we demonstrate colour-coded tip-enhanced Raman scattering imaging of strain distribution along the length of a carbon nanotube. The strain is induced by dragging the nanotube with an atomic force microscope tip. A silver-coated nanotip is employed to enhance and detect Raman scattering from specific locations of the nanotube directly under the tip apex, representing deformation of its molecular alignment because of the existence of local strain. Our technique remarkably provides an insight into localized variations of structural properties in nanomaterials, which could prove useful for a variety of applications of carbon nanotubes and other nanomaterials as functional devices and materials.
authors.affiliation: 1] Department of Applied Physics, Osaka University, Osaka 565-0871, Japan [2].
authors.forename: Taka-Aki
authors.initials: TA
authors.lastname: Yano
authors.forename: Taro
authors.initials: T
authors.lastname: Ichimura
authors.forename: Shota
authors.initials: S
authors.lastname: Kuwahara
authors.forename: Fekhra
authors.initials: F
authors.lastname: H'dhili
authors.forename: Kazumasa
authors.initials: K
authors.lastname: Uetsuki
authors.forename: Yoshito
authors.initials: Y
authors.lastname: Okuno
authors.forename: Prabhat
authors.initials: P
authors.lastname: Verma
authors.forename: Satoshi
authors.initials: S
authors.lastname: Kawata